Title:
INSPECTION METHOD, INSPECTION DEVICE, MANUFACTURING METHOD, AND MANUFACTURING DEVICE FOR LIGHT WAVELENGTH CONVERSION SHEET, LIGHT WAVELENGTH CONVERSION SHEET, BACKLIGHT DEVICE, LIQUID CRYSTAL PANEL, AND LIQUID CRYSTAL DISPLAY DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/210509
Kind Code:
A1
Abstract:
Provided are an inspection method, inspection device, manufacturing method, and manufacturing device for a light wavelength conversion sheet, a light wavelength conversion sheet, a backlight device, a liquid crystal panel, and a liquid crystal display device with which inspection accuracy can be improved. A light wavelength conversion sheet (10), having a quantum dot layer (20) including quantum dots that emit red light and green light by receiving blue light, is inspected by using a captured image that is obtained by irradiating the sheet with blue light from the rear surface side and image-capturing from the front surface side using a camera (80). A filter (82) that cuts off the blue light and transmits the red light and the green light is disposed between the camera (80) and the light wavelength conversion sheet (10).
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Inventors:
SUGANUMA TAKASHI (JP)
TAKEMATSU MASAKAZU (JP)
TAKEMATSU MASAKAZU (JP)
Application Number:
PCT/JP2022/014917
Publication Date:
October 06, 2022
Filing Date:
March 28, 2022
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
C09K11/00; F21V9/00; G01M11/00; G01N21/892; G02B5/20; H01L33/50
Domestic Patent References:
| WO2016194351A1 | 2016-12-08 |
Foreign References:
| JP2019052868A | 2019-04-04 | |||
| KR20150134043A | 2015-12-01 | |||
| JP2009175150A | 2009-08-06 | |||
| JP2015138031A | 2015-07-30 | |||
| JP2003130801A | 2003-05-08 | |||
| JP2019007951A | 2019-01-17 | |||
| US20090244527A1 | 2009-10-01 |
Attorney, Agent or Firm:
KYORITSU INSTITUTE (JP)
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