MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

Title:

MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

Document Type and Number:

WIPO Patent Application WO/2022/215509

Kind Code:

A1

Abstract:

The present invention provides a mass spectrometer and a control method therefor that can suppress a decrease in sensitivity even when the air pressure around a device has fluctuated.　The mass spectrometer comprises a source of ions that ionize samples, a mass spectrometry unit that detects ions for each mass-to-charge ratio, a control unit that controls the flow rate of gas, and a storage unit. The ion source comprises: an ion source chamber; an inlet that introduces a sample to the ion source chamber; a first gas introduction port that introduces a first gas to the ion source chamber; a second gas introduction port that introduces a second gas for ionizing the sample in the ion source chamber; an outlet that exhausts ions from the ion source chamber to the mass spectrometry unit; and a gas exhaust port that exhausts gas from the ion source chamber. The storage unit stores a table of relationships between measurement conditions and the flow rate of the second gas. The control unit changes the flow rate of the second gas according to the measurement condition on the basis of the table and, by controlling the flow rate of the first gas, suppresses fluctuations in the pressure inside the ion source chamber.

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Inventors:

SUGIYAMA MASUYUKI (JP)
HASEGAWA HIDEKI (JP)
SUGAWARA YUKA (JP)
TAMURA RIKU (JP)
YASUDA HIROYUKI (JP)
HASHIMOTO YUICHIRO (JP)

Application Number:

PCT/JP2022/013208

Publication Date:

October 13, 2022

Filing Date:

March 22, 2022

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

H01J49/00; H01J49/04; H01J49/16; H01J49/24

Domestic Patent References:

WO2014084015A1

2014-06-05

Foreign References:

JP2013061324A	2013-04-04
JP2000283971A	2000-10-13
JP2015201449A	2015-11-12
US8952326B1	2015-02-10
JP2021063890A	2021-04-22

Attorney, Agent or Firm:

HIRAKI & ASSOCIATES (JP)

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