Title:
MODEL ANALYSIS DEVICE, MODEL ANALYSIS METHOD, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/181243
Kind Code:
A1
Abstract:
Provided is a model analysis device wherein a model acquisition means acquires a model. A dataset acquisition means acquires a dataset. A performance calculation means calculates the performance of the model for each attribute corresponding to each category of the dataset. An output means outputs performance information indicating the calculated performance of the model for each attribute. A parameter changing means receives a change in a model parameter corresponding to an attribute. A training means retrains the model using the changed parameter. If the model is retrained, the performance calculation means calculates the performance of the model after retraining, and the output means outputs the calculated performance of the model.
Inventors:
MATSUNO RYUTA (JP)
SAKAI TOMOYA (JP)
SAKUMA KEITA (JP)
KAMEDA YOSHIO (JP)
SAKAI TOMOYA (JP)
SAKUMA KEITA (JP)
KAMEDA YOSHIO (JP)
Application Number:
PCT/JP2022/013899
Publication Date:
September 28, 2023
Filing Date:
March 24, 2022
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06N20/00
Foreign References:
| US20200349466A1 | 2020-11-05 |
Other References:
BARCELOS GABE: "Understanding Bias in Machine Learning Models", ARIZE, 15 March 2022 (2022-03-15), XP093094779, Retrieved from the Internet
Attorney, Agent or Firm:
NAKAMURA, Toshinobu et al. (JP)
Download PDF: