Title:
PERFORMANCE MEASUREMENT METHOD, PERFORMANCE MEASUREMENT DEVICE, AND PERFORMANCE MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2012/056569
Kind Code:
A1
Abstract:
A performance measurement device repeatedly executes a procedure of initially determining at least one first method among methods which are directly called by a program for which performance is to be measured, and by executing the program, measuring execution time of each of the first methods, and then, using the execution time of each of the measured first methods, assessing whether or not at least one second method matching a predetermined condition can be extracted from each of the first methods, and if at least one second method can be extracted, assessing whether or not at least one third method which is directly called from each of the extracted second methods can be extracted, and if at least one third method can be extracted, determining the extracted third method as a first method, measuring the execution time thereof, assessing whether or not a second method can be extracted, assessing whether or not a third method can be extracted, and determining the third method as a first method.
More Like This:
Inventors:
MINATANI SHINYA (JP)
Application Number:
PCT/JP2010/069335
Publication Date:
May 03, 2012
Filing Date:
October 29, 2010
Export Citation:
Assignee:
HITACHI LTD (JP)
MINATANI SHINYA (JP)
MINATANI SHINYA (JP)
International Classes:
G06F11/34
Foreign References:
| JP2008217721A | 2008-09-18 | |||
| JP2010198133A | 2010-09-09 | |||
| JP2007249495A | 2007-09-27 |
Attorney, Agent or Firm:
GOTO, MASAKI (JP)
Masaki Goto (JP)
Masaki Goto (JP)
Download PDF:
Claims: