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WO/2024/025413A1 |
The invention relates to a method and a dual beam FIB/(S)TEM apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling. The method comprises the steps of: loading the sample into a sample holder of the 5 dual ...
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WO/2024/021269A1 |
The present invention relates to the technical field of electron microscope equipment, and specifically disclosed are a cryo-stage for a cryo-electron microscope and a control system therefor. The cryo-stage comprises a cryo-electron mic...
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WO/2024/023248A1 |
The present invention relates to a segmenting method for delimiting objects (O) as segments (S) in a package (G) in an x-ray diffraction analysis, said method having the following steps: ‐ detecting pulse transmission functions (20) fo...
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WO/2024/022929A1 |
The invention relates to a method for measuring a test object (27) using a measuring device (11) by means of x-ray fluorescence, more particularly for measuring the thickness of thin layers on the test object (27) or for determining an e...
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WO/2024/026158A1 |
An x-ray fluorescence system and method of fabrication are provided which include a titanium x-ray source (510), a focusing, doubly-curved lithium fluoride (LiF) crystal optic (512), and a detector (518). The titanium x-ray source includ...
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WO/2024/023537A1 |
A method of reconstructing an electron microscopy image of size [M x N] pixels of a first sample, the method implemented by a computer comprising a processor and a memory, the method comprising: providing a set of pre-learned dictionarie...
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WO/2024/018249A1 |
This invention concerns in particular a device for generating thermal neutrons and X rays for thermal neutron imaging and for X ray imaging, comprising: - a generator (2) to produce fast neutrons and X-rays; - a neutron moderator (4) to ...
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WO/2024/018681A1 |
According to an embodiment, an inspection device comprises: an image capture mechanism; a two-dimensional directional filter processing circuit that performs, for each pixel, filter processing using a plurality of two-dimensional directi...
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WO/2024/020336A1 |
Embodiments described herein relate to methods of sorting energy storage devices. In some aspects a method can include measuring, via a physical sensing device, a physical property of a first plurality of energy storage devices. The meth...
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WO/2024/018275A1 |
A method for adaptive secondary ion mass spectroscopy, the method may include (a) adaptively setting a detection parameter that impacts an instantaneous count rate of a detector; (b) scanning an evaluated sample with a focused primary io...
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WO/2024/014178A1 |
Provided is a photography jig used when a radiographic image is captured by irradiating an imaging target with radioactive rays. The photography jig includes a moving mechanism which moves the position of the imaging target such as to ch...
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WO/2024/013039A1 |
The present disclosure relates to apparatus and methods for assessing samples (208) using charged particles. In one arrangement, a degassing action is performed by exposing a target area of a sample (208) with charged particles to stimul...
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WO/2024/015970A1 |
An example method to configure a radiography system (100) having a radiation emitter (106) and a radiation detector (108) involves: analyzing, using processing circuitry, a reference image captured using a first value of a first power pa...
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WO/2024/015795A1 |
A non-invasive semiconductor technique for measuring dielectric/semiconductor interface trap density can be performed by charging the dielectric by creating charges on the top surface of the dielectric layer over the wafer using Scanning...
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WO/2024/009278A1 |
The invention relates to a method of verifying the detection capability of an X-ray inspection apparatus with respect to a product type of in particular a food product, wherein a body is subject to X-rays propagating through the body in ...
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WO/2024/009572A1 |
This information processing device determines whether to re-capture a radiographic image, on the basis of: capture conditions which include the capture direction of a radiographic image captured by projecting radiation towards an examina...
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WO/2024/010360A1 |
Disclosed are a three-dimensional image generation method and an electronic device for performing same, according to various embodiments. The electronic device according to one embodiment of the present invention comprises: an image capt...
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WO/2024/008824A1 |
The invention relates to a plenoptic imaging system for acquiring an image of an object, this system comprising: - a source for generating an X-ray beam towards the object, - a main optical device for receiving and reflecting the beam co...
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WO/2024/008792A1 |
A device (200) comprising a plurality of structures (220a-h) formed on a substrate (210) and defining a metasurface is disclosed. The device comprises a marker structure (215; 225) formed on the substrate amongst the plurality of structu...
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WO/2024/006990A1 |
Embodiments determine the density of materials and objects imaged using computed tomography (CT). An embodiment co-images a material of unknown density with a calibrant of known density. The digitally reconstructed CT images are segmente...
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WO/2024/006087A1 |
A pulsar-based timing and lateration system includes a detector system. In according with certain embodiments, the detector system includes a plurality of detectors, each one configured for detecting X-ray photons and generating output s...
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WO/2024/002341A1 |
Provided in the present disclosure is an X-band small-focus accelerator used for nondestructive testing, comprising a magnetron which is used for generating microwaves; an acceleration tube which is used for accelerating electrons and is...
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WO/2024/006913A1 |
A detector, comprising: a plurality of first pixels, each first pixel configured to convert radiation into an electrical signal; a plurality of second pixels; and a plurality of data lines coupled to the first pixels and the second pixel...
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WO/2024/004583A1 |
Provided are a prediction device, prediction system and prediction program with which it is possible to predict the mechanical strength of a composite material. This prediction device 100 includes: an acquisition unit 111 which acquires ...
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WO/2024/005068A1 |
Provided are a prediction device, a prediction system, and a prediction program with which it is possible to predict a plurality of characteristics of an object. This prediction device 100 includes: an acquisition unit 111 that acquires ...
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WO/2024/006329A1 |
Various examples include a method of finding crystallographic planes of cubic materials being used as epitaxial substrates for non-cubic material epitaxy. By selecting low-index crystallographic planes, the two-dimensional (2D) repetitiv...
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WO/2024/004990A1 |
Provided are a thickness measuring method, an X-ray analysis device, an information processing device, and a computer program that can measure the thicknesses of more multilayer samples as compared to conventional means. This thickness...
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WO/2024/002340A1 |
A method and system for tracking a target object in an object to be inspected. The method for tracking a target object in an object to be inspected comprises: identifying a target object in a perspective image, and determining first posi...
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WO/2024/005006A1 |
Provided are a thickness measurement method, an X-ray analysis device, an information processing device, and a computer program, with which it is possible to measure the thickness of each layer of a multilayer material that heretofore ha...
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WO/2023/249806A1 |
A wafer metrology tool, such as a scanning electron microscope, can generate an image of a structure on a wafer. A simulated image of the structure also is determined from a design of the wafer. A contour of the structure in the image an...
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WO/2023/249662A1 |
The present specification relates to a method for enabling an operator to perform visual layer separation, the method including: retrieving at least one X-ray scan image from a memory in data communication with an inspection system, wher...
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WO/2023/248988A1 |
Provided are a morphology analysis device, a morphology analysis method, and a morphology analysis program with which it is possible to recognize the morphology of the constituent elements of molecules. A morphology analysis device 200 f...
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WO/2023/248287A1 |
According to the present disclosure, in order to enable evaluation of a semiconductor on the basis of characteristics that are equivalent to transistor (Tr) characteristics and are acquired in an earlier stage during a semiconductor manu...
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WO/2023/246105A1 |
A test apparatus and method based on a coupling effect of particle irradiation and high-temperature liquid corrosion. The test apparatus comprises a particle accelerator, a first corrosive liquid housing (1), a first heating member (2), ...
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WO/2023/248583A1 |
This information processing device: acquires a conversion parameter for converting a position in an inspection image captured by irradiating an object under inspection with radiation along an irradiation direction into a position in stru...
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WO/2023/249322A1 |
The present invention relates to a method for analyzing a silicon nitride substrate. More specifically, the method comprises: a step for manufacturing a silicon nitride substrate; a step for manufacturing an analysis sample by cutting th...
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WO/2023/247925A1 |
To provide clear 3-dimensional images of complex shapes, an X-ray imaging apparatus (200) for imaging a relatively linear shaped object (210) comprising portions of its outer surface having curved profiles, is provided, the apparatus com...
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WO/2023/248046A1 |
Provided are a novel material search method and a novel material search system. From among a plurality of peaks that occur in an XRD profile of an input sample, P peaks are acquired in order of greatest peak intensity. A record that incl...
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WO/2023/248573A1 |
When performing display control based on a plurality of inspection images captured by irradiating an inspection target object with radiation from a plurality of different imaging directions, and structural information representing a thre...
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WO/2023/244594A1 |
The present invention is directed to an apparatus including a first central base attached to a second central base, connected by a bridge, with a space defined between the two central bases. The first central base and the second central ...
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WO/2023/243403A1 |
The present invention non-destructively analyzes an internal defect position of an additive-manufactured article. An additive-manufactured article quality determination device (1) comprises: a first assessment unit (14) which, from resul...
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WO/2023/243197A1 |
Provided is a fluorescent X-ray analysis device in which a state at a rear surface of a thin plate-shaped sample is made uniform so as to prevent differences between measurement conditions depending on a measuring position. This fluoresc...
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WO/2023/240863A1 |
A test piece and a manufacturing method therefor. The test piece comprises a test piece substrate and a defect unit. The defect unit comprises a platform (8) and an attachment (9), wherein the platform (8) is arranged in a groove of the ...
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WO/2023/238565A1 |
Provided are a data processing device, a data processing method, and a program that generate, by data expansion, a teacher data set with which a learning model can be effectively trained. The data processing device (10) comprises a proce...
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WO/2023/237070A1 |
A flexible CT detector and a static CT system using same. The flexible CT detector comprises: a flexible circuit board (1), which is used for being attached onto the inner side of a CT rack (10) and has a signal reading portion; and a fl...
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WO/2023/236540A1 |
An ore constituent analysis apparatus and method. The analysis device comprises: a sample accommodating device (1), which holds an ore sample to be tested; an excitation unit (2), which outputs X-rays with continuously adjustable energy;...
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WO/2023/237242A1 |
Apparatus (1) for inspecting containers (10), with a transport device (2) which transports the containers (10) along a predefined transport direction, with at least a first radiation device (3) which emits high-energy radiation and in pa...
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WO/2023/238384A1 |
A problem exists in the prior art in which it is difficult to perform learning such that images of different image quality are estimated for individual regions by a single loss function when the ideal image quality varies by region of an...
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WO/2023/237071A1 |
Disclosed in the present invention are an X ray detector based on energy integrating and photon counting hybrid imaging, and a CT machine. The X ray detector comprises: a counting detector, having at least one column of pixelated electro...
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WO/2023/233983A1 |
This indicator calculation method for fine wires includes a step for obtaining x-ray images of a plurality of cross-sections that are orthogonal to the longitudinal direction of a cable that includes a plurality of fine wires, a step for...
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