Title:
TEST CIRCUIT, ARRAY SUBSTRATE AND LIGHT-EMITTING DISPLAY DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/200769
Kind Code:
A1
Abstract:
A test circuit, an array substrate and a light-emitting display device. The test circuit (10) is provided at an output end of a scanning drive circuit (20), and is used to test, when the scanning drive circuit (20) does not provide a driving signal to a pixel unit (30), an output characteristic of the current of the pixel unit (30); the test circuit comprises an enable signal line, a scanning signal turn-on line and a plurality of switching transistors (T), each switching transistor (T) comprising a first end (a), a second end (b) and a third end (c), the first end (a) of each switching transistor (T) being connected to the enable signal line, the second end (b) being connected to the scanning signal turn-on line, and the third end (c) being connected to the pixel unit (30). By means of the method above, the position where a problem affecting light emission of an EL light-emitting device has occurred can be determined and the cost of developing the product is reduced.
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Inventors:
CHEN CAIQIN (CN)
Application Number:
PCT/CN2018/096922
Publication Date:
October 24, 2019
Filing Date:
July 25, 2018
Export Citation:
Assignee:
WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD (CN)
International Classes:
G09G3/00
Foreign References:
| CN105989794A | 2016-10-05 | |||
| CN103400546A | 2013-11-20 | |||
| CN105243986A | 2016-01-13 | |||
| CN103489404A | 2014-01-01 | |||
| CN106707641A | 2017-05-24 | |||
| KR100796136B1 | 2008-01-21 |
Attorney, Agent or Firm:
CHINA WISPRO INTELLECTUAL PROPERTY LLP. (CN)
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