Title:
SPECIMEN OBSERVATION APPARATUS AND SPECIMEN OBSERVATION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/171419
Kind Code:
A1
Abstract:
The present invention provides a technology whereby relative positioning in the horizontal direction between a specimen observation area in a specimen container and an imaging field of view can be reliably performed, even prior to adjusting the focal position in the vertical direction using an auto-focus system. This specimen observation apparatus: obtains a luminance value for an image at a plurality of locations in the specimen container, prior to performing auto-focus; and uses the number of high-luminance regions and the width of those regions and identifies a central position, in the horizontal direction, in the specimen container or uses the number of low-luminance regions and the width of those regions and identifies the central position, in the horizontal direction, in the specimen container (See Fig. 1).
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Inventors:
NISHIURA KENTO (JP)
Application Number:
PCT/JP2020/007741
Publication Date:
September 02, 2021
Filing Date:
February 26, 2020
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G02B21/00; G02B21/26; G02B21/36
Domestic Patent References:
WO2014020967A1 | 2014-02-06 | |||
WO2005088280A1 | 2005-09-22 |
Foreign References:
JP2019184684A | 2019-10-24 | |||
JP2011047695A | 2011-03-10 | |||
US20080297774A1 | 2008-12-04 |
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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