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WO/2020/019810A1 |
A carrying frame of a testing wave recorder used for a wind power generator, comprising a casing (1), an accommodating cavity (102) being provided in the casing (1), a first pressing plate (2) being connected to the bottom wall of the ac...
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WO/2020/015248A1 |
A temperature resistance safety performance detection device for a mobile phone battery. According to the temperature resistance safety performance detection device for the mobile phone battery, a contact area between a mobile phone batt...
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WO/2020/017159A1 |
A probe Pr is substantially rod-shaped, and is provided with a distal-end part Pa, a proximal-end part Pb, and a body part which is positioned between the distal-end part Pa and the proximal-end part Pb and has a thickness less than the ...
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WO/2020/017693A1 |
The present invention relates to an apparatus for automatically determining a failure type of a transformer, the apparatus comprising: a measurement unit including a plurality of probes (first and second probes) which are in contact with...
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WO/2020/012799A1 |
The present invention comprises a roughly rod-shaped probe Pr having one end part Pa conductively connected to an inspection point 101 of an object (100) of inspection, a body part Pc that is continuous with the one end part Pa, and an o...
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WO/2020/011363A1 |
The invention relates to an electric sensor assembly comprising a shunt resistance element (2) with a first conducting member (4) and a second conducting member (6) connected to said shunt resistance element (2), a measurement unit for m...
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WO/2020/014163A1 |
An assembly (50) for controlling the temperature of a device includes: a heat sink (56) configured to be maintained at a temperature below a desired set point temperature; a heater element (62) having a surface (64) configured to be ther...
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WO/2020/009717A1 |
Embodiments relate to testing a plurality of LEDs by applying a voltage difference between anode electrodes and cathode electrodes of the plurality of LEDs using transistors and probe pads on a display substrate. The anode electrodes of ...
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WO/2020/007824A1 |
A probe card for a testing apparatus of electronic devices is described, comprising at least one support plate (33), as well as a flexible membrane (32) and a plurality of contact probes (35) associated with a first face (F1) thereof, th...
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WO/2020/005020A1 |
A battery management system, a battery pack comprising same and a fault determination method for a current detection circuit are disclosed. The battery management system comprises: a current detection circuit for detecting a reference cu...
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WO/2020/002109A1 |
The present invention is directed to a coaxial connector ( 1 ) for electrically interconnecting a coaxial cable (300) with a circuit board (50). The coaxial connector ( 1 ) has a connector front end (2) to be interconnected with a circui...
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WO/2019/245242A1 |
A connector for inspection according to a disclosed embodiment includes: a sheet of an insulating material; a plurality of conductive parts which are made of a conductive material, extend in a Z-axis direction, and are spaced apart from ...
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WO/2019/245153A1 |
The present invention relates to a plate spring-type connecting pin comprising: a support pin having a bent rib portion on the upper part and a base portion on the lower part and length extended in the vertical direction; a plate spring ...
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WO/2019/245244A1 |
A test connector according to one embodiment comprises: a sheet on XYZ orthogonal coordinates, the sheet being made of an insulating material; and a plurality of conductive units, which are made of a conductive material, extend in the Z-...
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WO/2019/245104A1 |
The present invention relates to a plate spring-type connecting pin comprising: a support pin having a bent rib portion on the upper part and a base portion on the lower part and length extended in the vertical direction; a plate spring ...
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WO/2019/243158A1 |
The invention relates to a clamping device (2) for electrically conductive contacting of at least one connection (4) of an electrical device, comprising two clamping limbs (6), each of which have a contact plate (16) on a contact side (1...
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WO/2019/237920A1 |
A GIL device three-post insulator mechanical reliability test platform, comprising a mechanical reliability verification test platform used for performing a horizontal direction dynamic insertion test on a horizontally arranged GIL form ...
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WO/2019/241280A1 |
A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a devic...
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WO/2019/241530A1 |
Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell, In this way, electrical parameters o...
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WO/2019/238672A1 |
The invention relates to a sensor device for an electrical terminal arrangement, said sensor device having at least one sensor for detecting a physical quantity of the electrical terminal arrangement or of at least one electrical termina...
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WO/2019/232582A1 |
A modular electrician's tool has a longitudinal body of interconnecting portions. The portions have a voltage proximity detecting portion, a marking portion and a lid portion. The voltage detecting portion has a battery supply which powe...
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WO/2019/235874A1 |
The present invention relates to an integrated pogo pin. The pogo pin can comprise: a casing part curved so as to have a C-shaped cross section; an upper elastic part which is length extended in one spiral direction from one lateral surf...
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WO/2019/234412A2 |
The present invention relates to a handheld device for detecting a partial discharge event, the device comprising: a first probe having a first partial discharge sensor disposed within; and a second probe having a second partial discharg...
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WO/2019/235207A1 |
[Problem] To provide an IC socket capable of preventing a probe from being incorrectly attached to a socket body even when man-hours for machining a side surface of a plunger are reduced. [Solution] The round rod material 20 of a plunger...
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WO/2019/234549A1 |
The present invention relates to a utility meter (50) with a conductor connection device (10). In order to reduce production costs of the utility meter (50) without compromising operational safety, the conductor connection device (10) is...
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WO/2019/231928A1 |
A hybrid probe head assembly for testing a wafer device under test includes a housing, at least a portion of a lead frame assembly disposed in the housing, the lead frame assembly including a at least one cantilever portion, the at least...
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WO/2019/230410A1 |
This connection device is used for inspecting a semiconductor element having an electrical signal terminal through which an electrical signal is propagated and having an optical signal terminal through which an optical signal is propagat...
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WO/2019/225967A1 |
Disclosed is a test device for testing a high-frequency and high-speed semiconductor. The test device includes a probe supporting block formed with a tube accommodating portion along a test direction; a conductive shield tube accommodate...
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WO/2019/225441A1 |
A probe pin comprising: a first contact spring and a second contact spring; and an intermediate section and a buffer spring arranged in series between the first contact spring and the second contact spring. The buffer spring is configure...
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WO/2019/226418A1 |
Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber...
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WO/2019/224267A2 |
The invention relates to an electric vehicle charging equipment, EVSE, (1) delivering DC charging power and configured for delivering electrical energy to a single electrical vehicle (2) at the same time, whereby the EVSE (1) comprises a...
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WO/2019/224406A1 |
A device (100), method and system that allow fraudulent electrical connections (500) to be detected in an electrical energy distribution installation (400) by comparing a first intensity value (Umet) in a meter (410) and a second intensi...
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WO/2019/226426A1 |
Various embodiments are presented of a system and method for testing (e.g., rapidly and cheaply) devices with antennas configured for radio frequency (RF) and/or millimeter wave (mmW) transmission and/or reception. A device to be tested ...
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WO/2019/221076A1 |
Provided are an inspection jig and an inspection method using the same which make it possible to definitively contact the tip end of a wire probe to the terminal of a chip component. The inspection jig is equipped with: a wire probe 2, t...
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WO/2019/219638A1 |
A probe card for a test equipment of electronic devices, comprises a support plate (23),a flexible membrane (24) adapted to carry high frequency signals between a device under test and the support plate (23), said flexible membrane (24) ...
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WO/2019/222549A1 |
Systems and methods employ a Plasma Magnetic Shield (PMS) to provide for active magnetic shielding for protection of a spacecraft, its occupants, and cargo from galactic cosmic radiation (GCR).
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WO/2019/214172A1 |
A signal mating device (30), the signal mating device (30) being used for mating a signal source (40) with an electronic product (101) to be tested. The signal mating device (30) comprises a frame (31), a first driving member (32), a tra...
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WO/2019/216511A1 |
The present invention relates to a current sensor and, more specifically, to a Rogowski coil current sensor having a shielding structure capable of measuring low current and minimizing an impact from electromagnetic noise. In the Rogowsk...
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WO/2019/217842A2 |
A probe chip device and a method for fabricating a probe chip device with an integrated diode sensor are disclosed. In one example, a probe chip device includes a beam head element that includes at least one probe tip that is configured ...
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WO/2019/216503A1 |
The present invention relates to a semiconductor device test socket, wherein a shielding structure is formed around each contactor so as to prevent signal delay or distortion during a test process and thereby enhance the test reliability...
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WO/2019/207702A1 |
This clip for conduction testing has a structure that makes it difficult for the same to come off a terminal of a control panel. The clip 10 for conduction testing comprises a pair of holding members 12 that each have a front end side th...
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WO/2019/206357A1 |
The invention relates to a power electronics unit (1) for an electric drive unit, having an electrically conductive substrate element (2) and a power semiconductor module (3) arranged on the substrate element (2), wherein the power semic...
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WO/2019/208216A1 |
A cylindrical body (2) which is composed of a conductive member that is provided with a helical spring part, and which is configured such that: the cylindrical body has an Ni metal layer (5) and an Ni-W alloy layer (6) that contains W; a...
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WO/2019/209404A1 |
An example test system includes a carrier having a test socket to receive a device to test. The test socket includes electrical connections. The test system also includes a lid assembly having a socket cap to contact the device to apply ...
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WO/2019/197267A1 |
In the cleaning of the tips of needles of needle cards, the tips of the needles are put into effective contact in a cleaning agent in different cleaning positions, in order to remove contaminants from the tips of the needles and to make ...
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WO/2019/197320A1 |
The invention is based on the object of enabling simple and reliable contacting of photonic integrated circuits (901). This is made possible by the use of an electro-optical circuit board (300) which can provide probe card functionality....
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WO/2019/197295A1 |
The testing apparatus for singulated semiconductor dies comprises a nesting frame (1) and a bottom part (2), which form a testing device nest adapted to the size of a semiconductor die (7). A pushing device (4) is provided for an alignme...
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WO/2019/198853A1 |
The present invention relates to contacts and a socket apparatus for testing a semiconductor device. Each contact according to the present invention is a spring contact integrally formed by punching out and bending a metal plate, and com...
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WO/2019/196424A1 |
A temperature compensation method for an SAR sensor (3) of a terminal, and a terminal. The terminal comprises: a temperature sensing means (1), a processor (2), and the SAR sensor (3); the temperature sensing means (1) is configured to s...
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WO/2019/192297A1 |
A current sampling circuit of an electromagnetic clutch controller. The current sampling circuit of an electromagnetic clutch controller comprises: a pre-driving module, a switch circuit, a freewheeling circuit, and a current sampling ci...
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