| Document |
Document Title |
|
WO/2021/153494A1 |
A circuit board according to the present invention is provided with: an insulating substrate having a first surface and a second surface on the reverse side of the first surface; a solid conductor located inside the insulating substrate;...
|
|
WO/2021/153461A1 |
A heater substrate comprising an insulated substrate having a first surface and a second surface that is on the opposite side from the first surface, a heater wire positioned within the insulated substrate, and an adjustment unit that is...
|
|
WO/2021/153061A1 |
An inspection socket (1) is provided with: a pin block (11) exposing the tip end of a contact probe (40) from an exposing surface (19) and supporting the contact probe (40) inclined in a predetermined direction with respect to a directio...
|
|
WO/2021/153841A1 |
The present invention relates to an electrode lead gripper for a pressure activation device and, particularly, to an electrode lead gripper for a pressure activation device, the gripper being formed to allow a current electrode terminal ...
|
|
WO/2021/153840A1 |
The present invention relates to an electrode lead gripper for a pressing-activation device and, in particular, relates to an electrode lead gripper for a pressing-activation device, provided in a pair of pressing plates and configured t...
|
|
WO/2021/149668A1 |
A probe (50) is for measuring the electrical characteristics of an object of measurement (ＳＧｍｎ), and the probe includes a contact surface (50c) that is caused to contact the object of measurement. The maximum height Rz of the con...
|
|
WO/2021/148434A1 |
In order to make it easier and safer to carry out a function test on an electrical operating means (15) of an electrical system (1) by means of a testing device (20), according to the invention at least one binary contact (BK) of the ele...
|
|
WO/2021/149836A1 |
Provided is a high-density IC package with which wiring without discontinuity is possible from narrow-pitch IC chip terminals to a device PCB, and which lowers the cost of manufacturing and inspection. The present invention has a means c...
|
|
WO/2021/149397A1 |
The present invention addresses the problem of providing a concealment member and an electric device which make it possible to easily confirm information pertaining to an internal state of the electric device. A concealment member (80) i...
|
|
WO/2021/142690A1 |
Embodiments of the present application relate to the technical field of surface mounting and provide an automatic value measurement machine. The automatic value measurement machine (10) comprises: a feeding machine (300), a conveying pla...
|
|
WO/2021/146125A1 |
A cantilever-type probe with multiple metallic coatings is disclosed. The cantilever-type probe includes at least one probe pin. A first metallic coating is disposed upon a tip of the probe pin, and a second metallic coating is disposed ...
|
|
WO/2021/142687A1 |
The invention discloses a value measurement needle (120), a value measurement needle structure (100), and an automatic value measurement machine; the value measurement needle (120) comprises a value measurement needle body (121) and a va...
|
|
WO/2021/140904A1 |
Provided are: a contactor which can be manufactured easily; an inspection jig and an inspection device using said contactor; and a method for manufacturing said contactor. A contactor Pr is provided with a coil spring CS obtained by fo...
|
|
WO/2021/139822A1 |
Disclosed is a clamp for an accelerated life test. The clamp comprises a bearing plate (1), wherein the top face of the bearing plate (1) is provided with a cavity (2) in sliding fit with the profile of a mobile phone to be tested; and a...
|
|
WO/2021/137527A1 |
The purpose of the present invention is to provide a test socket assembly which has a simple structure and which can stably transmit a signal even at a high communication speed. The test socket assembly, according to the present inventio...
|
|
WO/2021/137379A1 |
A spring-loaded pin according to the present invention comprises: a compression spring (30); an integrated upper probe (10) having an upper probe portion (11) and two upper probe side wall portions (12) to be integrated, wherein the uppe...
|
|
WO/2021/137338A1 |
The present invention relates to a connector pin that ensures stable contact, comprising: a cylindrical casing of which the top is open and the inside is hollow; a plunge that protrudes through an opening of the casing and is arranged so...
|
|
WO/2021/135814A1 |
An isolation circuit (100), an automobile diagnosis apparatus (300), and an automobile diagnosis system (500). The isolation circuit (100) comprises: a first switch circuit (10), electrically connected between an OBD connector (111) of a...
|
|
WO/2021/131723A1 |
[Problem] To provide an IC socket which can prevent damage to a probe by an electronic component even when the electronic component is carried in a tilted state onto a socket main body. [Solution] This IC socket 1 includes: a socket main...
|
|
WO/2021/130487A1 |
The invention enables an optical voltage sensor, comprising a piezoelectric actuator mechanically coupled to an optical strain sensor (such as a fibre Bragg grating), to withstand lightning impulses, the effects of which would otherwise ...
|
|
WO/2021/133557A1 |
A probe card in an automated test equipment (ATE) and methods for operating the same for testing electronic devices. The probe card may be a portion of a vertical-type probe card assembly in which pads on a circuit board are contacted by...
|
|
WO/2021/133560A1 |
A probe card in an automated test equipment (ATE) is disclosed. The probe card may be a portion of a vertical-type probe card assembly in which pads on a circuit board are contacted by probe pins, with vertical vias in the circuit board ...
|
|
WO/2021/133558A1 |
Probe pin arrangements in a vertical-type probe card assembly for an automated test equipment (ATE) are disclosed. In some embodiments, one or more additional conductive regions are provided in between adjacent probe pins. The additional...
|
|
WO/2021/133561A1 |
A probe card in an automated test equipment (ATE) is disclosed. The probe card may be a portion of a vertical-type probe card assembly in which pads on a circuit board are contacted by probe pins, with vertical vias in the circuit board ...
|
|
WO/2021/131997A1 |
This method for manufacturing a contact pin that electrically connects a first electric component and a second electric component, and that includes a shaft portion and a first terminal portion which is provided in a tip end portion of t...
|
|
WO/2021/125413A1 |
Disclosed is a scalp massager comprising a main massager body and a plurality of massaging protrusions provided to protrude from the lower part of the main massager body, wherein the massaging protrusions have through-holes for allowing ...
|
|
WO/2021/120710A1 |
Disclosed are a metering module for an electric appliance and an electric appliance. The metering module and the electric appliance are connected by means of wires. The metering module comprises a PCBA assembly and a metering assembly. T...
|
|
WO/2021/122326A1 |
It is herein described a contact probe (20) comprising a probe body (20C) extended between a first end portion (20A) and a second end portion (20B) and provided with at least one pair of arms (22a, 22b) separated by a slot (21) made in t...
|
|
WO/2021/122950A1 |
A probe head for a testing apparatus of electronic devices integrated on a semiconductor wafer of the type comprises: - a first plurality of contact probes (31) having a first transversal diameter; - a second plurality of micro contact p...
|
|
WO/2021/121967A1 |
The electronics according to the invention comprise a load circuit (M1) having a circuit input (M1.1), a supply circuit (M2) having a circuit input (M2.1), having two circuit outputs (M2.2), (M2.3) and at least one chargeable energy stor...
|
|
WO/2021/123120A1 |
A testing head (20) for testing the functionality of an electronic device comprises a plurality of contact probes (10, 10bis) including a probe body (10') longitudinally extended between respective end portions (10a, 10b) which are adapt...
|
|
WO/2021/125679A1 |
The present invention relates to a socket for inspection, the socket comprising: an intermediate sheet composed of a plurality of first conductive parts and an insulating support part provided between the first conductive parts and made ...
|
|
WO/2021/123081A1 |
The invention relates to a contact device (1) for contacting an electric contact point of a test object, comprising a contact plunger (3) which has a plunger shaft (4) for mounting in a guide sleeve (2) in an axially movable manner and a...
|
|
WO/2021/121670A1 |
An automated test equipment for testing one or more DUTs comprises a test head and a OUT interface. The OUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example,...
|
|
WO/2021/118729A1 |
Customizable probe cards, probe systems including the same, and related methods. A customizable probe card for testing one or more devices under test (DUTs) comprises a support structure, one or more probe assemblies supporting respectiv...
|
|
WO/2021/114915A1 |
A testing load board ejecting and pushing assisting apparatus for semiconductor automatic testing equipment. A handle wrench (1) pushes a U-shaped push rod (3); by means of switching between two states of the handle wrench (1), implement...
|
|
WO/2021/118017A1 |
The present invention relates to a hollow test pin comprising: a hollow body having a contact cusp placed at the bottom thereof; an elastic member received in the body; and a plunger partially inserted into the body and brought into cont...
|
|
WO/2021/112475A1 |
A device for measuring a current of a three-phase inverter according to an embodiment of the present invention comprises: a current detection element connected to the lower end of one of three lower switches configuring an inverter; a cu...
|
|
WO/2021/109126A1 |
Provided are a probe module separation-distance quick-adjustment mechanism and forming needle bed, comprising: an upper frame (1), provided with an upper guide rail (11) and mounting bracket (12) on the two opposing sides thereof, the mo...
|
|
WO/2021/109123A1 |
Disclosed in the present application are a probe module and a modular lithium battery testing device. The probe module comprises a probe mounting rack, and a plurality of probe assemblies mounted on the probe mounting rack at adjustable ...
|
|
WO/2021/112452A1 |
The voltage monitoring circuit according to one embodiment of the present invention comprises: a clamping unit for clamping the voltage of input power supplied from a power source to base voltage, and outputting to an MCU; and a switch u...
|
|
WO/2021/108774A1 |
Reusable interfaces and methods for photosensitive device testing are disclosed. The reusable interface includes a removable lid, an opening, a bed configured to hold one or more photosensitive devices. The electrically conductive contac...
|
|
WO/2021/106564A1 |
This spring connector (10) comprises: a conductive tube (3); a movable pin (5) having a distal end part (511) that protrudes from an opening of the tube (3) in the axial direction of the tube (3); a movable body (7) that is provided insi...
|
|
WO/2021/106753A1 |
Provided are a probe sheet and a production method for the probe sheet that make it possible to achieve excellent anisotropy and durability, even for fine-pitch terminals. The present invention comprises: a flexible sheet (10) that has a...
|
|
WO/2021/107351A1 |
The present invention relates to a test apparatus for a device singulated by stacking a plurality of semiconductor chips, the test apparatus being capable of executing a performance test by producing and then accurately aligning a device...
|
|
WO/2021/106304A1 |
This jig (30) comprises: a first block part (100) on which a probe head (300) is installed; and a first suction opening (112) formed in the first block part (100). Air present on the side, in which one end of a probe (330) provided to th...
|
|
WO/2021/107484A1 |
An embodiment of the present invention provides conductive particles used in a test socket which is disposed between a device being tested and a test board to electrically connect a lead of the device being tested and a pad of the test b...
|
|
WO/2021/104670A1 |
A current sensing system includes a pre-calibrated busbar, a voltage sensor, a temperature sensor and a controller. The pre-calibrated busbar has a known resistance, a known variation in resistance with respect to temperature and known d...
|
|
WO/2021/107115A1 |
This circuit substrate is provided with: an insulation substrate which is formed by laminating a plurality of ceramic insulation layers and which has a first surface and a second surface on the side opposite to the first surface; a circu...
|
|
WO/2021/098325A1 |
Disclosed is a voltage acquisition and compensation circuit. The circuit comprises at least one compensation unit. Each compensation unit comprises a capacitor Ca1, a capacitor Cb1, a capacitor Cc1 and a capacitor C01, wherein first ends...
|
