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WO/2021/100824A1 |
An anisotropic conductive sheet according to the present invention comprises an insulating layer and a plurality of conductive layers. The insulating layer is elastic, and has a first surface that is positioned on one side in the thickne...
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WO/2021/100825A1 |
A sheet connector according to the present invention has: a first insulating layer having a first surface positioned on one side in the thickness direction, a second surface positioned on the other side, and a plurality of first through-...
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WO/2021/100947A1 |
An embodiment of the present invention comprises the steps of: (a) inserting semiconductor light-emitting elements having a magnetic substance into a fluid chamber; (b) transferring, to an assembly position, a substrate including assembl...
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WO/2021/097462A1 |
A system for acquiring a test-and-measurement signal from a device under test (OUT) including a test-and-measurement probe, a user interface, a robot, and a controller. The probe is configured to acquire an electronic signal from the DUT...
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WO/2021/097463A1 |
An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal fr...
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WO/2021/094135A1 |
The invention relates to a series terminal element having at least one housing, at least one busbar arranged in the housing and at least one first contactless current sensor, which is arranged in the housing in the region of the busbar, ...
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WO/2021/093330A1 |
A probe module, comprising: a body (1), a floating plate (2) located at the bottom part of the body (1) and a probe assembly (3) located on the side of the floating plate (2) facing away from the body (1). The probe assembly (3) comprise...
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WO/2021/096546A1 |
Aspects of the present disclosure provide measurement devices and methods for detecting electrical characteristics of devices under test (DUTs), such as semiconductor nanowires. Techniques described herein provide programmable measuremen...
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WO/2021/091376A1 |
The present disclosure relates to a method of debugging a printed circuit board with at least one boundary-scan compliant device, said method using an electronic processing unit and comprising the steps of: retrieving boundary-scan prope...
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WO/2021/090792A1 |
A probe jig 3 for use in inspecting a tab terminal 114 in which a plurality of overlapped electrically conductive leads 103 are welded in a thickness direction at each interval of a first pitch PH from one surface side and at each interv...
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WO/2021/088331A1 |
Disclosed are a feeding and discharging mechanism, and a test apparatus (7) and a test system having the feeding and discharging mechanism. The feeding and discharging mechanism comprises: a working area (1), wherein an operation device ...
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WO/2021/088560A1 |
The present application provides a radio frequency ejector pin for production testing and a radio frequency test system. The radio frequency ejector pin engages with and is connected to a test socket. The radio frequency ejector pin comp...
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WO/2021/092198A1 |
Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein. A probe system includes an enclosure with an enclosure volume for enclosing a substrate that includes one or more devices und...
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WO/2021/088332A1 |
Disclosed are a clamp mechanism and a test apparatus having the mechanism. The clamp mechanism comprises: a machine frame (1), wherein the machine frame (1) is provided with a clamping area (2) located in a vertical plane, and a material...
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WO/2021/092131A1 |
Probe systems and methods for testing a device under test are disclosed herein. The probe systems include an electrically conductive ground loop and a structure that is electrically connected to a ground potential via at least a region o...
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WO/2021/088833A1 |
An auxiliary device for testing a chip-on-board (100). The auxiliary device comprises a chip jig (1) and an outer wiring board (4). A limiting fixing opening (2) capable of covering the top of the chip-on-board (100) is provided on the c...
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WO/2021/087937A1 |
Disclosed is an anti-pulling wire structure for a sensing device, the anti-pulling wire structure comprising a connecting wire (1). A first limiting block (2) is fixedly installed on a surface of the middle of the connecting wire (1), a ...
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WO/2021/087862A1 |
An easy-to-adjust bionic sensor, comprising a fixed top cover (1); an adjustment screw (3) is detachably mounted on an upper surface of the fixed top cover (1), a rotating handle (4) is fixedly mounted on an upper end outer surface of th...
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WO/2021/085229A1 |
This spring connector (10) comprises: a conductive tube (3); a movable pin (5) having a tip section (511) that protrudes from an opening of the tube (3) in the axial direction of the tube (3); a spring (7) that is provided inside the tub...
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WO/2021/084600A1 |
A high-frequency noise detection antenna according to the present invention is provided with: a thin coaxial line (1) constituted of a center conductor (1-1), an insulator (1-2) provided so as to surround the entire circumference of the ...
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WO/2021/082302A1 |
A test device, a test method, and a motherboard test device. The test device comprises: a controller configured to detect a user operation or detect a preset file to generate a control instruction; a driving device configured to generate...
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WO/2021/077589A1 |
A circuit (100) and an apparatus for measuring a pulse-per-second signal time difference, which are applicable to the technical field of time scale detection. The circuit (100) comprises a phase discrimination unit (11), a time voltage c...
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WO/2021/079277A1 |
The invention relates to a contacting device (3) for temporarily bringing a first cable portion (5) of a cable (20), in particular a first cable end, into electrical contact with a cable-testing device (10), the contacting device (3) com...
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WO/2021/075744A1 |
An impedance measurement device according to the present invention comprises: an electrochemical energy device; an amplification unit connected to each of connection terminals of the electrochemical energy device so as to amplify a signa...
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WO/2021/072603A1 |
Disclosed are an LED testing device and method. The LED testing device comprises: a testing circuit board (100); an elastic substrate (102), the elastic substrate (102) being arranged at the lower end of the testing circuit board (100), ...
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WO/2021/075455A1 |
This testing connector is connected to an end section of a coaxial wire section provided with a central conductor, an outer conductor that surrounds the periphery of the central conductor, and a first insulator that insulates the central...
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WO/2021/075628A1 |
The present invention relates to a bidirectional conductive module, comprising: an insulating body formed of an insulating material and having a plurality of conductive holes penetrated in the vertical direction; a plurality of conductiv...
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WO/2021/074362A1 |
The invention relates to a mounting system (1) for a contact pin (2) for contacting an electric/electronic test object, comprising a mounting sleeve (6) which can be secured to a contact head and which is designed to receive and hold the...
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WO/2021/069566A1 |
The invention concerns a measurement probe (6) for on-wafer testing of semiconductor devices, comprising a plurality of contact fingers at a distal end for contacting landing pads of the wafer. The measurement probe (6) comprises a centr...
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WO/2021/066357A1 |
A battery control device, according to one embodiment of the present invention, comprises: an inverter connected to a battery cell and configured to convert a DC current outputted from the battery cell into an AC current and output the A...
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WO/2021/067049A1 |
Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems. The probe systems include a probing assembly that includes an optical probe that defines a probe tip and a distance sensor. The pro...
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WO/2021/065702A1 |
This probe is for inspecting characteristics of a connector and is provided with: a flange for attaching the probe to equipment; a housing which has a base end section and a distal end section, is inserted through a through-hole of the f...
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WO/2021/066255A1 |
A test socket of the present invention comprises: a plurality of spring contacts, each of which includes an upper contact pin, a lower contact pin, and a coil spring for elastically supporting the upper contact pin and the lower contact ...
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WO/2021/067011A1 |
An electrical measurement contacting system for use with a component testing system operable to convey devices includes: a first module including a test contact module having a test contact adapted to electrically contact devices conveye...
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WO/2021/064087A1 |
The invention relates to an assembly for checking the functionality of a measuring object, i.e., DUT, in the form of a medical implant or at least one part of a medical implant. The assembly comprises a test signal generator; a test modu...
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WO/2021/064788A1 |
This inspection jig (10) is used to inspect a device under inspection comprising a flexible board (17) in which an external connection terminal (19) is formed in a flexible substrate (18). The inspection jig (10) comprises an inspection ...
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WO/2021/062117A1 |
A reconfigurable optic probe is used to measure signals from a device under test. The reconfigurable optic probe is positioned at a target probe location within a cell of the device under test. The cell including a target net to be measu...
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WO/2021/060189A1 |
This probe (101) for measuring a connector is connected to a connector to be measured. A plurality of probe parts (10) each have an outer conductor (12) and central conductors (11A-11H) in contact with a signal terminal. A plunger (2) co...
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WO/2021/060727A1 |
The present invention relates to a foreign substance cleaning sheet for a test socket and, more specifically, to a foreign substance cleaning sheet for a test socket, the foreign substance cleaning sheet being used in a test socket in or...
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WO/2021/049237A1 |
Provided is an external spring-type contact probe in which the end of a coil spring can be can reliably abutted and a swaging portion can be formed easily. A plunger (16) comprises: a small-diameter portion provided in a midway position ...
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WO/2021/048388A1 |
Method for determining the voltage UL generated by the inductive portion (6) of a measuring resistor (2) present in an electronic circuit comprising a signal generator (1), at least one stator winding (3) that is connected to the signal ...
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WO/2021/048459A1 |
The invention relates mainly to a compact connection, sensing and measurement device for connecting to the electrical network via easy and quick connection thereof to any switchgear device, such as a thermal-magnetic or differential circ...
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WO/2021/045286A1 |
The present invention relates to a test socket having an empty space, the test socket comprising: a base sheet through which a plurality of first conductive holes are formed in the up and down directions; a plurality of insulating materi...
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WO/2021/045502A1 |
Disclosed is a test probe for testing a device to be tested. The test probe includes a line contact portion comprising a first contact line set and a second contact line set each comprising two contact lines linearly extending to be spac...
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WO/2021/039898A1 |
An inspection jig 2 comprises: film-shaped wiring substrates 21 - 23 in which electrodes E are disposed on one surface thereof; a base 7 which supports the wiring substrates 21 - 23 which are layered while exposing electrode regions A1 -...
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WO/2021/040451A1 |
The present invention relates to an inspection socket comprising: a plurality of conductive parts which are arranged, respectively, at positions corresponding to the terminals of a device to be inspected, and which have a plurality of co...
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WO/2021/041917A1 |
A temporary bond method and apparatus for allowing wafers, chips or chiplets. To be tested, the temporary bond method and apparatus comprising: a temporary connection apparatus having one of more knife-edged microstructures, wherein the ...
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WO/2021/033824A1 |
The present invention relates to a test socket with a replaceable portion, comprising: a first socket module comprising a first insulating main body made of an insulation material, and a plurality of first conductive patterns formed to b...
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WO/2021/032396A1 |
The present invention relates to a test method for an unpopulated printed circuit board, comprising the steps of: exposing the unpopulated printed circuit board to temperatures of a reflow soldering process in a first step; and testing t...
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WO/2021/027472A1 |
A high pressure accelerated aging test machine for finished chip test and a use method therefor. The test machine comprises an upper machine body (1), a pressure door (2) being movably mounted on a front surface of the upper machine body...
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