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WO/2020/148227A1 |
The invention relates to a probe card (1) for testing components (9) under gas atmosphere, having a chamber (2), in which test gas is supplied via a line (11) through an opening (13) when testing gas sensors and protective gas is supplie...
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WO/2020/145768A1 |
The present invention provides a technology of diagnosing whether or not a charging/discharging switch device disposed on a charging/discharging path of a battery pack operates normally. A battery pack diagnosis apparatus according to th...
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WO/2020/145073A1 |
A probe Pr comprising: a conductive cylindrical body Pa having a cylindrical shape; and a conductive first central conductor Pc having a rod shape. The cylindrical body Pa has a cross section perpendicular to the axial direction that has...
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WO/2020/145492A1 |
The purpose of the present invention is to provide: a signal transmission connector capable of being stably connected with a terminal of an electronic component through a structural improvement in response to distortion in the electronic...
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WO/2020/145493A1 |
The present invention is to provide a signal transmission connector which can be stably connected to terminals of an electronic component through structural improvement that responds to distortion of the electronic component. The signal ...
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WO/2020/145577A1 |
The purpose of the present invention is to provide a conductor part protection member for a signal transmission connector and a manufacturing method therefor, and a signal transmission connector having same and a manufacturing method the...
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WO/2020/141826A1 |
A contactor block of a self-aligning vertical probe card according to the present invention comprises: at least one vertical contactor array in which a plurality of vertical contactors manufactured by a MEMS process and extending in the ...
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WO/2020/133790A1 |
A detection method, apparatus, and system for a probe positioning deviation, and a method and apparatus for assisting in detection of a probe positioning deviation. The detection method for a probe positioning deviation comprises: obtain...
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WO/2020/133791A1 |
Provided are a double probe system and a printed circuit board detecting device, comprising a fixed bracket (1), a probe driving mechanism (2) fixed on the fixed bracket (1), and a spacing adjustment mechanism (3) driven by the probe dri...
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WO/2020/133303A1 |
A device for recycling, testing and reusing a battery of a new energy vehicle, comprising a test instrument body (1), a display screen (2) being provided at the upper part of the front surface of the test instrument body (1), and the dis...
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WO/2020/139927A1 |
An apparatus for sensing current on a conductor of an electrical panel includes at least one sensing system, which comprises a ferromagnetic body and a sensor. The body can be formed of a ferromagnetic material, such as for example steel...
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WO/2020/138882A1 |
Provided is a connector located between a test device and a device to be tested so as to electrically connect the test device with the device to be tested. The connector is stacked in a vertical direction and has first and second conduct...
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WO/2020/137863A1 |
This electrical connecting device is provided with: an insulated probe (10) in which a bottom side plunger (11) and a top side plunger (12) are electrically connected to one another inside a barrel (13), and the bottom side plunger (11) ...
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WO/2020/139046A1 |
The present disclosure relates to a pre-5th-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4th-Generation (4G) communication system such as Long Term Evolution (LTE). An electronic devic...
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WO/2020/135257A1 |
An addressable test chip and system capable of reducing leakage current. The test chip comprises a switch circuit, an addressing circuit, several devices to be tested, and several pads; an output end of the addressing circuit is connecte...
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WO/2020/136045A1 |
A probe head (20) for testing a device under test integrated on a semiconductor wafer (26) comprises a plurality of contact probes (21), each provided with a first end (21a) and a second end (21b), said first end (21a) being adapted to c...
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WO/2020/129135A1 |
A probe pin inspection mechanism according to an embodiment comprises: a base, a pair of movable bodies, elastic bodies for the movable bodies, and a conductive body. The pair of movable bodies are supported by the base so as to be capab...
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WO/2020/130463A1 |
A shunt resistor module, of the present disclosure, is fastened to a printed circuit board so as to be used in current measurement, and comprises: a resistance portion having a set resistance value; at least two terminal portions respect...
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WO/2020/124555A1 |
Disclosed are a rock core holder and a rock core test apparatus. The rock core holder comprises: a base (1) provided with a groove used for accommodating a rock core; a first detection portion (11) and a second detection portion (12), wh...
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WO/2020/129646A1 |
This inspection jig support is provided with a linking shaft portion which has a shaft-side mating portion and which is linked to a testing head body, an annular coil spring disposed on an outer circumference of the shaft-side mating por...
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WO/2020/119889A1 |
The present invention discloses a contact-making system (100, 200, 300, 315, 316) for contact-connecting electrical contacts (151, 152, 153) in a number of plugs (150, 350, 355, 356), having a contact-making element (101, 201) which has ...
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WO/2020/122006A1 |
This probe for connector-characteristic inspection comprises a flange, housing, first plunger, first elastic body, second plunger, and second elastic body. In the bottom of the second plunger, an opening is formed that allows the passage...
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WO/2020/121107A1 |
A device for checking the electrical conductivity of tyres for vehicle wheels comprises: a first electrode (17) configured for resting against a surface of a component of a tyre (2); a second electrode (18) configured for closing an elec...
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WO/2020/122467A1 |
The present invention relates to a probe card for performing circuit inspection of a wafer and a method for manufacturing same and, more particularly, to a probe card from which a process of inserting a probe pin is removed, and a method...
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WO/2020/118368A1 |
A detector (1) detects the presence of a charged object due to a static or DC voltage source (4). The detector (1) includes a sensor (30) positioned in an electric field (3) emanating from the DC voltage source (4). A sensor signal (20) ...
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WO/2020/116709A1 |
The present invention relates to a dual pinch-type BGA socket device used for a test of a semiconductor element, the BGA socket device comprising: a contact (100) which includes a fixed side terminal (110) and a movable side terminal (12...
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WO/2020/116362A1 |
This contact pin comprises: a first plunger having a first contact section provided at the upper end thereof, and a hollow body section provided below the first contact section; a second plunger having a second contact section provided a...
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WO/2020/114082A1 |
A carbon fiber composite damage calculating method under the action of multiple continuous lightning current components. A dynamic impedance curve of a carbon fiber composite obtained under the action of lightning current components in m...
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WO/2020/111075A1 |
This probe unit comprises: a first contact probe in contact with a signal electrode; a second contact probe in contact with a ground electrode; a probe holder having formed therein a first holder hole that penetrates the first contact pr...
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WO/2020/111076A1 |
This probe unit comprises: a plurality of first contact probes each in contact with a target electrode for contact; a second contact probe connected to ground; signal pipes provided around the first contact probes; a ground member formin...
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WO/2020/109323A1 |
Measuring device (1) for measuring electrical variables, comprising a housing body (2) comprising a housing space, at least one measuring device which is arranged or formed in the housing space and is intended to measure an electrical va...
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WO/2020/111690A1 |
A multi-prober chuck assembly and channel are provided. The multi-prober chuck assembly, according to one embodiment of the present invention, comprises: a chuck for supporting a wafer; a probe card structure coupled to the top part of t...
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WO/2020/110409A1 |
Provided is a battery-monitoring unit with which it is possible to easily confirm a state of attachment to a battery. A battery-monitoring unit 1 for monitoring the state of a battery 2, wherein the battery-monitoring unit 1 is provide...
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WO/2020/110960A1 |
A probe mating structure according to the present invention comprises a connector (3), constituting an object of inspection, that has a plurality of arrayed connector electrodes, and a probe that mates to the connector (3). The probe com...
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WO/2020/109701A1 |
The invention relates to a portable device for inspecting the interlocking of a conductor and an aircraft connector, said conductor being intended to be inserted into said connector, the inspection device (30) being characterised in that...
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WO/2020/108352A1 |
A semiconductor tester (1) and a method for calibrating a probe card (12) and a device under testing (DUT) (2) are disclosed. The semiconductor tester (1) includes: a support platform (11), including a support surface (111) and configure...
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WO/2020/103031A1 |
A non-contact, non-resonant type of directional probe (1) for near-field measurement that can measure antenna properties at high frequencies in a broadband includes a coaxial line (2) in which an inner conductor (2a) is coaxially surroun...
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WO/2020/105693A1 |
This anisotropic conductive sheet includes: a plurality of conductive paths; and an insulation layer which is disposed to fill the space between the plurality of conductive paths and has a first surface and a second surface. Each of the ...
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WO/2020/104015A1 |
The present invention discloses a testing device (100, 200) for the decoupled testing of an electrical system (250). The testing device (100 200) has: a signal processing unit (101, 201) which has an energy supply interface (102, 202) an...
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WO/2020/103121A1 |
Disclosed is a function test fixture. A PCB (2) is arranged on a base (1), a peripheral device for a module to be tested can be set up by means of the PCB (2), and it is only by means of electrically connecting an intelligent communicati...
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WO/2020/105525A1 |
This probe for inspecting characteristics of a connector is provided with a plunger, a coaxial cable, a flange, and a housing. An end part of one side of the housing has an expanded-diameter part where the diameter is expanded in the hor...
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WO/2020/106044A1 |
Disclosed in the present invention is a hybrid current measurement device. One aspect of the present invention may provide a hybrid current measurement device for measuring a current by using a Hall sensor and a shunt resistor in combina...
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WO/2020/100859A1 |
This probe is used after being connected to a signal conductor of a signal cable and can be freely brought into contact with a signal conductor of a mating receptacle. The probe comprises a barrel (13) that is a cylindrical conductor ele...
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WO/2020/101317A1 |
Provided is a connector which is disposed between an inspection device and a device-under-test to electrically connect same. The connector includes a plurality of elastic conductive parts and an elastic insulation part. Each of the elast...
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WO/2020/093772A1 |
A superconducting tape testing device, comprising lead contacts and a support plate. Each lead contact comprises a conductive contact (1) and a magnet (3); the magnet (3) is provided with a through hole through which the conductive conta...
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WO/2020/094608A1 |
A testing probe (20) for testing a device under test integrated on a semiconductor wafer (24) comprises an upper guide (21) and a lower guide (22) parallel to each other and spaced apart, each of said guides (21, 22) being provided with ...
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WO/2020/093903A1 |
Provided is an automatic current testing and determining apparatus for a motor having a pin, comprising a base (1). Several test units (2) and a controller (4) are provided on the base (1). The test units (2) are electrically connected t...
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WO/2020/095679A1 |
This probe pin comprises: an elastic part which is elastically deformable in a first direction; and a connection part which is provided at one end of the elastic part in the first direction, and to which a conductor part of an electric w...
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WO/2020/090748A1 |
This contact pin comprises: a first contact part which is provided at one end in a first direction; a second contact part which is provided at the other end in the first direction; and a spring part which is provided on an intermediate p...
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WO/2020/090031A1 |
Provided is an inspection socket that can press an object to be inspected toward an inspection substrate side to cause a conductor to elastically come into contact with an electrode of the object to be inspected and an inspection electro...
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