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WO/2019/194322A1 |
The purpose of the present invention is to provide: a Pd alloy for electric and electronic devices that achieves a greater balance of specific resistance, hardness, and workability than conventional alloys; a Pd alloy material; a probe p...
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WO/2019/185347A1 |
A circuit for measuring an unknown resistance of a resistive element comprises a sensor circuit to generate a differential voltage dependent on the resistance of the resistive element (VBE1, VBE2) and a reference circuit to generate a di...
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WO/2019/190815A1 |
A method for detecting an operational condition of a multi-conductor cable is described, and which includes generating a first, single ended, time domain reflectometer signal which is introduced into a multi-conductor cable; processing t...
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WO/2019/188549A1 |
This connection jig (1) is for conductively connecting a standard to a second external device, the standard comprising a connection unit which can connect to a first external device over a coaxial connection cable, and at least an electr...
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WO/2019/187957A1 |
An inspection jig 4 is provided with a support member 10 which supports a probe 3, wherein: the support member 10 has an inspection side plate-shaped body 5 disposed at one end portion side thereof, and an electrode side plate-shaped bod...
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WO/2019/190144A1 |
The present invention relates to an improved shunt resistor capable of improving the accuracy of current detection in a process of detecting current flowing through the shunt resistor, and a current detecting device including same. A shu...
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WO/2019/188999A1 |
The present invention addresses the problem of providing a prober with which it is possible to reduce the influence of current leak from a chuck stage and external noise, eliminate floating capacity of the chuck stage with respect to a p...
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WO/2019/179972A1 |
The invention relates to a method for continuously determining all the components of the resistance tensor of thin films, such as thin film resistors and thin film sensors of all types. The invention is to provide a method for continuous...
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WO/2019/181420A1 |
A contact terminal 10 is provided with a pair of central conductors 1a, 1b each formed in the shape of a rod using an electrically conductive material, and a tubular body 2 which holds the pair of central conductors 1a, 1b, wherein: the ...
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WO/2019/177749A1 |
A sensor package (300) includes at least one conductive trace (530) providing a voltage common and a base (308) supporting the at least one conductive trace. A conductive extension (320,322) extends from the base (308) so as to contact a...
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WO/2019/178025A1 |
A kit for cleaning and coating a tip of a test probe in an integrated circuit package test system is provided. The kit comprises a transfer stamp having a porous material impregnated with a phosphonic acid solution. The size and shape of...
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WO/2019/177308A1 |
The present invention relates to an integrated switching device, and to an integrated switching device capable of performing various functions with just one device by integrating, into one device, a contactor unit capable of controlling ...
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WO/2019/175416A1 |
The invention relates to a test card (1) for electrically connecting a test piece (2) to an electrical test device (3), having at least one holding element (4, 5) and having a plurality of electrically conductive contact devices (9) whic...
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WO/2019/175090A1 |
The present invention relates to a method for producing a printed circuit board having at least one conductor element which extends between connection points in the printed circuit board. In order to increase the productivity of the know...
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WO/2019/172537A1 |
The present invention relates to a wafer prober capable of hot wind-based preheating. The wafer prober comprises: a wafer camera connected to an upper plate of the wafer prober and mounted to be able to move to the upper portion of a chu...
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WO/2019/170926A1 |
Characterisation method for characterising an electromagnetic field, comprising a transformation step in which the electromagnetic field (7) to be characterised is passed through a reference material (5) the optical properties of which c...
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WO/2019/171797A1 |
This inspection unit comprises a first inspection tool and second inspection tool that are disposed so as to be aligned in a first direction and that each have: a contact element having formed, on the ends thereof, a first contact part c...
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WO/2019/168286A1 |
The technical idea of the present invention provides a test socket and a test device comprising the test socket, in which a test can be stably performed by accurately connecting a connector of the test socket to a connector of a product ...
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WO/2019/169325A1 |
A meter, such as a hand-held multimeter. The meter may include a housing with a thickness being defined between its front and rear faces, and an input jack supported in the housing sidewall, the jack having a jack housing with an exterio...
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WO/2019/168251A1 |
The technical concept of the present invention provides a test socket and a test device including the test socket, wherein the test socket can accurately couple a connector thereof with a connector of a product to be tested, which has a ...
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WO/2019/168587A1 |
A test socket assembly includes a frame assembly having one or more compliant interconnects, and a socket opening sized and configured to receive a device under test therein. The test socket assembly further includes a lead frame assembl...
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WO/2019/168561A1 |
A test socket assembly for coupling a device under test to a test apparatus includes a housing, and a pivotable link, elastomer, and slidable mount at least partially disposed within a cavity of the housing. The pivotable link and slidab...
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WO/2019/159349A1 |
[Problem] To provide: a contact probe that is capable of exhibiting a sufficient inspection function and improving reliability of an inspection socket by eliminating contact error between an electrode and the top of a contact terminal to...
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WO/2019/159718A1 |
In order to securely clamp a clamping target, the present invention is provided with a pair of clamp arms 11a which are each formed in a substantially curved shape when viewed in a plan view, wherein at least one of the clamp arms is con...
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WO/2019/154714A1 |
The invention relates to an electric touch contacting device (1), in particular for electrically testing a test piece (6), in particular a wafer, comprising at least one guide plate (2) which has a plate plane and through which guide hol...
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WO/2019/156585A1 |
A wedge three-axis inertial sensor damper suspension apparatus prevents shock and vibration impacts on a construction machine from being transferred to inertial sensors used by an automatic control system of the construction machine. ...
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WO/2019/156490A1 |
The present invention relates to a power interface and, more specifically, to a power interface for electrically connecting a subject to be inspected and a test driving apparatus. The power interface according to an embodiment of the pre...
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WO/2019/149552A1 |
The invention relates to a method for determining a status of a microwave antenna (103) of an exhaust gas treatment element (100) for a motor vehicle, comprising the following steps: specifying a frequency range (200) that is representat...
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WO/2019/146831A1 |
The present invention relates to a bidirectional conductive module for electrically connecting an upper device and a lower device. The bidirectional conductive module comprises: an insulative main body formed of an insulative material an...
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WO/2019/147100A1 |
The present invention relates to a test socket and, more specifically, to a test socket comprising: a housing which has an accommodation space accommodating a device-to-be-tested on which an electrical test is to be performed, and which ...
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WO/2019/141016A1 |
An aging test device and aging test method for a display module, wherein the aging test device comprises a base board (10), a test board (90), a pressure head (100) and a circuit switching board (80), wherein the test board (90) is dispo...
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WO/2019/142554A1 |
This inspection device is provided with: a stage that supports an interposer; a capacitive probe unit capacitively coupled to a pad; an electric manipulator that controls the relative positions of the stage and the capacitive probe unit ...
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WO/2019/141716A1 |
A cantilever contact probe (31) is described, comprising a probe body (40) included between a descending probe section (31b) and an ascending probe section (31c), the descending probe section (31b) extending along a predetermined longitu...
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WO/2019/141633A1 |
A cantilever probe head (30) is described comprising a support ring (32) associated with a PCB board (33) and a plurality of contact probes (31), protruding from the support ring (32) in a cantilever manner and being held by a support (3...
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WO/2019/143773A1 |
Probes with fiducial targets, probe systems including the same, and associated methods. The probes include a probe body, a probe beam, a probe tip configured to contact a device under test (DUT), and a fiducial target affixed to the prob...
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WO/2019/143595A1 |
A radio frequency sensor system comprising a housing defining a resonant cavity. Radio frequency probe(s) in the cavity transmit and/or receive radio frequency signals. A radio frequency control unit is in communication with the radio fr...
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WO/2019/143091A1 |
The present invention relates to a wafer prober. The wafer prober has a wafer probing stage comprising: a lower plate; multiple elevating columns mounted on the upper surface of the lower plate; and an upper plate mounted on the upper-en...
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WO/2019/141777A1 |
The invention relates to a test needle for measuring electrically conductive layers in holes in printed circuit boards, and to a test probe having a test needle of this type and a finger tester for testing printed circuit boards which ha...
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WO/2019/139548A1 |
Invention relates to a system showing direction to the operator and providing contacting and testing robustness of contacting in production of cable harnesses by means of software module (3), directing member (6) controlled by software m...
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WO/2019/138505A1 |
A probe pin according to the present invention is provided with an elastic section, a first contact section, and a second contact section. The elastic section includes: a first linear section having one end section in the extending direc...
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WO/2019/138853A1 |
This inspection device comprises: a plurality of electrical contacts (51) that are electrically connected to an object to be measured by contacting the object to be measured; a plurality of gripping parts (31,32) to which the plurality o...
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WO/2019/138507A1 |
A probe pin according to the present invention is provided with: a first contact section and a second contact section; an intermediate section that is disposed between the first contact section and the second contact section; a first ela...
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WO/2019/138504A1 |
A probe pin according to the present invention is provided with an elastic section (11), a first contact section (12), and a second contact section (13). The elastic section includes a plurality of strip-shaped elastic pieces (21-24), an...
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WO/2019/133093A1 |
A test socket assembly includes a contactor body, the contactor body having a socket opening sized and configured to receive a device under test therein. A lead frame assembly is disposed within the contactor body, the lead frame assembl...
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WO/2019/133079A1 |
A test socket assembly includes a socket housing having one or more spring probes therein, and a lead frame assembly including one or more cantilever members. The test socket assembly further includes at least one linear spring damper di...
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WO/2019/130511A1 |
Provided is an alloy with superior overall balance and a higher hardness than before, and which exhibits good contact resistance stability (oxidation resistance) and plastic workability while maintaining a low level of resistivity compar...
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WO/2019/129585A1 |
A probe head (20) having vertical probes for testing a device under test (29) integrated on a semiconductor wafer (29') comprises at least one upper guide (22) and at least one lower guide (23) separated from each other by an air gap (26...
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WO/2019/131438A1 |
A probe pin according to the present invention is provided with: a first plunger in which a first contact part is provided at one end thereof; a second plunger disposed further toward another end than the first plunger, and in which a se...
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WO/2019/133097A1 |
A test socket assembly includes a contactor body having one or more compliant interconnects, and a socket opening sized and configured to receive a device under test therein. The test socket assembly further includes a lead frame assembl...
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WO/2019/127866A1 |
A fast detection apparatus and method for an encrypted magnetic head. The fast detection apparatus for an encrypted magnetic head comprises a comprehensive tester (100) for fast detection of an encrypted magnetic head, and a detection fi...
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