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JP6454145B2 |
A method of controlling the gain or sensitivity of a test and measurement system. The test and measurement system includes a host, a controller with an optical transmitter and an optical receiver, optical-to-electrical converter, an acce...
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JP6454066B2 |
A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input...
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JP6454191B2 |
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JP6454148B2 |
A test and measurement system including an electro-optical voltage accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical voltage accessory with a var...
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JP6432928B2 |
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the ac...
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JP6432929B2 |
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JP6433530B2 |
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JP2018189453A |
To provide an input converter for oscilloscopes which is inexpensive and with which it is possible to change the number of input channels in accordance with a test piece, and a measuring device.The input converter comprises: a plurality ...
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JP6431942B2 |
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JP2018173364A |
To provide an AE waveform collector with which it is possible to display waveforms differing in a time base.The AE waveform collector comprises a memory M capable of successively storing numerical data 15a converted into numeric values c...
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JP6414806B2 |
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JP6407581B2 |
A cable assembly including a coaxial cable having active components mounted thereon, a housing substantially surrounding the coaxial cable, and a launch connector mounted to the outside of the housing and in connection with the coaxial c...
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JP6396375B2 |
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JP6395592B2 |
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JP2018132443A |
To facilitate the verification needed when analyzing a measurement result.A data analyzer 1 comprises: a data conversion unit 3 for acquiring sampling data D1 having time information and strength information and converting the sampling d...
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JP2018124194A |
To provide a waveform measuring device that receives supply of power from an apparatus to be measured, in which a surge signal waveform is stably and accurately observed.A distributor 14 distributes a voltage signal Vs from an apparatus ...
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JP6370667B2 |
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JP6370157B2 |
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JP2018112422A |
To improve operability in a waveform display device that overlaps and displays a plurality of waveforms.A waveform display device comprises: a measurement data storage section that stores time-series measurement data; and a display contr...
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JP6359794B2 |
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JP6360661B2 |
A serial data link measurement and simulation system for use on a test and measurement instrument presents on a display device a main menu having elements representing a measurement circuit, a simulation circuit and a transmitter. The ma...
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JP6351905B1 |
The display control device (10) receives input data input from the servo amplifier (30) that supplies power to the motor (40) that drives the machine and the controller (20) that inputs commands to the servo amplifier (30). A display con...
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JP6353880B2 |
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JP6353747B2 |
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JP6349058B2 |
A device and method of re-sampling a plurality of S-parameters for serial data link analysis is dislosed. The method includes storing a plurality of S-parameters sets, each S-parameter set being associated with a subsystem and having ass...
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JP2018091644A |
To intuitively recognize, especially, a logical expression (operational expression) of a trigger condition to be set among multiple triggers.A trigger source part 156 and a logical operation setting part 157 are displayed on a trigger se...
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JP6339602B2 |
A waveform display device displays first and second waveform data whose value changes with respect to a time axis. Based on a first point on the first waveform data, a second point on the second waveform data which is in a correspondence...
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JP6340254B2 |
Aspects of the invention include an equivalent-time sampling oscilloscope (205) that receives a carrier signal (110), the carrier signal after it has been modulated with a repeating data pattern (115), and a pattern trigger signal (210) ...
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JP2018080931A |
To provide a measurement apparatus and a measurement method that are simple in structure and that are capable of measuring a broad band signal.A spectrum analyzer 10 includes a mixer 12 for frequency-converting a signal under measurement...
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JP6319964B2 |
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JP6320705B2 |
A ring oscillator timer circuit can include a plurality of electrical components arranged in a cascaded combination of delay stages connected in a closed loop chain. The timer circuit can begin oscillation a programmable number of gate d...
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JP2018066567A |
To improve the method of probe fixation that is problematic when multiple passive probes are used.A probe device comprises a head, a cable and a termination, and is used as measurement signal input means of a measuring apparatus, where t...
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JP2018048838A |
To provide a probe device capable of obtaining an effect of suppressing common mode noise without separately adding a circuit component for measures against the common mode noise.A probe device which is used for means for inputting measu...
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JP6301079B2 |
A waveform generator has a waveform generation circuit storing waveform data for an analog waveform signals having dead time periods without the need for storing data on the dead time. A sequencer having a sequence memory stores sequence...
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JP6276330B2 |
A multi-analysis system and a multi-analyzer thereof are configured to use a single probe, couple to an amplification unit, copy a measuring target signal of a first group to the same measuring target signal of a second group, respective...
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JP6267409B2 |
Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement in...
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JP6265687B2 |
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JP2018004481A |
To provide a measuring device and a measuring method that can begin measurement under measuring conditions of the user's choice immediately after its start-up.A spectrum analyzer 10 is equipped with a start-up processor 52 that executes ...
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JP6258573B2 |
A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signa...
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JP2017211387A |
To allow for simultaneously displaying a plurality of input signals, each being based on a different clock signal, in accordance with different time bases.An oscilloscope 320 includes first and second input ports 361, 362 which respectiv...
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JP2017207376A |
To provide a data selection device and a data selection program that facilitate removal of abnormal waveform data and selection of normal waveform data from multiple pieces of waveform data to be obtained in accordance with passage of ti...
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JP6234657B2 |
An apparatus and method corrects for zero ampere level current fluctuations in a current signal. First and second acquisition circuitry generate respective current and voltage data samples of the current signal. Current fluctuation data ...
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JP6235631B2 |
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JP2017198665A |
To reduce noise occurring in analog-to-digital conversion in a test measurement system.An adaptive linear filter is generated based on a converted digital signal and measured signal noise. The adaptive linear filter includes a randomness...
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JP6214956B2 |
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JP2017173324A |
To isolate an RF differential signal from a DUT from common mode interference for effective transmission.A flexible resistive tip cable assembly 300 includes a probe RF connector 310 configured to receive an RF differential signal, and a...
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JP6203471B2 |
A test and measurement instrument (170) including an input port (172) configured to receive an input signal; a digitizer (176) configured to digitize the input signal; a decimator (178) coupled to the digitizer and configured to decimate...
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JP6205139B2 |
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JP2017166968A |
To provide a measurement device and measurement method that can display a measurement result and the like in an easy-to-view fashion without switching screens.A spectrum analyzer 1 comprises: a display screen 14 that displays a measureme...
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JP6199341B2 |
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