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JP7027232B2 |
To generate waveform data without requiring an expensive measuring device or without reducing the insulation quality of an electric power line.A waveform data generator comprises: a read unit (voltage detection unit 11, processing unit 1...
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JP7027233B2 |
To generate waveform data without requiring an expensive measuring device or without reducing the insulation quality of an electric power line.A waveform data generator comprises: a read unit (voltage detection unit 11, processing unit 1...
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JP2022027736A |
To classify bidirectional signals using a single channel.A system 10 has an input section 12 for receiving a waveform signal, and one or more processors 20. The processors 20 are configured to execute a code to cause the one or more proc...
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JP7010916B2 |
To provide a waveform observation device equipped with a clock regeneration circuit, with which it is possible to control the loop bandwidth of the clock regeneration circuit to a prescribed constant bandwidth according to the type of th...
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JP7010784B2 |
To provide a measuring device and a measuring method with which it is possible to achieve a higher resolution when controlling the delay of a trigger signal that controls timing with which the processing of a signal transmitted/received ...
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JP7008552B2 |
To display variations of an input signal at convenient positions with a simple operation.A display unit 1 displaying an input signal on the coordinates on a screen comprises: an input unit 10 that acquires the input signal; and a display...
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JP2022509267A |
The method of classifying the waveform data is the process of receiving the input waveform data in the test measurement system, the process of accessing the reference waveform data and the corresponding class repository, and the process ...
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JP6999276B2 |
A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to th...
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JP6970170B2 |
To provide a clock recovery circuit, a waveform observation device, a clock recovery method, and a waveform observation method that can shorten a lock time when a signal having an arbitrary transmission rate is input and can quickly shif...
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JP6965058B2 |
The invention provides a waveform display device, which can easily display the assigned display at a desired position in the signal waveform in a short time. Under the state that the waveform signal (W1, W2) and the cursor display (21) a...
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JP6965097B2 |
To enable waveform data recording start conditions to be set reliably and easily.In a data generation process for defining a waveform data recording start condition and generating start condition data, the present invention specifies, wh...
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JP6958471B2 |
The objective of the present invention is to perform a comparison with a higher degree of accuracy, even if a discrepancy arises between a target signal and a comparison condition. This control device is provided with: a signal informati...
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JP6959314B2 |
To provide a waveform observation device equipped with a clock regeneration circuit, with which it is possible to automatically correct the frequency characteristic of the signal being measured that is inputted to the clock regeneration ...
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JP2021173646A |
To improve a technique of displaying information on a bus.A digital oscilloscope 1 according to the present disclosure can acquire a plurality of logic signals and display a logic waveform. The digital oscilloscope 1 includes: a display ...
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JP2021173711A |
To provide a logic waveform drawing circuit, a method for drawing a logic waveform, and a logic waveform drawing program that can reduce the processing load required to display a waveform.A logic waveform drawing circuit 10 includes: an ...
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JP2021167815A |
To make it possible to measure a small voltage even when there is an extremely high common mode voltage.An isolation differential current shunt measurement probe 102 for measuring a test measurement system has an isolation barrier 112 fo...
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JP2021527807A |
The test and measurement device consists of an input unit configured to receive an analog signal from the device under test (DUT) and an analog-to-digital converter (ADC) configured to be coupled to the input unit to convert the analog s...
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JP6941234B2 |
The purpose of this invention is to provide a logic analyzer with which it is possible to reproduce the circumstances when analysis was performed. This logic analyzer comprises: an analysis unit which analyzes communication data of half-...
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JP2021139900A |
To selectively display only a waveform of interest from many acquired waveforms with an intuitive operation.A test measurement device acquires a plurality of waveforms from a device under test, stores the waveforms in a memory, and displ...
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JP6935265B2 |
To display easily the cursor at a desired position in the signal waveform.Provided are; a processing unit for displaying a signal waveform W1 based on the waveform data on a waveform display screen 30 and displaying a cursor indication 3...
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JP2021135138A |
To extend a section of a waveform of measurement data which can be displayed on a display screen.A measuring apparatus displays measurement data indicating change of a physical amount of an object to be measured, on a display screen 15a ...
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JP6929627B2 |
A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input sign...
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JP6925598B2 |
To allow parameter setting for a plurality of measurement channels by saving display space.A measurement device 1 comprises: a setting operation unit 2 that displays, on one display screen of a display unit 6, a parameter setting screen ...
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JP6910791B2 |
Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged resu...
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JP6902259B2 |
To evaluate a quality even when a radio signal becomes fast in velocity.A measuring device includes: a down converter part for down-converting a radio signal into a first signal ; an under sampling part for sampling the first signal by a...
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JP2021099340A |
To provide a probe head for measuring both an AC electric signal and a DC electric signal of high-power electronic signal from an inverter or from power electronics similar to an inverter.There is disclosed a device for providing a test ...
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JP6889523B2 |
A test and measurement instrument including a splitter (102) configured to split an input signal (104) into at least two split signals (106, 108), at least two harmonic mixers (110, 112) configured to mix an associated split signal (106,...
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JP6886823B2 |
A measurement system is provided that has a digital edge trigger circuit that is capable of operating at the full signal bandwidth of the measurement system. The digital edge trigger circuit comprises a plurality of processors that proce...
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JP2021081430A |
To enable error detection even in the presence of influence of sideband signals for a pattern of a main signal of a bus.A logic circuit 76 in a test and measurement device determines a data sequence from a main signal of a bus received o...
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JP6876532B2 |
To facilitate the fine adjustment of a display item movement position in a waveform display device that accepts a display item movement operation by touch operation.Provided is a waveform display device comprising a display control unit ...
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JP6876533B2 |
To provide a waveform display device that accepts input of a GPS signal, in which the validity of positioning information is made confirmable.Provided is a waveform display device equipped with a display unit and designed to accept input...
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JP6862103B2 |
A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two predetermined filter coefficient sets, and configured to pas...
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JP2021056215A |
To more accurately and more quickly identify and measure jitter from a signal under test.A test measurement system 300 analyzes signals using machine learning. The test measurement system 300 obtains a recovered clock signal on the basis...
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JP2021047178A |
To allow a user to execute calibration of a signal path for setting of single user designation or setting for designation for the small number of users.A test measurement device 100 comprises a user interface 114 which receives an instru...
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JP6846160B2 |
To provide a signal analyzer having a serial bus decoding function that is not affected by abnormal noise in communication in which voltage modulation and current modulation are superposed on one signal line even if any one of them cause...
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JP6846180B2 |
To enable performing similarity determination of a waveform by matching levels of both measurement waveforms, when the measurement waveform are compared with each other by means of a histogram.A waveform recording apparatus comprises: an...
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JP6843478B2 |
A zero insertion force connector (110, 200, 300) comprising a housing (201) including an opening (202) and defining an interior space for receiving a flexible PCB (120) and multiple spring contacts (302) positioned within the interior sp...
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JP6843479B2 |
A zero insertion force connector (110, 300, 400) comprising a housing (310, 401) including an opening (302) and defining an interior space for receiving a flexible PCB (120, 200) and multiple spring contacts (402) positioned within the i...
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JP6844404B2 |
To provide a waveform recorder with which it is possible to detect a desired event relating to a signal waveform efficiently with high accuracy without incurring an increase in cost.A buffer 12 temporarily stores digital data Dd that is ...
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JP2021027918A |
To provide a waveform display apparatus, waveform display method and waveform display program capable of preventing or suppressing erroneous classification of heart rate, when changing the classification.A waveform display apparatus comp...
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JP6821551B2 |
To improve adjustment efficiency in adjustment of an object to be measured.A sampling oscilloscope 1 includes: a waveform data generation part 3 for generating waveform data by sampling an input signal of an object W to be measured; an o...
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JP6815589B2 |
A test and measurement instrument, including an input configured to receive a signal-under-test, a user input configured to accept a first trigger event and a second trigger event from a user, a first trigger decoder configured to trigge...
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JP6799369B2 |
A test and measurement system for synchronizing multiple oscilloscopes including a host oscilloscope and at least one client oscilloscope. The host oscilloscope includes a host timebase clock configured to output a clock signal, a host d...
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JP6799367B2 |
A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electro...
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JP2020190556A |
To reduce a test time of a device under test (DUT).A test measurement system 400 obtains waveforms that occur in testing a DUT 426 and performs analysis of each of the waveforms at least in part in parallel. Also, the system obtains a fi...
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JP6779113B2 |
To achieve a waveform measuring device capable of executing serial bus decode setting automation processing without being affected by noise even if the noise overlaps with a data signal in communication in which voltage demodulation and ...
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JP6743768B2 |
This inspection device has: electric contacts (51) that are electrically connected to an object to be measured by making contact with the object to be measured; conductive sections (52) that are electrically connected to the electric con...
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JP6741417B2 |
To generate a trigger from a high-level description of a protocol.A test measurement apparatus 405 can store a state machine 415 corresponding to a regular expression 440. The state machine 415 can be changed to reflect a trigger conditi...
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JP2020118689A |
To analyze a cause of unexpected measurement result if the unexpected measurement result is obtained.A test and measurement instrument 100 such as an oscilloscope is configured to: receive a signal to be measured by a port 102; generate ...
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JP2020118685A |
To effectively capture a modulated bus signal modulated by an arbitrary wireless modulation scheme.A test and measurement device receives a modulated bus signal modulated by an arbitrary wireless modulation scheme in an input section 100...
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