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JP2016031371A |
To correct timing errors of a clock signal.Each of four samplers 212, 214, 216, 218 receives a clock signal that has been split. A first clock signal 204 is sampled by a first sampler 212 at a first phase, a second clock signal 206 is sa...
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JP5874895B2 |
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JP5875801B2 |
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JP5855838B2 |
A switching system for interfacing a single channel test equipment with a multi-channel device under test, the switching system including: an input connection for connecting to the single channel test equipment; an N-way switch having an...
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JP2016024200A |
To accurately determine a correlated waveform.A method for determining a correlated waveform includes; acquiring a generalized waveform record with a repeating pattern; determining a possibly corrected recovered clock signal for the gene...
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JP5851107B2 |
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JP5851121B2 |
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JP5837324B2 |
A "density trace" (730) is formed by measuring the density of each column of a frequency domain bitmap (720) above a user-specified "amplitude threshold" (725). The density of each column equals the sum of the densities of all of the pix...
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JP5821161B2 |
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JP5817042B2 |
A test and measurement instrument and method for providing post-acquisition trigger control and presentation of associated waveforms on a display (135). An electrical signal under test is sampled and digitized, and stored in an acquisiti...
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JP5817041B2 |
A test and measurement instrument and method for providing post-acquisition trigger control and presentation of associated waveforms on a display (135). An electrical signal under test is sampled and digitized, and stored in an acquisiti...
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JP2015201849A |
To allow for compact display of a wide dynamic range, by using a familiar number of aperture (F) stages.A waveform monitor 20 generates a changed image from the original image of a camera 12. A luminance measurement system of the wavefor...
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JP5791756B1 |
To obtain a truly average average waveform in which the characteristics of the waveform are not lost due to the effect of smoothing by averaging the observed waveform, and the variation in the time axis direction of the observed waveform...
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JP5783877B2 |
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JP5780392B2 |
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JP5774370B2 |
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JP2015159494A |
To easily grasp the transition of a desired symbol point in the temporal consequence of the symbol point on constellation display of a measured signal.A signal processing apparatus 100 includes a control device 40. The control device 40 ...
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JP5749038B2 |
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JP5739499B2 |
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JP2015108532A |
To provide a measurement device allowing past and latest measurement waveforms to be easily and visually distinguished and a position where the past and latest measurement waveforms overlap with each other and overlapping frequency there...
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JP5732654B2 |
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JP5725690B2 |
To detect properly a part in a desired state, even in the case of a signal to be measured including a transient state. The first and second waveform data showing a power source and a DUT are stored respectively in a memory by using a wav...
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JP5717332B2 |
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JP5711777B2 |
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JP2015075490A |
To realize a broad dynamic range with small bit depths.Possible memory values are divided into two or more value ranges and an increment percentage is assigned to each of the value ranges. During operation, first a present memory value i...
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JP5702532B2 |
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JP2015064357A |
To reduce measurement errors caused by the probe tip loading of a DUT.A de-embed probe 100 includes two input terminals 112 and 114 configured to connect to a DUT, a memory 110, a signal generator 102 configured to output a signal, a plu...
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JP2015064358A |
To eliminate the need for load-switch elements.A de-embed probe 100 includes: two input terminals 114 and 116 that can connect to a device under test; a memory 108; a signal generator 102 connected to the input terminals 114 and 116 and ...
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JP5699402B2 |
A test and measurement instrument including an input configured to receive a signal and output digitized data; a memory configured to store reference digitized data including a reference sequence; a pattern detector configured to detect ...
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JP5669290B2 |
A trigger generator and trigger method are provided for determining whether or not a signal under test matches a modulation signature. The modulation signature may be provided as a magnitude signature, a phase signature or both. When the...
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JP5637555B2 |
A signal acquisition system has a signal acquisition probe(105) having probe tip circuitry (204) coupled to a resistive center conductor signal cable (206) with the signal cable coupled to a signal processing instrument via an input node...
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JP5632349B2 |
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JP5632793B2 |
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JP5632348B2 |
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JP2014219244A |
To enable detail observation of a measurement value satisfying a regulated condition and to compose a storage section from a storage element of less capacity without causing a time zone that cannot grasp a change in the measurement value...
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JP2014215081A |
To display a signal waveform by easily setting the number of waveform display areas defined on a waveform display screen.The present invention comprises a display unit 12 having a touch panel 13 disposed therein and a display control uni...
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JP5620356B2 |
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JP5620355B2 |
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JP5615481B2 |
A method of displaying a time sequence of 2-dimensional data represents each data set in the time sequence as a normalized figure based upon a reference set of data. The perimeter of the normalized figure is color coded to represent devi...
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JP2014202647A |
To accurately and easily obtain the correspondence between a measurement place and measurement data.By obtaining a measurement state image D in a state in which probes 11, 12, and 13 having QR codes A1, A2, and A3 are butted on measureme...
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JP5605842B2 |
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JP5605834B2 |
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JP5607301B2 |
An approach is provided for digital triggering a recording of one or more digitized signals on a digital oscilloscope by means of carrying out a level comparison for determining a triggering instant in each case between two successive sa...
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JP5603171B2 |
A mixed signal acquisition system for a test and measurement instrument allows configuring of the number of analog and digital channels in use. The instrument includes an analog input interface and an N-channel logic input interface for ...
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JP2014190981A |
To facilitate observation by making the decay rate of rarely occurring waveform intensity slower than the decay rate of frequently occurring waveform intensity in raster display of waveforms with persistence decay.An apparatus can includ...
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JP5599378B2 |
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JP5599377B2 |
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JP5593648B2 |
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JP2014173872A |
To provide a waveform display device capable of moving, to a desired position, a cursor on a waveform displayed on a touch panel by a touch panel operation without using a hardware switch or software switch for cursor operation.The wavef...
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JP2014169882A |
To provide a waveform display device and program capable of moving a waveform by a simple operation.The waveform display device 1 includes: a main body 2 including a display screen 17; an impact detection sensor 10 for detecting an impac...
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