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JP2020115128A |
To synthesize waveforms using an asynchronous fixed rate DAC.A test measurement device 100 has a DAC 112 having an output sample rate, receives a digital sample waveform and a reference clock, and outputs an analog waveform at the above ...
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JP6713267B2 |
A method in an electronic device that may include determining, with a processor, a quantity of group markers in a data set, and determining, with the processor and based on the quantity of group markers, a suggested view from a plurality...
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JP6714317B2 |
The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test ...
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JP2020085691A |
To realize consistently high probing accuracy by a simple structure without complicated control, and acquire a high-quality waveform.A probe device 100 for waveform measurement comprises: a signal-side probe 200 brought into contact with...
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JP6694836B2 |
To suppress a residual jitter when forming a strove while capable of using a fixed BPF for a passing frequency range.A trigger circuit 2 includes: a DDS 12 that outputs a trigger clock input within a movable frequency range at an arbitra...
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JP6687664B2 |
The waveform display device of the present invention is provided with a waveform pattern storage unit configured to store, in an associated manner, a control command and a waveform pattern of time-series data measured when the manufactur...
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JP6687653B2 |
A time-series data analysis device analyzes the time-series data output by a machine tool, the time-series data analysis device including a time-series data acquisition unit configured to acquire the plurality of time-series data includi...
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JP2020064006A |
To provide a sampling oscilloscope capable of reducing the time required for scale adjustment.A sampling oscilloscope 1 samples a signal input from a measurement object W and displays an eye waveform on a display screen 7a. The oscillosc...
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JP6684399B2 |
To realize sampling (signal measurement) and analysis of a signal to be measured easily at low cost by capturing optical phase fluctuation even when low-speed sampling is carried out. This sampling method includes: a step for acquiring m...
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JP6677983B2 |
A test and measurement instrument includes a user interface (1020) and a controller (1005). The controller is configured to receive a serial bit stream and apply a logic (1010) to the serial bit stream to identify states within the seria...
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JP2020046176A |
To provide a facility monitoring system capable of storing waveform data for a long time with a reduced data capacity.It is provided with an analog waveform depiction unit 201, a waveform storing unit 301 for storing the waveform describ...
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JP6672345B2 |
A sampling oscilloscope includes a trigger generation circuit that includes a direct digital synthesizer (DDS) that outputs a trigger clock input in an operable frequency range at an arbitrary output frequency, a band pass filter (BPF) t...
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JP2020041864A |
To provide a waveform data compression device which can suppress reduction of the reproductivity of measurement data even if digital waveform data is compressed.The waveform data compression device includes: a digital waveform acquisitio...
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JP6656592B2 |
A waveform display device includes: an operation accepting unit for accepting operation by a user; and a display controller for generating waveform display screen including a program pattern waveform for program control and an actual mea...
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JP6653127B2 |
A device is capable of receiving a waveform and capturing acquisitions of the waveform. Different boundary masks can be applied to the waveform acquisitions, depending on the timing of the acquisition. When a timing interval finishes, a ...
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JP6644469B2 |
To provide means for making an operator notice such an erroneous operation that an injection operation is performed by a chemical feeder in the state where an empty syringe (syringe filled with air) is set in the chemical feeder.In a dis...
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JP6643800B2 |
An accessory (104) for use with a test and measurement instrument (100). The accessory includes an input (114, 116) to receive a signal from a device under test (106), a calibration unit (108) configured to apply a calibration or compens...
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JP6629511B2 |
A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signa...
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JP6625270B1 |
The display data generator (10) uses the degree of similarity between the acquisition unit (11) that acquires the input signal as the degree of similarity, and sets the degree of similarity as the input signal from a plurality of predete...
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JP6626630B2 |
Provided are a method and an apparatus that are capable of easily obtaining a data sheet including characteristics under desired operating conditions based on an actual measurement. A method of evaluating an electronic and an apparatus c...
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JP6621513B2 |
To provide a touch operation suitable for a waveform display device having a touch panel.A waveform display device having a touch panel comprises a display screen generation part for, when recognizing one point touch operation, acquiring...
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JP6622970B2 |
A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal fro...
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JP6618737B2 |
To enable a range in which display of a graph is desired to be reliably and easily designated.The present invention includes a display control unit for making a first variable (elapsed time) mapped to a horizontal axis and a second varia...
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JP6619545B2 |
A method of preventing inter-system interference while acquiring waveforms in a test and measurement instrument with variation in a device under test system S-parameters. The method includes receiving a waveform from a device under test ...
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JP6612052B2 |
A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signa...
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JP6604725B2 |
A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for chara...
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JP6605285B2 |
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JPWO2019049199A1 |
In a data display system that displays data, a controller that receives a measurement signal measured from a measurement target and samples the measurement signal at a plurality of different sampling frequencies and a plurality of differ...
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JP6594471B2 |
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JP6594470B2 |
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JP6593983B2 |
A harmonic time interleave (HTI) system can include a sample clock to provide a reference signal, a summing component to receive the reference signal and a second input, a splitter component to receive an input signal, and delay blocks t...
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JP2019174458A |
To perform measurement of a plurality of DUTs by a single test measuring device.A management device 220 includes: at least one processor; and a memory for receiving requests from a request device 222 and storing the requests as request q...
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JP6586207B1 |
To improve processing efficiency for waveform data. A waveform information processing apparatus of the present invention displays a waveform display unit that displays waveform data acquired from an apparatus on a display, and a process ...
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JP2019152653A |
To increase a usable voltage range of an electro-optical test device.A controller 220 provides an optical carrier signal to a sensor head 230, and receives a phase modulated optical signal modulated at the sensor head 230. The controller...
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JP2019146163A |
To provide a noise filter for reducing noise added by a test and measurement instrument channel from a signal received from a DUT.A noise filter 100 includes a splitter 104 which splits a signal into a first split signal and a second spl...
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JP2019135485A |
To observe what occurs on a network on a time line.A network oscilloscope 100 includes a plurality of ports 102 for receiving a stream of network data, one or more processors 116, and a display device 112. The processors 116 generate a t...
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JP6545221B2 |
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JP6544030B2 |
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JP6534541B2 |
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JP2019078633A |
To improve the operability of waveform enlargement operation in which an area at the screen edge is targeted, in a waveform display device for performing the waveform enlargement display by touch operation of a plurality of points specif...
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JP6516437B2 |
To provide a touch operation suitable for a waveform display device that includes a touch panel.A waveform display device provided with a touch panel includes a display screen generation unit that obtains, when recognizing one-point touc...
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JP6490360B2 |
An automated spectrum monitoring system may include a measurement device having a signal information display configured to visually present signal information pertaining to a signal, a real-time trigger detector configured to detect a tr...
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JP6483368B2 |
The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a cur...
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JP6484263B2 |
To provide a screen division display device that can easily display an operation screen in a desired division area without a user being aware of whether division areas of a display screen divided into plurality are focused, a measuring d...
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JP6478647B2 |
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JP6472633B2 |
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JP6472627B2 |
To reliably and easily generate image data with which it is possible to grasp the information associated with a quantity to be measured in a first screen that indicates the quantity to be measured.A data generation device according to th...
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JP6467608B2 |
One or more mask triggers can be configured. Combinatorial mask triggering logic (170) can make various determinations about the relationship between a digitized signal and the one or more mask triggers. The various determinations about ...
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JP6466056B2 |
An apparatus and method for triggering (27) an oscilloscope is disclosed. The oscilloscope is configured to process a first signal (102) in a first domain (106, 108, 110, 112) and a second signal (152) in a second domain (156, 158, 160, ...
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JP6460623B2 |
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