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WO/1986/005887A1 |
A power meter which is able to display the power consumed and the cost of power consumed over any given period. This device provides a continuous measurement of the electrical power consumed which gives a more accurate measurement than m...
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WO/1986/001594A1 |
A display signal generator which produces signals that can be used for both an analog display device (7) and a digital display device (6) to indicate the output frequency of the inverter. For this purpose, the pulse width of digital sign...
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WO/1984/003944A1 |
This numerical value measuring instrument comprises an oscilloscope device, a position-detecting panel mounted on the display surface of the oscilloscope device, a keyboard acting as a man-machine interface, and a computer into which det...
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WO/1983/004326A1 |
A system (Fig. 1) for high speed acquisition and storage of data from transient electrical signal waveforms sampled in time at a multiplicity of points, and where it is desired to collect and store data in real time in a mass storage uni...
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WO/1983/004107A1 |
Electrical signals are measured (analyzed and displayed) with picosecond resolution and sensivity in the microvolt (less than 100 microvolts) range by electron-optically sampling the signal. Sampling electron bursts are produced in respo...
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WO/1983/002829A1 |
Electrical signals are measured (analyzed and displayed) with picosecond resolution by the electro-optic sampling of the signal being analyzed in a traveling wave Pockels cell (32). Sampling pulses, from an optical pulse generator (10) s...
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WO/1983/002697A1 |
A high speed analog sampler using a CRT (21) having a number of target elements (43, 45) arranged in a circle with the electron beam being repetitively scanned over the target elements in a circle. The amplitude of the analog signal to b...
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WO/1983/002024A1 |
A technique utilizing either particular software with a microprocessor (17) or computer or a hard wired digital or analog circuit for determining, from a few sample magnitudes acquired from an analog signal at equal time intervals, the s...
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WO/1983/000933A1 |
A signal sampling and conversion system for high-frequency sampling of either recurrent or non-recurrent signals in which the electron beam (6) generated by an electron gun assembly (2) of a CRT (1) is scanned across a charge coupled dev...
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WO/1982/002975A1 |
Numerical display apparatus which is particularly useful in connection with energy metering systems. The apparatus includes a data display processor having logic elements (40, 44, 48) capable of recognizing a data word by means of a sync...
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WO/1982/002431A1 |
The invention allows the representation on a screen and at will, in colour, measurement values, whatever their amplitude may be. It allows also their memorization them. A voltage measure (Ux) is introduced in an adder amplifier (12) at t...
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WO/1982/000206A1 |
Two signal traces are displayed simultaneously on an electro optic display such as a liquid crystal display. The display may be in cartesian format having m X electrodes and n Y electrodes in which case the X electrodes are in strip form...
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WO1982000055A1 |
Dosimetric data are registered in several channels as a directly readable bar chart, the height of the readable registration of each respective bar being a direct measure of the integrated dose value of the associated channel. Preferably...
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WO/1981/002644A1 |
A dynamic display system for discrete events of complex data that are carried by discrete electrical signals which indicate values in three coordinates as triads. A cathode ray tube display apparatus (16) (television monitor) with a plan...
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WO/1981/001935A1 |
Method and apparatus for creating optical displays from a real optical scene with an optical feedback circuit projecting a parameter of the original scene (18) for combination with the original scene itself or an image thereof. The feedb...
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WO/1981/001937A1 |
A device for stabilization of the electron beam current comprises a sensor (12) of the deviation of the electron beam current from a preset value, a sawtoothed voltage former (14) which is connected to the high-voltage transformer (2) of...
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WO/1981/001203A1 |
A colour analyser measuring the light intensities of at least three different colours within the spectrum of the incident light, and relating these measurements to values programmed before. Those colour components of the incident light t...
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WO/1980/001417A1 |
A method of visualization and recording of visible representation of a vectorial field on a carrier consists in heating the carrier to a temperature higher than the softening temperature of a binder (3) and placing the carrier into a vec...
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WO/1980/000879A1 |
Control apparatus whose circuits are established to indicate an electrical voltage in a large range of staggered voltages, each stage comprising transistors or amplifiers.
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WO/1979/001058A1 |
Input setting means and display means thereof for electric ovens, electronic cooking ranges and the like which have a digital control system. There is provided input key means for setting heating time, operation of which facilitates digi...
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WO/1979/000996A1 |
In the simultaneous recording of the voltage (U) between a working electrode and a reference electrode in a measuring instrument for potentiometric stripping analysis of a solution containing metal ions, and of the derivative of this vol...
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WO/1979/001043A1 |
This series-parallel for column indicator and flat screen image comprises a stagger register (30) composed of several stages (31, 32, 33) each stage comprising two inverter stages (1/2; 3/4; 5/6) to which are applied two clock frequencie...
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WO/1979/000676A1 |
A circuit for driving a liquid crystal bar graph display unit has a major object to provide a circuit of simple construction, which may be used even when the numbers of block electrodes and segment electrodes are altered. In order to per...
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JP7467215B2 |
To provide a waveform measurer with which it is possible to compress captured data and computation results to make these displayable and improve the technology for data display by the waveform measurer, and a method for controlling displ...
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JP7463931B2 |
To provide a voltage display control unit that can display AC voltage at a time interval shorter than a communication period, and a machine tool.A voltage display control unit comprises: a generation circuit that generates a voltage valu...
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JP2024514321A |
The device is connected to at least one substrate having at least two conductive paths, at least two connectors disposed in a first plane, and connected to one of the at least one substrate and having one conductive path perpendicular to...
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JP2024032487A |
[Problem] To shorten the processing time involved in creating a spectrogram and promote speeding up. According to an embodiment, a signal analysis device includes a memory for storing time-series signal samples, a first processor, and a ...
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JP2024031971A |
In addition to implementing a relatively simple deskew method using square signals, a method is provided for applying a current sensor transfer function to a current waveform obtained during dynamic testing. A dynamic test setup includes...
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JP2024027867A |
An object of the present invention is to provide an oscilloscope whose touch operation is easier to understand. [Solution] The oscilloscope is equipped with a touch panel display that displays current and voltage waveform graphs. and a d...
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JP2024508467A |
A test and measurement system includes a primary instrument having an input that receives a test signal for measurement or analysis from a device under test (DUT) and generates a test waveform from the test signal, and one or more second...
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JP2024020154A |
The present invention is to collect a large amount of waveform data and metadata for training a deep learning network. A test and measurement system includes an oscilloscope 24 configured to receive waveform data from a device under test...
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JP2024506293A |
A system for generating images in test and measurement equipment includes a first input for receiving a waveform input signal carrying sequential digital information; and a first input for receiving a waveform input signal carrying seque...
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JP2024014841A |
A mixed signal of various types of signals is generated. An arbitrary waveform generator (10) has at least two waveform generators (16). Each waveform generator includes a signal generator for generating an in-phase (I) digital signal an...
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JP2024014840A |
An object of the present invention is to shorten the blind time of test and measurement equipment. A test and measurement apparatus (12) includes an acquisition circuit (14) that receives batches of waveforms from a device under test (10...
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JP2024014843A |
[Problem] To shorten the dead time of a test and measurement device. A test and measurement apparatus 100 includes an input port 102 configured to receive an input signal from a device under test 101 and configured to store the input sig...
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JP2024013081A |
[Problem] By saving two types of waveform data with different time intervals in the same file, file management is facilitated, and waveform display of two types of waveform data with different time intervals on the same time axis is faci...
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JP7413124B2 |
To provide a waveform measurement device which is capable of performing recomputation and offers an improved computation function, and to provide a method for recomputation therewith.A waveform measurement device is provided, comprising ...
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JP2024501347A |
An electrical signal sampling device (100). a pulse signal source (110), a first sampling module (130), and a signal delay module (140), the pulse signal source (110) configured to generate a pulse signal; is connected to the pulse signa...
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JP2024001002A |
[Problem] To more efficiently acquire data necessary for machine learning. A test and measurement apparatus 70 has one or more ports 73 for receiving signals from one or more devices under test (DUT) 74, one or more processors 72, and on...
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JP2024000999A |
The present invention generates output based on principal component analysis (PCA) of an original data set. A system 900 has a port 902 that receives data sets including at least two sets of data sets in a data set domain. Principal comp...
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JP2024000997A |
An object of the present invention is to effectively perform signal analysis of an input signal. A test and measurement system 900 includes a port 902 that receives an input signal from a device under test (DUT) 990, a measurement unit 9...
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JP2023183409A |
To more correctly predict a performance measurement value of a device under test.A test and measurement device 10 has an input port 13 to allow the instrument to receive waveforms from a device under test (DUT) 11, first and second low p...
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JP7404133B2 |
To provide a measurement system and control method of the same, which can improve the technology for parallel driving of multiple digital oscilloscopes.A measurement system 1 includes a plurality of digital oscilloscopes connected in par...
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JP7402597B2 |
A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a devic...
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JP2023180577A |
To improve a system accessible to a plurality of waveform analysis devices from a plurality of devices.In an information processing method of an information processing device 10, a control part 11 of the information processing device 10 ...
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JP2023179325A |
To secure safety of an operator and furthermore to reduce the burden of work on the operator to thereby improve work efficiency, in measurement using a probe.A probe measurement support system is provided, having a probe which measures a...
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JP7390340B2 |
A measurement device (10) includes a first processor (12a) that performs first pipeline processing on a first input signal according to a first sample timing, a second processor (12b) that performs second pipeline processing on a second ...
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JP7390235B2 |
To provide a waveform measuring instrument and a data transfer method thereof that can improve data transfer techniques to external devices.A waveform measuring instrument includes: a communication unit 19: a touch panel 18 that displays...
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JP2023169786A |
To provide a trigger generation circuit and a waveform measurement device, which may enhance convenience of waveform measurement.A trigger generation circuit 20 comprises: a trigger signal generation unit configured to output a trigger s...
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JP7381512B2 |
An error rate measuring apparatus that measures whether or not an FEC operation of the device under test is possible based on a comparison result of the signal received from the device under test and a test signal includes an operation u...
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