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JP2023501739A |
An accessory device converts signals from a test port, an instrument port connected to an instrument having an operating bandwidth, and a test port having a first frequency range into a signal having a second frequency range different fr...
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JP2023004458A |
To highly accurately determine whether there is abnormality in a signal waveform.A determination device (1) for waveform abnormality comprises: a reference parameter setting unit (12) which performs, for each of a plurality of reference ...
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JP7201339B2 |
To improve the display synchronism of an input signal with a computation result in a measuring instrument having a real-time computation function.A waveform memory unit 120 in which data of an input signal is stored includes a waveform m...
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JP2022186677A |
To provide a machine learning platform that has flexibility to test multiple types of components and that can be integrated into a customer testing system.A test and measurement system provided herein includes a machine learning system 2...
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JP7187767B2 |
A field device includes a sensor configured to detect a physical quantity and to output the physical quantity as a sensor signal, a signal processor configured to process the sensor signal and to output the sensor signal as a processing ...
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JP7182059B2 |
To provide a measured value prediction module with which it is possible to detect the abnormality of a waveform even for a complex waveform composed of high and low frequencies overlapping each other.Provided is a measured value predicti...
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JP2022179459A |
To improve measurement speed.A test and measurement device 20 receives a signal from a device 10 under test through a probe 32. One or more processors 38 generate a waveform from the signal, apply an equalizer to the waveform, receive an...
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JP2022173754A |
To provide a serve detection device that detects a lightning surge accurately, and is quite small in fluctuations of an output time of a detection signal of the lightning serge.A lightning surge detection device 1, which detects a lightn...
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JP7176030B2 |
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JP2022171633A |
To lengthen a probe chip by improving CMRR.An isolation type probe chip for probes having a triaxial cable 30 includes: a conductive probe chip interface 48 located in one end of a cable 30; a signal conductor 32 electrically connected t...
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JP2022546169A |
The present invention relates to a method of testing the control software of a controller supplying a data stream (12) for evaluation, the method comprising the following steps: - a plurality of rows (14) and a plurality of columns (16);...
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JP2022165946A |
To improve throughput of measurement.A test measurement system 18 includes a machine learning system 36 which processes a waveform image output from a flash array digitizer (FAD) array 20 and associates the image with a set of tuning par...
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JP7161830B2 |
To detect a similar waveform, irregular waveform or the like by a determination criterion near to sensibility in which a human determines a similarity.A waveform recording device comprises: a comparator 61 that compares measurement data ...
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JP2022164655A |
To facilitate setting of a source event (pulse signal and the like) to be supplied to a DUT.A configuration device in a test and measurement system including a source event generation unit and a DUT that receives an event from the source...
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JP7157543B2 |
A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample dat...
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JP7154872B2 |
To provide a digital oscilloscope that can perform so that a calculated true trigger point is not biased toward a specific value when a through rate of an input signal is slow, and to provide a digital oscilloscope control method.A digit...
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JP7153679B2 |
A test control unit executes first measurement of changing the power of a transmission signal transmitted by the mobile terminal in a first range and second measurement of changing the power of the transmission signal transmitted by the ...
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JP2022154353A |
To provide a waveform display device and method, which enable efficient analysis.A waveform display device is provided comprising a control unit for displaying grid lines together with a signal waveform based on measurement data on a dis...
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JP2022151843A |
To effectively capture events that occur very infrequently in a signal of a DUT.A test and measurement instrument 200 receives a signal from a DUT101, generates an acquisition from the signal, stores the acquisition in an acquisition mem...
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JP2022151844A |
To effectively capture events that occur very infrequently in a signal of a DUT.A test and measurement instrument 100 receives a signal from a DUT101, generates an acquisition from the signal, stores the acquisition in an acquisition mem...
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JP7146462B2 |
To suitably generate processed data based on a value of a first processing object data generated in a measuring device and a value of a second processing object data generated in an external device without acquiring a synchronization sig...
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JP7143155B2 |
To provide a digital waveform display device which can easily confirm the tendency of measurement data over a wide time range and the details of the measurement data in a specific section.The digital waveform display device includes an a...
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JP7139476B1 |
Kind Code: A1 A mask margin when ignoring an arbitrary violating sample can be known. A mask setting unit 4b sets a mask having a shape substantially similar to the shape of an area surrounded by an eye pattern of a data signal and havin...
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JP7132986B2 |
To provide an error rate measuring device and an error rate measuring method capable of drawing an error rate contour diagram having an eye opening shape that is preferable for evaluating the signal quality of a signal to be measured wit...
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JP7130096B2 |
To display easily the cursor at a desired position in the signal waveform.Provided are; a processing unit for displaying a signal waveform W1 based on the waveform data on a waveform display screen 30 and displaying a cursor indication 3...
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JP2022121416A |
To allow for easily extracting information needed to solve a particular problem from acquired waveform data.A computing device 12 comprises a port 22 for connecting to a network 28, and one or more processors 16. The one or more processo...
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JP2022104369A |
To provide an improved waveform measuring instrument and data acquisition method.A waveform measuring instrument comprises: a determination circuit; a detector; and a computation circuit. The determination circuit determines whether an i...
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JP7097154B2 |
Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified...
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JP7096653B2 |
An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively a...
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JP2022100436A |
To provide a faster and cheaper waveform generation circuit that has a low jitter effect on arbitrary waveform generation.A waveform generation circuit 10 includes: an accumulator 11 that adds and outputs a phase addition value for each ...
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JP7094143B2 |
To enable the acceptability of an object to be exactly determined without being affected by a difference in size of a noise component superimposed on a measurement result or ringing.A processing unit 23 for executing a determination proc...
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JP2022097473A |
To provide a test measuring device and a calibration signal generation method that generate a calibration signal of a stressed eye signal used for a compliance test of a device under test in a shorter time.First and second parameters are...
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JP2022094048A |
To improve accuracy of calibration using a window function.A signal calibration device 1 comprises: a signal acquisition unit 10 for acquiring an output signal; a time window cutout unit 12 for cutting out a plurality of time windows fro...
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JP7088723B2 |
To provide a display device and a program for display with which it is possible for a user to suitably recognize a correspondence relation between respective displays, even when measured value data is displayed by different time scales.P...
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JP7085796B2 |
An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Li...
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JP7085805B2 |
Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduce...
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JP7085813B2 |
A method of employing a Decision Feedback Equalizer (DFE) in a test and measurement system. The method includes obtaining an input signal data associated with an input signal suffering from inter-symbol interference (ISI). A bit sequence...
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JP7084122B2 |
Disclosed is a noise filter. The noise filter includes an input port to receive an analog signal. The noise filter further includes a multiplexer coupled to the input port. The multiplexer separates the analog signal into a plurality of ...
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JP2022086903A |
To provide an improved waveform measuring device and a data acquisition method.A waveform measuring device includes an analysis circuit, a measurement circuit, an arithmetic circuit, and a memory controller. The analysis circuit outputs ...
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JP7082197B2 |
The purpose of this invention is to provide a logic analyzer with which it is possible to perform processing according to the properties of communication data to be analyzed. This logic analyzer comprises: an input module which inputs se...
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JP2022083398A |
To suppress the deterioration of the flatness of the frequency characteristics with a simple method.An input circuit 100 to which a potential signal Vin is input includes an operational amplifier 10 constituting an inverting amplifier ci...
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JP2022082531A |
To facilitate collaboration of large waveform data through a network.A test and measurement device 12 has a communications port 22 configured to connect the test and measurement device 12 to a network 30, a memory 16, and one or more pro...
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JP7074501B2 |
To provide a waveform display device and method capable of allowing an observer to easily observe a signal waveform by displaying a value of grid interval when the grid is displayed together with a signal waveform by the waveform display...
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JP2022076480A |
To teach a merit of upgrading by a method that can be understood easily by a user.A test measuring device includes a system and a method for generating recommendation for upgrading functions of a device. Such a method includes the proces...
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JP7061417B2 |
Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer (141) into two or more frequency bands. Each of...
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JP2022054493A |
To remove limitations on a measurement position and measure data of a waveform of current or the like, and to improve the power transmission efficiency especially in designing a rectifier circuit of wireless power transmission.A method f...
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JP7046881B2 |
To improve the usability.An error rate measuring device 1 includes a signal receiving unit 3a that receives a signal from a measured object when a multi-valued signal having a known pattern of 2 bits or more is input to the measured obje...
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JP7043167B2 |
A multi-mode metrology user interface device includes a signal processing and control portion, a user input interface portion, and a communication portion. The signal processing and control portion includes a measurement display mode con...
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JP2022519763A |
The system includes multiple oscilloscopes, each with an output port and an input port, and a cable that connects the output port of the first oscilloscope in multiple oscilloscopes to the input port of the second oscilloscope in multipl...
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JP7035002B2 |
To provide a clock recovery circuit, a waveform observation device, a clock recovery method, and a waveform observation method that can shorten a lock time for the input of a signal with a known transmission rate and shorten a waveform o...
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