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JP7379642B2 |
To improve the display synchronism of an input signal with a computation result in a measuring instrument having a real-time computation function.A waveform memory unit 120 in which data of an input signal is stored includes a waveform m...
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JP7376559B2 |
To provide a photoelectric conversion module capable of suppressing degradation of photodiode high-frequency characteristics.A photoelectric conversion module 1 includes a photodiode 20 for converting an optical signal into a current sig...
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JP2023159054A |
To easily detect a portion similar to a specific portion in a waveform.A test measurement device 700 comprises: a port 702 that receives an input signal from a device under test 790; a memory 710 that stores a sampling waveform derived f...
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JP2023157424A |
To provide an amplitude calculation device capable of precisely calculating the amplitude of a sine wave even when noises are superimposed on an input signal of the sine wave input with a different frequency.An amplitude calculation devi...
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JP2023153038A |
To rapidly tune and test a device under test (DUT) at multiple temperatures.A testing system 10 includes multiple ovens 20 to 26 for housing multiple DUTs, respectively, corresponding DUT switches 30 to 36, and an oscilloscope 52, and fu...
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JP7359885B2 |
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JP7357600B2 |
A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, suc...
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JP2023138489A |
To more quickly evaluate a noise characteristic of an oscilloscope.A method of dynamically determining a noise characteristic of an oscilloscope includes: based upon a current environment setting of the oscilloscope, retrieving a power s...
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JP2023138319A |
To provide a calibrator having an enhanced user interface (UI).The calibrator outputs an electrical signal over an output terminal of the calibrator. The calibrator presents, on a display of the calibrator, a graphical indication associa...
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JP2023118113A |
To allow for capturing time gaps of input signals, which are not captured by conventional devices.A test measurement device 1300 is provided, comprising a first channel input unit for receiving a first input signal, a second channel inpu...
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JP7332435B2 |
To provide a waveform recording device capable of easily setting a condition of a recording mode while accurately grasping the condition.A waveform recording device 10 includes mode selecting means for selecting a recording mode in which...
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JP7326507B2 |
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JP7324050B2 |
A waveform segmentation device has a state level estimation unit that estimates a state level of input waveform data, and a segmentation identification unit that segments the waveform data at a plurality of segmentation points based on t...
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JP2023103994A |
To allow TDECQ values to be predicted while the creation of training data sets is simplified.A test and measurement system 42 receives signal waveforms from a plurality of devices under test or waveform simulators, collects a set of trai...
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JP2023103188A |
To generate a spectrogram display with an intuitive operation.A test and measurement instrument 1700 comprises: a spectrogram generator 1722 for producing a first spectrogram image from an input signal; a display 1712 for showing the spe...
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JP2023103193A |
To display measurement results of an input signal in time and frequency domains by using intuitive operation.A test and measurement instrument 1700 comprises: an input port 1702 for accepting an input signal for measurement; a display 17...
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JP2023531401A |
The system includes an input for receiving the digital waveform signal, a memory, and one or more processors for generating a horizontal ramp sweep signal based on the digital waveform signal, receiving a selection input for identifying ...
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JP2023100598A |
To decrease the amount of kick-out energy from a sampling circuit.A test and measurement device includes an input port 102 to receive an input signal. A sampling circuit 110 is structured to generate a sample from the input signal, and g...
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JP7311234B2 |
To provide a waveform recording device which allows for easily and accurately comparing waveform data to different waveform data.A waveform recording device 10 provided herein comprises a recording medium 30, a waveform generation unit 3...
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JP2023530110A |
The test and measurement equipment includes an input section that receives a non-return-to-zero (NRZ) waveform signal from the device under test, a ramp generation section that utilizes the NRZ waveform signal to generate a ramp sweep si...
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JP2023098859A |
To automatically select a continuous-time linear equalizer (CTLE) Filter.A method comprises: capturing response waveforms for channels of a communication link of a device under test (DUT) to generate a set of CTLE candidates in 80; obtai...
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JP2023529493A |
The signal classification system includes an input for receiving input waveform data, a memory, processing for generating a ramp sweep signal from the input waveform data, and processing for locating data bursts within the input waveform...
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JP2023090555A |
To facilitate shortening of the whole processing time for AI analysis using waveform data while acquiring data indicating a feature quantity.A waveform measuring device 11 comprises a control section 110 that sets at least one channel of...
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JP2023086722A |
To use an entropy value as a performance index of a test and measurement device.A test and measurement device 10 has a port 12 for receiving a signal from a device under test (DUT), an analog-to-digital converter 18 (ADC) for digitizing ...
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JP7292826B2 |
Disclosed is a mechanism for limiting Intersymbol Interference (ISI) when measuring uncorrelated jitter in a test and measurement system. A waveform is obtained that describes a signal. Such waveform may be obtained from memory. A proces...
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JP7292015B2 |
Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave fr...
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JP7291998B2 |
This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events ...
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JP2023074863A |
To provide a data collection device for performing a highly accurate analysis in waveform measurement.A data input device 10 is a device that transfers each of multiple pieces of observation data, which are input at a predetermined trans...
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JP7272741B2 |
To provide a waveform recording device which allows for checking waveform data in a static condition and for checking details of entire waveform data including waveform data acquired while checking.A waveform recording device 10 provided...
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JP7269581B2 |
The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of r...
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JP7266376B2 |
To provide a waveform display device with which, when simultaneously displaying low- and high-speed waveform data on a display screen, it is possible to confirm the waveforms in a more easily understandable manner.A waveform display devi...
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JP7260605B2 |
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JP7259161B2 |
To provide an image processing apparatus that can display waveforms of signals of a plurality of channels on one screen even when input signals arrive from the plurality of channels.An image processing apparatus comprises: digitizing mea...
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JP2023515498A |
A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than the analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating patt...
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JP7247160B2 |
To provide a PAM waveform analysis device and a PAM waveform analysis method that can easily confirm what kind of transition have caused a sample that contributes to the deterioration of TDECQ and assist analysis of the factors that dete...
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JP2023039341A |
To keep down data traffic.A waveform measuring instrument 21 that writes digital signal data including M sample values in a storage includes: a control unit 210 that generates data including N representative values as compressed data by ...
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JP7237457B2 |
Disclosed herein are systems and methods for converting physical input signals into bitstreams using syntax trees regardless of the physical input signal's protocol. Using declarative language definitions within a protocol declaration, a...
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JP7237477B2 |
A test and measurement instrument, such as an oscilloscope, including one or more ports to receive one or more signals from a device under test, a trigger enable logic circuit configured to output a trigger enabled signal when a trigger ...
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JP2023033236A |
To obtain a waveform sample without aliases even when a sampling rate is slightly insufficient for real-time processing.Although a waveform sample taken with bandwidths up to frequencies higher than 1/2 a sampling rate of a test measurin...
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JP2023031306A |
To enable generation of a digital trigger signal from an auxiliary trigger signal, while significantly reducing the latency until the auxiliary trigger signal is output from a trigger output port.A test and measurement instrument 100 com...
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JP7235450B2 |
A waveform monitor device, or media analysis device, to monitor a video signal. The waveform monitor device may include an input to receive the video signal, the video signal having a plurality of frames, a memory to store the received v...
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JP7231992B2 |
Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt ...
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JP7229983B2 |
To provide a waveform observation device and a waveform observation method that can perform high-precision calibration in a substantially no-input state without requiring a troublesome operation, and can improve accuracy of measurement r...
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JP2023026402A |
To allow for quickly performing TDECQ measurement and determining parameters of DUT.A test and measurement system comprises a test and measurement instrument 10 and a test automation platform 30, and is configured to receive a waveform g...
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JP2023026403A |
To speed up the process of determining pass/fail using TDECQ measurement.A test and measurement instrument 10 has a machine learning network 30 and is pre-trained. The test and measurement instrument 10 receives a signal from a device un...
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JP7220834B2 |
Provided are an automatic trigger type identification method and device and an oscilloscope, which belong to the field of oscilloscopes. The method includes analyzing characteristic parameter data of a to-be-triggered signal. The charact...
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JP2023504742A |
The test and measurement instrument includes an acquisition memory and a processor configured to store a stream of sampled input data samples in the acquisition memory. When the memory becomes full, the device automatically decimates eit...
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JP7213905B2 |
To confirm a shift state of a symbol of a violation sample.Mask setting means 4b sets a mask having a size corresponding to a bit rate of a PAM signal and an amplitude of the PAM signal, with a shape almost similar to a shape of a region...
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JP2023014056A |
To efficiently evaluate a large number of waveforms obtained by sweeping parameters.A test measurement device 10 receives a waveform array containing waveform data obtained by sweeping parameters. A processor 12 generates waveform images...
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JP2023011538A |
To allow an irreversible compression of waveform data of a test measuring device.A test measuring device 10 is connected to a test target device 26 and generates waveform data. The device specifies a data format of the waveform data in r...
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