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JP5026647B2 |
The invention relates to a method and to a device for completely correcting visual defects of the human eye. The invention mentions combinations of measuring and treatment methods that allow the complete correction of defects of the huma...
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JP5016307B2 |
Methods, systems and software for determine an optical surface model for an optical tissue system using Fourier transformation algorithms. A method of reconstructing optical tissues of an eye comprises transmitting an image through the o...
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JP5015176B2 |
The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained i...
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JP5007455B2 |
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JP4994031B2 |
A method and apparatus for measuring bandwidth of light emitted from a laser which may comprise: first and second wavelength sensitive optical bandwidth detectors providing, respectively, an output representative of a first parameter ind...
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JP2012132711A |
To measure interpulse phase shift of an optical frequency comb light source with high efficiency.An interpulse phase shift measurement device includes: optical path setting means (12, 13, 14) for branching an optical pulse signal (S) to ...
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JP2012132881A |
To obtain fine interference light having high interference intensity by a compact and inexpensive configuration using a tabular BS while suppressing the influence of ghost light generated in the BS.In an interferometer, a laser beam emit...
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JP2012514749A |
The present invention relates to an optical distance meter, in which the optical distance meter projects an image of an object onto the photodetector and a photodetector that converts an image projected onto the photodetector itself into...
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JP4963231B2 |
Interferometric apparatus and methodology for precisely measuring the shape of rotationally and non-rotationally symmetric optical surfaces comprising an illumination source with two wavelengths, a transmission flat with a reference surf...
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JP4932905B2 |
This invention relates to a device and associated process capable of obtaining the optical spectrum phase of an optical signal or test signal to be analyzed using techniques for heterodyning between two monochromatic spectral components ...
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JP4929529B2 |
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JP4921644B2 |
A wavefront measuring apparatus and a wavefront measuring method are capable of performing optical measurement on a test optical system, including an immersion optical system, with comparable ease of handling to that of the conventional ...
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JP4925139B2 |
To provide a dispersion interferometer usable for actual time control, and capable of removing an influence of a high-frequency noise, reducing a measurement error caused by signal intensity change, and heightening accuracy, by extractin...
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JP4917088B2 |
A system comprising a plurality of methods for measuring surfaces or wavefronts from a test part with greatly improved accuracy, particularly the higher spatial frequencies on aspheres. These methods involve multiple measurements of a te...
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JP4912504B1 |
A measuring method includes measuring a sum of an optical path length of a test object and a first medium in a first container, introducing light into an area that includes the first medium but does not include the test object and measur...
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JP4916347B2 |
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JP4910302B2 |
A wavelength determining apparatus is disclosed. The wavelength determining apparatus includes a reflection block, a light detection block, and a determination block. The reflection block receives at least part of a laser light beam emit...
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JP2012063264A |
To provide a laser frequency change evaluation device which is inexpensively constituted and rapidly performs evaluation measurement.The wavelength of a laser beam Pr emitted from a wavelength variable laser beam source 22 is changed in ...
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JP4892118B1 |
The purpose of the present invention is to provide a light-receiving module for a light-emitting element and a detection device for the light-emitting element, that are capable of precisely calculating the amount of light emitted by the ...
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JP4884239B2 |
An analyzer according to the present invention includes: a measuring unit 19 that measures absorbances of two or more identifying samples having different concentrations and having absorbance characteristics in which there is a simple sl...
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JP4880519B2 |
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JP2012027411A |
To provide a liquid crystal lens array element that does not blur a spot of light passing therethrough.In a liquid crystal lens array element in which liquid crystal is held between a first transparent substrate provided with a lens arra...
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JP4869676B2 |
A compact monolithic quadrature detector generates four signals from an input beam including orthogonally polarized object and reference beam components provided by an interferometer. The single input beam may be split into four output b...
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JP4861281B2 |
To measure a phase difference precisely by removing an error caused by state variations in the propagation path of measurement light and an error caused by the crosstalk of measurement light, when measuring the phase difference between o...
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JP4853938B2 |
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JP4853941B2 |
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JP4842447B2 |
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JP4841691B2 |
The measurement accuracy of an apparatus for measuring the surface shape of an object utilizing a two-wavelength phase-shift interferometry is improved. A low-coherence light source, a plurality of wavelength filters with different trans...
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JP4834211B2 |
The method has the following stages, see Fig. 1 for schematic diagram: - place a two dimensional network of rectangular mesh in a plane (Pc) perpendicular to the light beam to be analyzed and optically conjugate to the analysis plane (Pc...
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JP4832310B2 |
Wavefront measuring systems and methods are disclosed which may be employed, for example, in detecting phase aberrations in a spectacle lens and in an eye. Various embodiments include disposing a modulation pattern in the path of a retur...
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JP4815345B2 |
A measuring apparatus for determining data relating to the shape of an input radiation wavefront, where the wavefront shape is describable at a pre-determined location in an optical system. The apparatus comprises aberration means (27, 3...
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JP4817423B2 |
An optical waveguide grating interrogation system 10 comprises bi-directional optical amplifying and gating means, in the form of a semiconductor optical amplifier (SOA) 14 and an optical pulse source 12, 14. Drive means 22 (an electrica...
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JP4814894B2 |
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JP4814790B2 |
An apparatus and method for controlling a laser system is disclosed which may comprise a spectrometer adapted to measure an unknown bandwidth of a spectrum of light emitted from the laser, which may comprise an optical bandwidth measurin...
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JP4805142B2 |
Apparatus for irradiating a sample, comprising an interferometer forwarding an electromagnetic radiation and a sample arm receiving the electromagnetic radiation, wherein the sample arm includes an arrangement which is configured to prod...
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JP2011215164A |
To overcome the defect of low coherence interference measurement and the serviceability and scanning speed of the light source of optical coherent tomography.A system for calculating the specific data related to at least one of the struc...
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JP4795414B2 |
The invention relates to an inspection method for inspecting a distribution of thickness of a transparent substrate, characterized in that: a first transparent substrate having a known distribution of thickness and a second transparent s...
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JP4789970B2 |
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JP4786540B2 |
Provided are a small-sized, low-cost, and easy-to-use laser optical path length difference detecting device, a laser optical path length difference detecting device, and a coherent optical coupling device. The laser optical path length d...
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JP4786924B2 |
Photonic mixer device (PMD) detector has a photosensitive layer, two or more modulation gates (3, 4) and at least two reading electrodes (1, 2) connected to the photosensitive layer. The reading electrodes each have at least two discrete...
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JP4787760B2 |
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JP2011186383A |
To provide an optical element, an illumination optical system, and a measuring device capable of obtaining a highly accurate and highly strong spherical wave.The optical element includes: a substrate 10 which allows transmission of light...
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JP4776781B2 |
The invention concerns a device for observing a body, in particular a viewer, comprising means for illuminating (12) the body (5), means for sampling (400, 450, 500, 700) light coming from an illuminated site (01) of the body and compens...
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JP2011181691A |
To measure a carrier envelope offset frequency of a mode-locked laser.The present invention relates to, as a measuring device which measures the carrier envelope offset frequency of the mode-locked laser, a pulse laser includes: the mode...
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JP4773968B2 |
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JP4773957B2 |
A bandwidth meter method and apparatus for measuring the bandwidth of a spectrum of light emitted from a laser input to the bandwidth meter is disclosed, which may comprise an optical bandwidth monitor providing a first output representa...
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JP4769490B2 |
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JP4769711B2 |
A wavefront sensor enhances calibration of a laser ablation system, such as a laser eye surgery system, by measuring one or more characteristics of an ablated test surface. Typically, light is passed through the ablated test surface, and...
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JP4758572B2 |
In a phase unwrapping method for fringe image analysis, when storing newly calculated numeric data into a storage list, the new numeric data is initially compared with numeric data of a representative rank within each rank block in the s...
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JP4758644B2 |
The present invention provides a wavemeter for an ultraviolet laser capable of long life beam quality monitoring in a pulsed ultraviolet laser system at pulse rates greater than 2000 Hz at pulse energies at 5 mJ or greater. In a preferre...
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