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JP2017181038A |
To provide a laser beam wavefront sensor having a simple structure and a wide measurement angle range.A wavefront sensor includes an angle-selective filter configured to exhibit different reflectance depending on an angle of incidence, a...
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JP6208475B2 |
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JP6202499B2 |
The present invention relates to an optical phase measuring method and an optical phase measuring device which can measure phase information contained in an object beam with high accuracy. Intensity distributions of a test object beam, a...
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JP6188726B2 |
The present invention relates to a method and a device for the simultaneous compression and characterization of ultrashort laser pulses. An embodiment of the method comprises applying predetermined spectral phases to the pulse to be char...
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JP2017146217A |
To measure uncertainty of a substantial frequency in an optical frequency comb while suppressing increase in a device cost.An optical frequency comb measurement device includes an optical frequency comb generation part 101, a branch part...
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JP6182471B2 |
In order to provide a high-sensitivity terahertz wave phase difference measurement system having a high S/N ratio, terahertz interference waves are observed using a half mirror and a movable reference mirror, and the phase difference is ...
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JP2017129500A |
To provide a phase shift amount measurement device whose structure is simple and temperature stability is excellent.Disclosed is a device for measuring the phase shift amount of a phase shift mask 15. This device includes: a diffraction ...
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JP2017111147A |
To provide semiconductor wafer inspection systems and methods that substantially optimize the amount of inspection data obtained and analyzed while substantially minimizing the time for collecting and processing the inspection data.One m...
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JP6143196B2 |
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JP6134773B2 |
In a resonator arrangement (1) including a resonator (2), an interferometer (9) is arranged inside the resonator (2) and includes at least a first and a second interferometer leg (9a, 9b). The two interferometer legs (9a, 9b) have optica...
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JP6125131B1 |
A light source system (26) which illuminates a test optical system (3) and to which it makes light flux of a plurality of wave face measurement views emit from test optical system 3, Light flux of a plurality of wave face measurement vie...
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JP6098596B2 |
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JP6095294B2 |
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JP6081520B2 |
Techniques described herein are generally related to non-interferometric phase measurements of an optical signal. The various described techniques may be applied to methods, systems, devices or combinations thereof. Some methods for dete...
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JP6079693B2 |
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JP6071202B2 |
A multi-beam combining apparatus includes a phase shifting section, a superposing section, an observing section and a phase control section. The phase shifting section generates a plurality of phase-shifted laser beams by shifting the ph...
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JP2017016103A |
To provide a phase-detection autofocus system that uses a single two-dimensional (2D) image sensor as an autofocus sensor.An adaptive autofocusing system enables a number of novel functionalities such as calibration by adaptive selection...
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JP6058108B2 |
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JP6056096B2 |
A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of po...
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JP6053263B2 |
An apparatus and source arrangement for filtering an electromagnetic radiation can be provided which may include at least one spectral separating arrangement configured to physically separate one or more components of the electromagnetic...
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JP6052672B2 |
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JP2016213510A |
To provide an apparatus and source arrangement for filtering electromagnetic radiation.An apparatus and source arrangement for filtering electromagnetic radiation includes at least one spectral separating arrangement configured to physic...
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JP6044862B1 |
[Subject] A photodetection device which can measure coherence degree Fit of light which penetrates and reflects a photographic subject is provided. [Means for Solution] Optical power detector 10 containing the 1st detector and 2nd detect...
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JP6039744B1 |
[Subject] The noise figure of an optical amplifier phase induction light amplifier is measured with high precision. [Means for Solution] Relative intensity noise (RINin) of an input light measured based on electric power produced by a no...
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JP6029179B2 |
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JP6010407B2 |
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JP6002830B1 |
[Subject] A photo acceptance unit is reduced and a cheap sensor is provided. An optical fiber ring interference pattern sensor which can compute phase contrast more correctly is provided. [Means for Solution] Optical branching coupling e...
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JP2016142963A |
To provide a combination wavelength plate that is constituted as a single component and reduces all of the temperature dependence, wavelength dependence, and incident angle dependence of the phase difference.The wavelength plate is forme...
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JP2016118539A |
To provide a phase angle measurement method for determining a phase angle offset with a phase angle of a local oscillator.A first laser signal source 210 and a light phase adjuster 230 can be achieved by a loop stretcher which is configu...
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JP5927079B2 |
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JP5914340B2 |
An Interferometer for off-axis digital holographic microscopy includes a recording plane, and a grating located in a plane optically conjugated with the recording plane. The grating defining a first and a second optical path, the optical...
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JP5889327B2 |
A demodulation sensor (30) is described for detecting and demodulating a modulated radiation field impinging on a substrate (31). The sensor comprises the means (1,7,15) for generating, in the substrate, a static majority current assiste...
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JP5884532B2 |
To provide a photodiode, a wavelength sensor and a wavelength measuring apparatus, which can improve sensitivity while reducing an optical density of incident light on the photodiode.A photodiode 10 according to a present embodiment comp...
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JP5874970B2 |
A method of monitoring a WDM optical signal is provided. The method includes: receiving a WDM optical signal having a plurality of channels; detecting the optical signal after filtering the WDM optical signal with a tunable filter; and r...
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JP5856727B2 |
The method involves performing multiplication of two phase functions such as exclusion and phase fundamental functions. The exclusion function defines meshing of useful zones (Z-U) and exclusion zones (Z-E), where the zones (Z-U) do not ...
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JP5858465B2 |
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JP5850415B2 |
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JP5852300B2 |
Provided are a photodetector device and a photodetection method as well as a microscope and an endoscope allowing the heterodyne detection of a desired light to be detected with high sensitivity and at a high SN ratio. A photodetector de...
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JP5836739B2 |
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JP2015224953A |
To provide a spectrum measurement device and a measuring method thereof that enable a spectral line width to be measured with good reproducibility without requiring particular adjustment even if fluctuations occur in a polarization plane...
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JP2015224952A |
To provide a spectrum measurement device and a measuring method thereof that enable a spectral line width to be measured with good reproducibility without requiring particular adjustment even if fluctuations occur in a polarization plane...
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JP5827140B2 |
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JP5818643B2 |
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JP5803456B2 |
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JP5795658B2 |
An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency ...
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JP5765465B2 |
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JP5756253B2 |
A surgical microscopy system has an optical coherence tomography, OCT, facility, the system comprising microscopy optics for generating an image of a first object region, the microscopy optics comprising an objective lens; an OCT system ...
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JP5755966B2 |
An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency ...
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JP5739601B2 |
A method includes directing a portion of a laser beam output from a laser along a secondary beam path toward a detector, the secondary beam path being distinct from a main beam path of the laser beam; generating a bandwidth selective int...
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JP2015108580A |
To provide an interference type optical fiber sensor capable of relatively reducing a noise, while increasing the number of signals used after photoelectric conversion.The interference type optical fiber sensor includes a light source 12...
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