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JP6722867B2 |
To measure information on a target quantitatively without a complicated operation.A light detection device includes: a light detector including a first light reception element and a second light reception element; a substrate disposed on...
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JP6701202B2 |
Coherent spectroscopic methods are described, to measure the total phase difference during an extended interrogation interval between the signal delivered by a local oscillator (10) and that given by a quantum system (QS). According to o...
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JP2020513102A |
A system that stabilizes the scale factor associated with an optical rotation sensor includes an optical rotation sensor that generates an optical signal in response to the rotation of the optical rotation sensor. The sensor detection sy...
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JP6646830B2 |
A light detection device includes a light detector including first detectors and second detectors both disposed along a main surface; a light coupling layer disposed on or above the light detector; and a light shielding film disposed on ...
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JP2020012782A |
To provide a wavefront measurement device capable of measuring a transmission wavefront at a plurality of view angles of an optical system with a small-sized and simple configuration.A wavefront measurement device (1) includes: a divisio...
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JP6631978B2 |
The device has a radiation source (1) i.e. laser, for producing an output beam (2). A beam splitter device splits the beam into a measuring beam (3) and reference beams (4b, 4c). An optical overlay device and a detector are arranged in a...
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JPWO2018117149A1 |
The purpose is to measure the characteristics of variable wavelength light with a change in wavelength. The first local oscillation light source 100a outputs the first local oscillation light 2000. The second local oscillation light sour...
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JP2019200080A |
To provide a method that suppresses increase of a computer memory in performing Fourier series expansion of an intensity transport equation to calculate a phase of propagation light.A phase calculation apparatus changes a propagation dis...
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JP6600360B2 |
A method for determining the complex amplitude of the electromagnetic field associated with a scene, comprising a) capturing a plurality of images of the scene by means of a photographic camera, the images being focused in planes of focu...
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JP6585093B2 |
A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and secon...
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JP6585092B2 |
A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and secon...
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JP6570991B2 |
Systems and methods which combine standard image reconstruction and beam-control techniques with tomographic estimation of three-dimensional atmospheric turbulence to enable high-quality anisoplanatic imaging of distant objects at long r...
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JP2019113510A |
To provide a measuring device capable of measuring a complex electric field amplitude waveform of a light signal.A measuring device 1 comprises a local light beam output device 11, a light circuit 12, a first conversion unit 13, a second...
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JP6531318B2 |
To provide an evaluation device with which it is possible to generate reference light from object light irrespective of the phase distribution of the object light and accurately evaluate an optical member.The evaluation device for evalua...
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JP6524357B1 |
A microlens array (3) in which the arrangement directions of the plurality of microlenses are inclined with respect to the scanning direction (11A) is moved in a direction crossing the luminous flux (2A) toward the image sensor (4) and s...
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JP6522414B2 |
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JP6511919B2 |
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JP6513811B2 |
A wavefront analyzer is modified to simply determine the differences in amplitude and tilt which can exist between the different regions of an initial wavefront (S0). To achieve this, interference between two waves only is produced from ...
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JP6509456B1 |
From the position of each focused spot image detected by the wave surface estimator (41) by the first photodetector (16), the second photodetector (26), and the third photodetector (36). , Calculate the approximate value of the wave surf...
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JP6494885B1 |
The wave surface estimation unit (28) calculates an approximate value of the wave surface of the luminous flux at the aperture of the imaging optical system (11) from the positions of the plurality of focused spot images detected by the ...
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JP2019039972A |
To generate a signal such as a microwave and a millimeter wave, having phase noise suppressed, in a frequency-variable state without requiring a stable optical frequency comb reference light source specially.A self-reference interferomet...
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JP6483973B2 |
A first reflection member 10, when light transmitted through a second reflection member 20 is incident, reflects a part of the light by a first reflection surface 11, reflects light transmitted through the first reflection surface 11 in ...
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JP2019028270A |
To provide an image forming apparatus that can inhibit an increase in film thickness measurement error due to superimposition of an interference waveform on the surface of an outermost surface layer of an image carrier and an interferenc...
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JP6460364B2 |
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JP6451695B2 |
A defect detection apparatus is provided that can inspect a measurement region of a target object at one time and without inconsistencies arising within the measurement region. A defect detection apparatus 10 includes: a generation unit ...
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JP6448497B2 |
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JP6445814B2 |
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JP2018537678A |
The present invention is a method for measuring the delay between N pulses (1) with a pulse width of less than 100 picoseconds-pulses with the same repetition frequency (1).k), And-a reference pulse (2) with the same repetition frequency...
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JP2018189529A |
To realize a transmittance measurement method capable of stably measuring a transmittance of an opaque resin film having three-degrees of an overdose.A transmittance measurement method forms a horizontally shifted interference image on a...
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JP2018180296A |
To construct a phase retrieval image using microscopic images different in focal plane with simpler configuration than before.A microscope system mounted on a microscope and provided with a camera for a microscope capturing an observatio...
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JP2018530932A |
Systems and methods for controlling the optical heterodyne measurement system (1) are disclosed. The measurement system (1) has a variable wavelength laser (9) for generating a local oscillator signal, an optical input unit (5) for recei...
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JP6395582B2 |
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JP2018132308A |
To provide means to measure a wavelength component of light released from a specific light emitter even in a state where a large number of light emitters are smaller than and arranged in an observation visual field of a spectrometer.A sp...
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JP6379031B2 |
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JP6370633B2 |
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JP2018105875A |
To provide a full field reflection phase microscope for measuring a surface shape at a high-speed frame rate.The invention can combine low-coherence interferometry and off-axis digital holographic microscopy (DHM). The DHM using reflecti...
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JP6353891B2 |
Systems and methods of characterizing wafer shape using coherent gradient sensing (CGS) interferometry are disclosed. The method includes measuring at least 3×106 data points on a wafer surface using a CGS system to obtain a topography ...
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JP2018100934A |
To provide a compact sensor device that can accurately measure the amount of a detection object contained in a material to be measured.A sensor device comprises: a substrate including a rectangular plate-like base 20 that has a concave p...
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JP2018096717A |
To acquire information relevant to the coherence of an incident light without performing complicated operation.An imaging apparatus in some embodiment of the present invention comprises an imaging device, an optical system, an actuator a...
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JP2018096939A |
To provide a technique of measuring a line width easily and accurately.An input unit 20 inputs a first light, a second light, and a third light having different frequencies. A generation unit 22 generates a beat signal including a beat c...
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JP6322952B2 |
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JP6298654B2 |
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JP2018021891A |
To efficiently acquire the phase distribution of light which is useful when evaluating an optical system including a case where defects such as a shape error of a refractive or reflection surface of each individual image-formation optica...
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JP6254543B2 |
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JP6230029B2 |
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JP6226977B2 |
An adaptive optics system includes a spatial light modulator configured to spatially modulate a phase of an optical image incident on a modulation surface and a wavefront sensor including a lens array having a plurality of two-dimensiona...
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JP6226431B2 |
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JP6225112B2 |
A method of determining a reference calibration setting for an adaptive optics system (1) comprising a detecting device (8) for detecting light from an object (5); and at least one controllable wavefront modifying device (9) arranged suc...
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JP2017194437A |
To provide a telemetry device in which a measuring device head thereof has a compact and simple structure and which, even if an object is put in a place where large spatial restrictions exist, enables irregularities on a surface of the o...
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JP6220316B2 |
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