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WO/2022/076921A1 |
An apparatus for positioning and retaining a current transformer, such as a Rogowski coil, about a conductor includes at least two members, a coupling mechanism, and a non- conductive securing structure. Each member of the apparatus incl...
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WO/2022/074888A1 |
The present invention addresses the problem of providing a contact probe, the tip part of which can reliably contact an inspection point on a body to be measured, and which can be configured so as not to cut or damage the inspection poin...
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WO/2022/073375A1 |
The present invention belongs to the technical field of probe cards, and particularly relates to an amplitude modulation probe card, and a probe and an amplitude modulation structure thereof. The probe card comprises a probe, a probe boa...
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WO/2022/075508A1 |
Disclosed is a probe pin for probing a solder ball, the probe pin comprising: a pipe-type housing; a lower plunger movably installed at the lower part of the housing; an upper plunger which is installed at the upper part of the housing t...
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WO/2022/075507A1 |
Disclosed is a probe pin for probing a solder ball, the pin comprising: a pipe-shaped housing; a lower plunger movably provided at the lower portion of the housing; an upper plunger which can move in and out on the outside at the upper p...
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WO/2022/076333A1 |
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus to facilitate movement of a wafer pack holding a vacuum without human oversight. These functionalities include a latch system to ...
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WO/2022/076354A1 |
A compliant ground block for a testing system for testing integrated circuit devices is disclosed. The compliant ground block includes a plurality of electrically conductive blades in a side by side generally parallel relationship. The b...
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WO/2022/072858A1 |
A contactor assembly for a testing system is disclosed. The assembly includes a contact having a contact tail and a housing having a top surface and a bottom surface. A slot extends through the housing from the top surface to the bottom ...
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WO/2022/067872A1 |
An alternative-energy automobile battery fault detection system, comprising a base (1), a platform (2), an upright support plate (3), a vertical connection assembly, position adjustment assemblies, and a visual inspection assembly (10). ...
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WO/2022/069191A1 |
The invention relates to a connection element for a field probe combination, to a field probe combination having such a connection element, to a corresponding connection element, to a plug-socket system, to a production method for the co...
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WO/2022/058534A1 |
The invention relates to an electrical voltage source (1) comprising - an integrated circuit (2) comprising two input terminals configured to receive an electrical control signal, two output terminals configured to deliver an output volt...
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WO/2022/059865A1 |
The present invention relates to a semiconductor test socket in which pins are arranged in four rows. A semiconductor test socket of the present invention comprises: a core; a bottom plate coupled to the core; a body plate which is coupl...
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WO/2022/058590A1 |
The present disclosure relates to a probe for sensing magnetic and electric fields comprising: first and second sensing elements (102, 104), each comprising first and second terminals (106, 108), the sensing elements being orientated in ...
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WO/2022/059070A1 |
[Problem] The purpose of the present invention is to provide a probe card in which a probe inserted into a guide hole in a guide plate catches on the guide plate so as not to fall out and can be disposed at a narrower pitch. [Solution] T...
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WO/2022/052314A1 |
An immersion type battery cell charging and discharging test device, comprising a flange plate (1), an insulating bottom plate (2), a transparent plate (3), a plurality of battery cell support seats (4), a plurality of charging and disch...
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WO/2022/054802A1 |
[Problem] To provide a contact terminal, an inspection jig, an inspection device, and a manufacturing method for easily reducing the likelihood of a conductor falling out of a tubular body. [Solution] A contact terminal Pr comprises a tu...
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WO/2022/050453A1 |
Provided is a cartridge aligner apparatus for a multi prober. The present invention comprises: a main body chamber having a working space for combining a probe card, a wafer, and an individual chuck into a cartridge or disassembling the ...
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WO/2022/049455A1 |
The purpose of the present invention is to provide a secondary battery control circuit having a novel configuration. This secondary battery control circuit comprises a first transistor, a first voltage generation circuit that generates a...
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WO/2022/048286A1 |
A test fixture adapter board and a memory test device, the test fixture adapter board comprising a circuit board, and a first connection part, second connection part, plurality of capacitors and capacitor switching circuit that are provi...
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WO/2022/048039A1 |
A computer chip encapsulation test device, comprising a panel (1), supporting legs (2), a connecting rod (3), a left fixing frame plate (4), a right fixing frame plate (5), a screw rod (6), a servo motor (7), a nut (8), a guide sliding b...
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WO/2022/045620A1 |
The present invention relates to a contactor management method and a battery system proving same. The battery system of the present invention comprises: a contactor connected between a battery pack and an external device; a voltage measu...
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WO/2021/211666A9 |
A test apparatus for testing device under test (DUT) having an antenna located on the DUT is disclosed. The test apparatus includes: a housing, a socket configured to electrically connect the DUT to a load board, a gripper assembly confi...
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WO/2022/045542A1 |
An embodiment of the present invention provides an inspection socket for electrically connecting a terminal of a device to be inspected and a pad of a test apparatus to each other, the inspection socket comprising: a first conductive she...
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WO/2022/038349A1 |
A differential impedance to voltage converter (600) is described herein. Some examples describe a differential impedance to voltage converter circuit having multiple feedbacks (602, 604) and cross-coupled connections (606, 608). Some exa...
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WO/2022/039439A1 |
The present invention relates to: an anodic oxidation film mold that can be used to manufacture a molded article of which at least a portion has dimensions in the range of several tens of μm; and a mold structure comprising same. The pr...
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WO/2022/033618A1 |
The invention relates to a contacting module and a method for assembling a contacting module with an optical module (1), containing an optical block (1.1) made of glass, and with an electronics module (2), the optical block (1.2) being c...
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WO/2022/034167A1 |
The aim of the invention is to provide a continuity check of a cable (1) comprising a conductor (3) and a plug connection (2) located at a first cable end (11) and having a plug recess (21) and a plug contact (22) located in the plug rec...
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WO/2022/032406A1 |
An electronic test jig, comprising a jig main body (1). A bottom plate (2) is arranged on the outer surface of the upper end of the jig main body (1); a side plate (3) is arranged on one side of the bottom plate (2); a supporting plate (...
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WO/2022/033617A1 |
The invention relates to a contacting module and to a method for assembling a contacting module. The contacting module comprises: - an optical module (1), which contains an optical block (1.1) made of glass, which optical block has an ar...
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WO/2022/033300A1 |
An MEMS probe card, which belongs to the technical field of IC manufacturing operations. In particular related to are micro-electromechanical system manufacturing, semiconductor bare core testing and related key techniques. The probe car...
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WO/2022/031219A1 |
An integral electrical contact pin for electrically connecting a test terminal of tester load board with an IC terminal of an IC device, adapted for short test height. The integral electrical contact pin comprises an upper cantilever arm...
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WO/2022/027768A1 |
A rotor magnetizing and surface magnetism measurement device, comprising a rack (10); a sliding rail (12) is horizontally provided on the rack (10), at least one workpiece base (22) is movably provided on the sliding rail (12) along the ...
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WO/2022/029126A1 |
It is herein described a contact probe (20) having a first end portion (20A) adapted to abut onto a contact pad of a device under test and a second end portion (20B) adapted to abut onto a contact pad of a PCB board of a testing apparatu...
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WO/2022/021838A1 |
An intelligent plate test system, comprising a plate socket (110), which may be mounted in a plugging manner with a plate to be tested, a plate working circuit (120), which may be electrically connected to the plate socket (110), an arra...
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WO/2022/025128A1 |
This circuit board comprises an insulation board that includes a wiring conductor, and a first resin board that is formed from a resin of a material differing from the insulation board, and that is layered on the insulation board. Moreov...
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WO/2022/024888A1 |
The probe guide (30) according to the present disclosure guides a probe pin (20), the probe guide (30) comprising a base (31) that is formed from a ceramic and that has a plurality of through-holes (32) in which the probe pin (20) is ins...
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WO/2022/021837A1 |
An intelligent test system and method for a memory panel. The test system comprises: a power supply unit (121); a reference signal output unit (122); an output detection unit (123); a panel socket (110); first, second, third and fourth a...
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WO/2022/021839A1 |
An intelligent panel testing system having a checking function, comprising: a panel socket (110) mounted with a panel to be tested in a pluggable manner, a panel working circuit (120) electrically connected to the panel socket (110), an ...
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WO/2022/019814A1 |
A testing system and method for testing a Printed Circuit Boards (PCBs) is provided. The method is being executed at a testing system which comprises a RF test analyzer; a RF energy source; and one or more RF probes. The method includes ...
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WO/2022/017812A1 |
A contact probe for a probe head for a testing apparatus of electronic devices comprises a body portion (30C) extended along a longitudinal development axis (HH) between respective end portions configured to realize a contact with suitab...
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WO/2022/014435A1 |
A center plunger is electrically connected to a center conductive wire and extends in the vertical direction. An outer plunger is electrically connected to an outer conductor, and when viewed in the vertical direction, surrounds the peri...
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WO/2022/015075A1 |
The present invention relates to a connecting device for testing, comprising: a housing having an air circulation hole; and a conductive rubber connector including a first conductive rubber sheet having a first through hole, a second con...
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WO/2022/014285A1 |
Provided is a conductor connecting structure for accurately measuring an electrical property of an object being measured. A conductor connecting structure 8 of a probe 1 which extends from a base end side A to a tip end side B, to which ...
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WO/2022/012791A1 |
The invention relates to a current measuring apparatus for redundantly measuring an electric current (I), having a low-impedance current measuring resistor (1) for measuring the current using a four-wire technique and having a magnetic f...
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WO/2022/012815A1 |
The invention relates to a method for testing printed circuit boards (20) in a testing device, comprising a support device for the printed circuit board (20) and comprising testing modules for measuring physical variables of components (...
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WO/2022/008436A1 |
The present invention relates primarily to a method of fabrication of one or more free-standing micromachined parts. The method includes performing reactive ion etching of photoresist and tungsten-based layers supported on a carrier subs...
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WO/2022/010246A1 |
The present invention relates to a vertical probe pin and a probe card. The vertical probe pin of the present invention comprises: an elastic beam part which is disposed between a lower contact portion in contact with a device to be test...
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WO/2022/007399A1 |
The present invention relates to a dynamometer platform for an electric motor of a new energy vehicle, the dynamometer platform comprising a platform frame, a clamping bolt and a connecting end plate, wherein a sliding slot rod is provid...
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WO/2022/000701A1 |
Disclosed is a testing fixture (100) of a dielectric waveguide filter, the testing fixture comprising a tool base (10) and a grounding member (20) installed on the tool base (10). A positioning hole (21) is provided in the grounding memb...
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WO/2022/000591A1 |
A test tool for a dielectric waveguide filter (5), comprising a test tool base (1), wherein the test tool base (1) comprises a first surface (11) and a second surface (12) arranged opposite to the first surface (11); the first surface (1...
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