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WO/2022/005085A1 |
Disclosed is a test socket supporting a probe. The test socket includes a socket block of an insulating material, provided with a probe hole to accommodate the probe, and a coating portion comprising an external film of a conductive mate...
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WO/2022/001007A1 |
A chip test module (100), comprising: a mounting base (10), used for mounting a chip to be tested; and an inner carrier plate assembly, assembled together with the mounting base (10). The inner carrier plate assembly comprises an inner c...
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WO/2022/002196A1 |
A probe card for a high-temperature high-voltage test of a power device, relating to the technical field of semiconductor device tests. The probe card is sequentially provided with an air inlet system (1), a PCB (2), a transfer layer (3)...
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WO/2022/000580A1 |
A haptic feedback testing device (100), which comprises a fixing frame (1), a touch panel (3), and a flexible support element (2). The touch panel (3) and the fixing frame (1) are provided at an interval to each other. The touch panel (3...
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WO/2022/001142A1 |
Disclosed are a connecting structure of an FCT fixture, and an FCT fixture. The connecting structure of an FCT fixture comprises: a fixing portion (1) configured to be connected to a wire (3), and a connecting portion (2) configured to b...
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WO/2021/261287A1 |
A first plunger (110) is provided with a first tip contactor (112), a first columnar section (114), and a first receiving section (116). The first tip contactor (112) is formed by embedding a first conducting material in a recess (602A) ...
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WO/2021/261288A1 |
This inspection device (10) comprises a plurality of first plungers (110), and a connection part that electrically interconnects at least some first plungers (110) among the plurality of first plungers (110). The inspection device (10) f...
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WO/2021/261193A1 |
This current measurement component comprises: a bridging part that bridges a pair of side surface parts; a pair of coaxial components attached respectively to the pair of side surface parts, each coaxial component having an internal cond...
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WO/2021/258488A1 |
A leakage current measurement apparatus (10), measurement system and method for a high-voltage direct-current cable. The apparatus comprises a current measurement module (11) and a loop protection module (12), wherein a first end (12a) o...
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WO/2021/259664A2 |
The invention relates to a resistance measuring element (20) formed with an elongated metal material, wherein high-current connections (21, 22) are formed in the region of its ends, and which is provided on one side that is to be connect...
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WO/2021/261285A1 |
This inspection device (10) comprises a first elastomer (100) and a first plunger (110). The first elastomer (110) defines a hole (102). The first plunger (110) overlaps the first elastomer (110). A conductive film (104) is formed on the...
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WO/2021/256133A1 |
A probe card (10) is provided with a flexible substrate (114) and a rigid substrate (120). The flexible substrate (114) makes contact with an object to be inspected. The rigid substrate (120) is electrically connected to the flexible sub...
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WO/2021/252899A1 |
Vertical transmission line probes having alternating capacitive and inductive sections are provided. These alternating sections can be designed to provide a desired transmission line impedance (e.g., between 10 and 100 Ohms, preferably 5...
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WO/2021/248487A1 |
A smart power grid signal device with a rainproof function, the device comprising a case (2), with the upper surface of the case (2) being fixedly connected to a rainproof device (1), and the rainproof device (1) comprising an air source...
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WO/2021/251653A1 |
A relay diagnosis device according to the present invention comprises: a diagnosis unit which is for a parallel pack assembly comprising a first battery pack having a first battery module and a first positive relay and a second battery p...
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WO/2021/250598A1 |
The present invention relates to a contact probe (10) for electronic tests comprising: • - An upper part (12) having an end portion (12') whose end is intended to contact a first electronic component; • - A lower part (13) having an ...
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WO/2021/248677A1 |
The present invention relates to the technical field of unmanned applications. Specifically disclosed is a fixing device for test for unmanned assembly parts of agricultural machinery or engineering machinery, comprising a fixing table, ...
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WO/2021/245289A1 |
According to the invention, a measuring probe (100) for measuring variables characteristic for a plasma is provided, the measuring probe having a probe body (110) with a probe head (120), the probe body extending along a longitudinal axi...
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WO/2021/246719A1 |
Disclosed is a test socket. The test socket includes a first block comprising a first base member of a conductive material and a first insulating member of an insulating material, a second block comprising a second base member of a condu...
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WO/2021/239423A1 |
The invention relates to a device (8) for measuring a magnetic field of a conductor (1) of an electric current, the measurement of the magnetic field being carried out without using a flow concentrator. The device (8) has at least three ...
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WO/2021/241784A1 |
A probe pin having an improved gripping structure is disclosed. The disclosed probe pin comprises: a pin body, which includes a plurality of holes and is located at one side; a first extension part extending in the upper side direction f...
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WO/2021/237951A1 |
The present invention provides a magnetic field interference testing mechanism in the technical field of electronic device testing. The magnetic field interference testing mechanism comprises a testing platform, an adjusting base capable...
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WO/2021/240431A1 |
Safety system (3) for needle probe cards (2) for test machines (1) for high-voltage and high- current testing of power semiconductor electronic devices, e.g., IGBTs, MOSFETs and/or FRDs; the needle probe card (2) comprising a plurality o...
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WO/2021/239426A1 |
The invention relates to a device (8) for measuring a magnetic field of a conductor (1) of an electric current, wherein the measurement of the magnetic field is carried out without using a flux concentrator. The device comprises at least...
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WO/2021/240003A1 |
The present disclosure relates to an electronic device (10) comprising at least one electrically conductive structure (11) with a tubular shape having outer and inner surfaces (11c, 11d) covered by an insulating layer (12), and one or mo...
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WO/2021/241232A1 |
Provided is a probe that accurately inspects the characteristics of a connector. The probe 1 comprises: a housing 40 in which a signal line 70 is inserted; a plunger 20 having a measurement end 72 for inspecting the characteristics of a ...
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WO/2021/241825A1 |
Disclosed are a monitoring method and apparatus for a solar cell module. The monitoring apparatus may comprise: a power supply unit which can provide different levels of voltages; a sensing unit which collects sensing data from a solar c...
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WO/2021/235483A1 |
The purpose of the present invention is to provide a vertical contact-type probe, a probe card, and a socket that have excellent durability for the inspection of a DUT, i.e., a semiconductor IC or a packaged semiconductor, having a small...
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WO/2021/235842A1 |
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a coupling block by joining an insulating member of a...
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WO/2021/235844A1 |
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base me...
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WO/2021/235843A1 |
The disclosure relates to a method of fabricating a test socket including forming a plate-shaped first coupling block by joining a first base member made of a conductive material and a first insulating member made of an insulating materi...
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WO/2021/235082A1 |
This probe for characteristic inspection of a connector comprises: a flange having a through hole; a housing that forms an accommodation space passing through the housing in the axial direction and has one end attached to the lower surfa...
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WO/2021/235704A1 |
A pogo pin according to the present invention has a spring (60), embedded therein, for elastically supporting a probe (50), and has an outer barrel (70) for guiding the sliding of the probe (50), wherein the probe (50) comprises: a small...
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WO/2021/228841A1 |
The invention relates to a test system (10) for testing an electric device (30), in particular a high-voltage device, having a portable main device (100) with a housing (140), an electric connection assembly (120, 121), and a mechanical ...
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WO/2021/231297A1 |
A thermally conductive material, device, and method for predictably maintaining the temperature state and condition of the contact elements and support hardware of a tester interface, such as a probe card, for a testing apparatus, such a...
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WO/2021/228388A1 |
The present invention proposes an interface (100) to be used in medium voltage circuit breaker testing, arranged to provide electrical communication between such breaker (50) and a respective testing device (40); comprising the following...
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WO/2021/229714A1 |
This electronic device inspection device (10) comprises: an inspection table (3) for positioning and holding an electrode disposed on a semiconductor device (90); a contact (2) that is formed from a shape memory alloy in an elongated thi...
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WO/2021/226095A1 |
A method for performing real-time magnetic resonance (MR) imaging on a subject is disclosed. A prep pulse sequence is applied to the subject to obtain a high-quality special subspace, and a direct linear mapping from k-space training dat...
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WO/2021/219263A1 |
The invention relates to a current-sensing resistor (1) for measuring an electrical current (I), comprising two connection parts (2, 3), a resistor element (4), a pair of voltage-sensing contacts (8-19) for measuring a voltage drop acros...
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WO/2021/221182A1 |
The present invention relates to a current sensor assembly comprising: a housing; a plurality of shields which are accommodated inside the housing and open toward the top of the housing; a plurality of bus bars to which three-phase curre...
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WO/2021/220105A1 |
Device for testing a printed circuit board, the device comprising a contact plate and a plurality of contact pins which are provided to extend with their distal end through the contact plate, wherein each contact pin is spring-mounted wi...
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WO/2021/222338A1 |
An illustrative parametric testing system includes a motherboard disposable over a wafer prober chuck. First electrical connectors are disposed on and electrically connected to the motherboard. At least one parametric testing cards is di...
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WO/2021/220080A1 |
Systems and methods for eliminating or mitigating T-effects on Hall sensors. A system may comprise a magnet-coil arrangement for providing a relative movement therebetween to obtain a relative position, a Hall sensor for sensing the rela...
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WO/2021/218134A1 |
A multi-channel resistance difference balancing and energy-gathering fast-curing all-in-one machine, comprising: a workbench (1), a positive electrode probe positioning plate (31), a propping screw fixing plate (15), a limiting pressing ...
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WO/2021/215790A1 |
Proposed are a probe head and a probe card having the same. The probe head according to the present disclosure includes a plurality of guide plates each having a guide hole, wherein each of the guide plates has a shape in which a plurali...
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WO/2021/213698A1 |
The invention relates to a current sensor unit (10), comprising - an at least partially flat electrical conductor (12), a magnetic field sensor (14) measuring a first magnetic field component and a U-shaped shield (16) with two side wall...
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WO/2021/215786A1 |
Proposed is a probe card. The probe card according to the present disclosure includes: a circuit board; a probe head having a guide plate, and through which a plurality of probes pass; and a connection member electrically connecting the ...
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WO/2021/215334A1 |
An inspection connector according to the present invention comprises: a first center conductor; a first barrel surrounding the periphery of the first center conductor; a second center conductor; a second barrel surrounding the periphery ...
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WO/2020/244107A9 |
Disclosed is a cathode protection test probe, comprising an outer cavity, a polarized test piece, an inner cavity, an alternating-current test piece, a copper electrode and a test cable, wherein the polarized test piece is of a hollow cy...
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WO/2021/208154A1 |
An AC voltage detection circuit and a power electronic device. The AC voltage detection circuit is used to implement voltage detection on N AC input signal lines, wherein N is an integer greater than or equal to 2. The AC voltage detecti...
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