| Document |
Document Title |
|
WO/2023/069240A1 |
Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probes. The probes include the retroreflector, which is defined by a retroreflector body. The retroreflector body includes a first si...
|
|
WO/2023/069299A1 |
The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). ...
|
|
WO/2023/065067A1 |
The present disclosure provides a sampling assembly, a manufacturing method therefor, a battery and an electrical device. The sampling assembly is used in the battery. The battery comprises at least two battery bodies arranged along a fi...
|
|
WO/2023/068708A1 |
The present invention relates to a test socket which can provide heat required to perform a burn-in test without separate additional equipment, the test socket comprising: a connection part (120); a frame (110) which supports the connect...
|
|
WO/2023/061982A1 |
A test device (1) for singulated chips (4) having a test head (17) fitted with (test) needles (3) has contacts (10) which are arranged next to the test head (17). An arrangement for testing singulated chips (4) comprises a test device (1...
|
|
WO/2023/060832A1 |
A device for measuring a demating value of a connector, the device comprising a first housing (100), a distance sensor (300) and a data transmission device, wherein the first housing (100) is arranged on the periphery of a joint of a con...
|
|
WO/2023/059084A1 |
The present invention provides an electrically conductive contact pin and an inspection device having same, the contact pin applying frictional force to the sidewall of a guide hole so as to not to be dropped from a guide plate due to th...
|
|
WO/2023/059014A1 |
The present invention provides an electrically conductive pin equipped with a moving tip portion of which at least a portion is inserted into a space part so as to be movable, wherein a head portion of the moving tip portion slides to a ...
|
|
WO/2023/059013A1 |
The present invention provides: an electrically conductive contact pin which includes, at an end thereof, an elastic portion having an inner space passing therethrough in the thickness direction and is elastically deformed in the lateral...
|
|
WO/2023/059078A1 |
The present invention provides an electro-conductive contact pin and an inspection apparatus comprising same, the electro-conductive contact pin being inserted in a hole of a support plate and installed in the support plate and comprisin...
|
|
WO/2023/059130A1 |
The present invention provides an electrically conductive contact pin array in which the respective metal contents of a first electrically conductive contact pin, which provides external power or ground connection to a test object, and a...
|
|
WO/2023/055688A1 |
A probe assembly includes a stepped insulator and a printed circuit board. The insulator is configured to surround a current carrying conductor. The printed circuit board includes a main portion and an outward protruding portion. The out...
|
|
WO/2023/050082A1 |
Provided in the present application are a battery sampling chip and a battery management system. The battery sampling chip comprises: a selector module, which comprises a first data selector and a second data selector, wherein both the f...
|
|
WO/2023/052482A1 |
The present invention relates to an active probe (1) for measuring a voltage across the terminals of a high-value impedance, said probe comprising: – an impedance-matching circuit (10) configured, on the one hand, to have an input impe...
|
|
WO/2023/047618A1 |
In the present invention, a cylindrical member has a cylindrical shape having a center axis that extends in the vertical direction. A signal terminal holding member is positioned inside the cylindrical member at the lower part of the cyl...
|
|
WO/2023/049433A1 |
A contact probe includes a shell having a first end and an opposed second end. The shell defines an interior chamber therein and a longitudinal axis extending through the first end and the second end. The contact probe further includes a...
|
|
WO/2023/049432A1 |
A test socket for coupling an integrated circuit (IC) chip to a printed circuit board (PCB) is provided. The test socket includes a conductive body having a first surface configured to face the PCB and a second surface configured to face...
|
|
WO/2023/049435A1 |
A test socket for a semiconductor integrated circuit (IC) is provided. The test socket includes a socket body configured to engage the semiconductor IC and a load board and an elastomer retainer including a top surface adjacent to the so...
|
|
WO/2023/045349A1 |
Disclosed in the present invention is a multi-station rotary microprobe full-automatic edge curling machine, wherein a plurality of clamping tools are provided on a rotating table to form a feeding station, an edge curling station, and a...
|
|
WO/2023/047962A1 |
The present invention provides a contact unit provided with a flexible substrate, and a block for pressing at least a part of the flexible substrate toward an object being inspected, wherein at least a part of the block has electrical co...
|
|
WO/2023/039804A1 |
A signal connection method, a signal connection apparatus (201), and a test system (200). The method may comprise: configuring a first mapping relationship by means of a signal connection apparatus (201) (S301), wherein the first mapping...
|
|
WO/2023/042929A1 |
The present invention relates to a test socket used for measuring the electrical characteristics of an electrical element. The present invention provides a test socket for preventing signal loss, the test socket being arranged between te...
|
|
WO/2023/043020A1 |
The present invention relates to a test circuit that receives a test command from an automatic test equipment (ATE) and tests a DUT, wherein the test circuit comprises: a plurality of analog test circuits electrically connected to the DU...
|
|
WO/2023/037345A1 |
Assembly for testing device for printed circuit boards. The invention relates to an assembly (2) for a testing device for printed circuit boards, comprising a sleeve assembly (4) configured to at least partially movably surround a pin (3...
|
|
WO/2023/033452A1 |
The present invention provides a cantilever probe pin that can effectively test the electrical characteristics of a test object.
|
|
WO/2023/032625A1 |
Provided are a probe and inspection socket that make it possible for the probe to be brought into direct contact with a housing without a high degree of manufacturing dimension precision being required. This probe for grounding is insert...
|
|
WO/2023/033382A1 |
Proposed are an electro-conductive contact pin capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressu...
|
|
WO/2023/033442A1 |
The present invention provides a method for manufacturing a molded metal product, the method enabling manufacture of a plurality of molded metal products all at once in different layer levels of a single mold.
|
|
WO/2023/030750A1 |
The invention relates to a current measuring resistor (1) for measuring an electric current, said resistor comprising: a first connection part (2) for conducting the current to be measured into the current measuring resistor (1); a secon...
|
|
WO/2023/033372A1 |
Proposed is a vertical probe card capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressure applied to...
|
|
WO/2023/033433A1 |
Proposed are an electro-conductive contact pin capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressu...
|
|
WO/2023/033417A1 |
Proposed are an electro-conductive contact pin capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressu...
|
|
WO/2023/029560A1 |
The present application provides a cylindrical battery test tool. The cylindrical battery test tool comprises a support table, a fixed base, a mobile base, several supports, and several test connection units. The fixed base is fixed to t...
|
|
WO/2023/027396A1 |
The present invention relates to a signal transmission connector which is connected to a to-be-inspected device and a test board of a tester and used to transmit electrical signals, wherein the device and the tester have different pitche...
|
|
WO/2023/027395A1 |
The objective of the present invention is to provide a semiconductor package test device for testing a semiconductor package by means of connecting a semiconductor package and a test board. The test device according to the present invent...
|
|
WO/2023/027789A1 |
A testing apparatus for Data Storage Devices (DSDs) includes a chassis and at least one interface module configured to be removably inserted into the chassis and house a plurality of interface boards. Each interface board includes a DSD ...
|
|
WO/2023/020101A1 |
A chip test fixture (1000) and a chip test fixture combination, the chip test fixture (1000) comprising: an EVB board (100), the center of which is provided with a groove (110); a group of test interfaces (200), which are arranged on the...
|
|
WO/2023/020100A1 |
A chip test system (3000), comprising: a signal source (3100); a first bias tee (3200), one end of which is connected to the signal source (3100); a source tuner (3300), an input end of which is connected to the other end of the first bi...
|
|
WO/2023/015721A1 |
Disclosed are an anti-electromagnetic interference wave recorder and an anti-interference housing manufacturing method, pertaining to the field of wave recorders. A wave recorder comprises: an anti-interference housing, a wave recording ...
|
|
WO/2023/015334A1 |
Provided is a drone geophone installation arrangement (10) comprising a drone (8) configured to transport a geophone (12), and an anchor arrangement (14) configured to selectively and releasably anchor said drone (8) to a surface (16). A...
|
|
WO/2023/013820A1 |
The present invention relates to a near-field measurement system for measuring the output of an antenna through a scanner, the system comprising: a signal analysis unit for generating a low-frequency signal for measurement of the output ...
|
|
WO/2023/011916A1 |
Electric current transducer (1) comprising a housing (2), a magnetic core and a magnetic field detection system, the magnetic core surrounding a primary conductor passage (4) for receiving a primary conductor (30) therethrough, the magne...
|
|
WO/2023/013413A1 |
Provided is a probe card that makes it possible to plan the measurement precision of electrical characteristics. The probe card 100 comprises: a probe pin 10 that comprises a metal conductor, is elastically deformable, and has a tip sect...
|
|
WO/2023/004958A1 |
A protective box for a wave recorder and a usage method thereof, the protective box being composed of two parts, a housing and a support assembly, and having a predetermined containability, such that a wave recorder can be placed in an a...
|
|
WO/2023/008227A1 |
A probe card comprising an insulation layer, a first conductor that at least partially extends along the surface of the insulation layer, and a second conductor that at least partially passes through at least part of the insulation layer.
|
|
WO/2023/005006A1 |
The present invention relates to an automatic warning recorder and a warning method thereof, the automatic warning recorder being composed of two parts: a warning adjustment component and a data display component. The warning adjustment ...
|
|
WO/2023/009077A1 |
The present invention relates to a twin-probe electrical tester (1) that measures and displays the voltage value, current value, and/or resistance value, especially on high voltage transmission lines.
|
|
WO/2023/005034A1 |
A probe card, an operation method for the probe card, and a test system. The probe card comprises: a long probe layer (1), the long probe layer (1) comprising multiple partitions (13), and each partition (13) being internally provided wi...
|
|
WO/2023/003255A1 |
The present invention relates to a contact probe and, more specifically, to a vertical-type contact probe including a plurality of layers. The present invention provides the contact probe which is used to test an electronic apparatus and...
|
|
WO/2023/000545A1 |
A shockproof waveform recorder, comprising two parts: a waveform recording component and a shockproof component. The shockproof component comprises: a cushioning plate (1) fixedly connected to the waveform recording component, a cushioni...
|
