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WO/2022/231340A1 |
Various embodiments disclosed herein provide a calibration port for multiple RF lines and an electronic apparatus including same. According to the various embodiments disclosed herein, a calibration connector for multiple RF lines may be...
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WO/2022/222099A1 |
A radio frequency bridge probe, comprising: a microwave transmission structure (1) and two probe assemblies (2) that are respectively and symmetrically connected to both ends of the microwave transmission structure (1). The two probe ass...
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WO/2022/225186A1 |
The present invention relates to a current measuring device comprising: a plurality of unit modules which are provided with mutually different grounds and are connected in series; a power unit which supplies high-voltage DC or AC power t...
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WO/2022/222833A1 |
Provided is a circuit component recognition method. The method comprises the steps of: S1, presetting a first-level recognition unit inside a component, wherein the first-level recognition unit is used for recognizing an input end and an...
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WO/2022/225249A1 |
Disclosed is a probe contact for electrical connection between a first terminal and a second terminal. The probe contact includes a stationary plunger which comprises a first main body having a first end to come into contact with the fir...
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WO/2022/224438A1 |
[Problem] The purpose of the present invention is to provide a probe card repair method for repairing a probe card in which a defect has occurred in an alignment symbol or a peripheral region thereof by using a high-reflection chip for a...
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WO/2022/220484A1 |
The present invention relates to a molded article for a semiconductor device test socket comprising a polyimide resin and a method for manufacturing same, characterized in that excellent mechanical properties, surface resistance stabilit...
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WO/2022/221628A1 |
This invention provides a system and a method for individually probing optical information and electrical information of LED chips, wherein the optical information is probed by using contactless photoluminescence(PL) measurement, and the...
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WO/2022/213415A1 |
Provided in the present application is a measuring tool for a semiconductor apparatus, the tool comprising a measuring device and a displacement device. The measuring device comprises a fixed portion and a telescopic portion which are co...
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WO/2022/215906A1 |
The present invention provides an electrically conductive contact pin, an inspection device comprising same, and a method for manufacturing an electrically conductive contact pin, wherein the electrically conductive contact pin is formed...
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WO/2022/216090A1 |
The present invention provides an electrically conductive contact pin formed by stacking a plurality of metal layers, and a manufacturing method therefor, the electrically conductive contact pin being pressed by pressing force concentrat...
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WO/2022/211344A1 |
The present invention relates to an electrically conductive contact pin and a method for manufacturing same, which improve the physical or electrical properties of an electrically conductive contact pin formed by laminating a plurality o...
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WO/2022/208708A1 |
[Problem] The purpose of this invention is to provide a highly reliable probe card having a probe electrode pad that does not easily peel from a wiring board. [Solution] This probe card comprises: a wiring board 103 having an electrode p...
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WO/2022/211343A1 |
The present invention relates to an electrically conductive contact pin formed by laminating a plurality of metal layers, and provides an electrically conductive contact pin having improved physical or electrical properties, and a manufa...
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WO/2022/211181A1 |
The present invention relates to an electrostatic charge measurement sensor module and an electrostatic charge monitoring system using same, wherein an electrostatic charge existing in a static electricity removal device, an object to be...
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WO/2022/211450A1 |
A contactor for connection and signal transmission between conductors comprises: a core unit formed to extend in the longitudinal direction, contain conductive particles, and be elastically modifiable; an insulation unit formed to encomp...
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WO/2022/211345A1 |
The present invention provides an electrically conductive contact pin having improved inspection reliability for an object to be inspected.
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WO/2022/202681A1 |
The purpose of the present invention is to provide an alloy material for probe pins that makes it possible to suppress diffusion of components of a probe material and solder at a circuit connection part which is to be tested when a probe...
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WO/2022/204277A1 |
A probe card comprises a support element that has a first side and a second side opposite the first side. A plurality of probe tips extend outward from the first side of the support element, the probe tips configured to make contact with...
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WO/2022/202658A1 |
This probe (100) contains: 15-60 mass% of Pd; 3-79.9 mass% of Cu; and 0.1-75 mass% of at least one of Ni and Pt.
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WO/2022/201846A1 |
In this connector for inspection, a barrel is electrically connected to an external conductor and has a vertically extending cylindrical shape. A socket is fixed to a central conductor so as to be electrically connected to the central co...
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WO/2022/198630A1 |
A signal transfer control method, a signal transfer apparatus (1), a test system, and a platform. The signal transfer apparatus (1) comprises: one switch (30) among a plurality of switches (30) is in series connection between a first end...
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WO/2022/196399A1 |
When a probe (1) is thinned so as to correspond to an electrode pitch of a semiconductor device, the mechanical strength of the probe is insufficient. It was necessary to devise a way of obtaining sufficient mechanical strength using a t...
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WO/2022/197774A1 |
Systems, methods, and apparatuses for measuring capacitance of a load. An apparatus includes a ground connector, an output connector configured to couple to the load, and a time-varying signal source configured to inject a time-varying v...
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WO/2022/196119A1 |
This probe is for use in testing a test subject by being inserted into a through hole of a guide plate, and the probe is provided with a columnar conductor part and a plurality of insulative covering materials arranged on a surface of th...
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WO/2022/191396A1 |
Disclosed is a test device. The test device according to an embodiment of the present invention is operated by a power supply unit provided to be portable, and tests a sensor device using an alternating current of a high frequency. There...
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WO/2022/191236A1 |
An electrical current testing device (100) comprises an electrode unit (10) and a movement mechanism (MM). The electrode unit (10) includes a support unit (2), an elastic unit (5), and a movable unit (6). The elastic unit (5) is supporte...
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WO/2022/187743A1 |
A system includes a cylindrical phantom and a conical structure disposed in the phantom. The conical structure is shaped as a frustum and emits Cherenkov radiation when exposed to ionizing radiation. The system can be used for calibratio...
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WO/2022/186679A1 |
The present invention relates to a method for manufacturing a contactor which electrically connects a pad of a subject and a pad of an inspection device with each other, the method comprising the steps of: preparing a mold equipped with ...
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WO/2022/187149A1 |
A modular probe array for making temporary electrical contact to devices under test is provided. The probe array includes multiple probe heads each having a substrate disposed within a mounting block. Improved thermal cycling performance...
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WO/2022/185937A1 |
Provided is a clamp sensor that is less likely to become misaligned with respect to a measurement object. A clamp sensor according to the present invention comprises: a first clamp arm that rotates around a rotational axis; a second clam...
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WO/2022/186680A1 |
A flexible contactor, according to the present invention, electrically connects a pad of a test subject and a pad of a test device to one another, and is characterized by comprising: first elastic parts comprising first conductive partic...
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WO/2022/182133A1 |
A connector for electrical connection according to an embodiment of the present disclosure comprises: an insulating portion which is electrically insulating; a conductive portion which is electrically conductive, is supported by the insu...
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WO/2022/179155A1 |
A radio frequency conduction test method and test system. The test method comprises: moving a radio frequency test pin (402) to a first pad (40141) of a single board (401), so that a test signal on the first pad (40141) is transmitted to...
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WO/2022/181951A1 |
The present invention provides an alignment module and an alignment transfer method for electrically conductive contact pins, whereby the electrically conductive contact pins can be inserted into guide holes of a guide plate all at once ...
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WO/2022/182177A1 |
The present invention provides an electrically-conductive contact pin assembly and a manufacturing method therefor, in which an electrically-conductive contact pin and a housing are manufactured at once by using a MEMS process, such that...
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WO/2022/177390A1 |
A method for manufacturing an electro-conductive contact pin according to the present invention comprises the steps of: filling a first metal in a first opening pattern formed on a mold having the first opening pattern formed thereon to ...
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WO/2022/177389A1 |
The present invention provides an electrically conductive contact pin and an assembly thereof, the electrically conductive contact pin adopting a resilient contact structure on a contact tip portion which slides inside a housing, to slid...
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WO/2022/175458A1 |
Disclosed herein is a method for producing a probe card, the method comprising the steps: Providing a carrier board, wherein the surface of the carrier board has at least one probe guiding portion; and Generating a probe on the probe gui...
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WO/2022/177247A1 |
The present invention relates to a current sensing device comprising: a bus bar including a plurality of low-resistance metal portions separated from each other with a resistance portion therebetween; a printed circuit board arranged bel...
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WO/2022/176143A1 |
[Problem] The purpose of the present invention is to provide an alignment chip for forming an alignment symbol on the wiring substrate of a probe card. [Solution] This alignment chip is provided with a substrate 51 which has an adhesion ...
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WO/2022/177118A1 |
The present invention provides a method for aligning and transporting molded articles or electrically conductive contact pins, which allows molded articles or electrically conductive contact pins to be collectively aligned without the ne...
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WO/2022/177388A1 |
The present invention provides an electrically conductive contact pin assembly having sufficient thickness by coupling, to each other, electrically conductive contact pins manufactured by means of a MEMS process.
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WO/2022/170486A1 |
Embodiments of the present application provide a battery, an electrical device, and a preparation method for the battery. The battery comprises: a plurality of battery cells, at least two battery cells being arranged in a first direction...
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WO/2022/173152A2 |
According to the present invention, in order to detect an amount of change due to a factor added by a system, the existing state is duplicated and stored in a memory, and an amount of change of the system is detected on the basis of a va...
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WO/2022/171439A1 |
The invention relates to a current-sensing resistor (1) for measuring a current (I), having two connection parts (2, 3) for conducting the current (I) being measured in and out, a resistor element (6) made of a resistive material, a firs...
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WO/2022/173120A1 |
The present invention provides an inspection apparatus having an inspection process that is carried out in the order of an alignment unit, a probe unit, and a pit unit, wherein the inspection apparatus may comprise: the alignment unit th...
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WO/2022/171427A1 |
The invention relates to a resistor (1), in particular a low-ohm current-sensing resistor (1), having two connection parts (2, 3) made of a conductor material, and a resistor element (6) made of a resistive material. The resistor (1) fur...
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WO/2022/173148A2 |
The present invention drives a plurality of capacitances of the present invention, including a shielding capacitance (Cin_sd), to minimize the variation of the voltage detected by a CDA signal line (200), thereby improving the resolution...
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WO/2022/169033A1 |
The present invention relates to an electromagnetic wave measurement device for estimating a near-field electric field by using a far-field electric field, and provides an electromagnetic wave measurement device for estimating a near-fie...
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