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WO/2023/109771A1 |
A probe apparatus, and a superconducting qubit junction resistance measurement method and system. The probe apparatus is used for measuring a superconducting quantum chip (4) and comprises a probe group, a probe control mechanism (2) and...
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WO/2023/113179A1 |
The present invention relates to a contact device and a character measurer comprising same, the contact device having an operation, such as rotation, added thereto so that all surfaces of the contact device of the character measurer, whi...
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WO/2023/110973A1 |
The present invention proposes a voltage converter (1) having a switching arm (2) comprising busbars (6, 7, 8) connecting it to an electrical network and to a rotating electric machine (15). The converter comprises a current-measuring de...
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WO/2023/112315A1 |
There is a need to increase the connection strength of a base body (9) of a connection device (6) for connecting a plurality of plate-like members stacked on one another. A probe card substrate connection base (100) is characterized by...
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WO/2023/113213A1 |
The present invention provides a rubber socket for testing a semiconductor element, and a conductive member for the rubber socket, the rubber socket comprising: a main body formed of an insulation material; and a plurality of electricity...
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WO/2023/110715A2 |
The current sensing system (2) comprises a busbar (9) connected in a current path between a power supply (3) and a load (5). The busbar (9) comprises a temperature dependent resistance with a specific temperature coefficient. An amplifie...
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WO/2023/113214A1 |
The present invention provides a method for manufacturing a conductive member for a rubber socket, comprising the steps of: preparing a first substrate having a first groove; filling the first groove with a ferromagnetic material and a d...
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WO/2023/109772A1 |
Disclosed in the present application are a quantum chip nondestructive testing probe device and a quantum chip nondestructive testing probe station. The probe device comprises a probe and a probe control mechanism, wherein the probe cont...
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WO/2023/112116A1 |
In a cleaning sheet (100) in which a cleaning layer (20) is bound to a surface of a base material sheet (10), there has been a problem that, in temperature conditions at which the cleaning sheet is used, warping occurs due to thermal def...
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WO/2023/106732A1 |
A probe member for inspection according to an embodiment of the present invention comprises a body unit having a pillar shape, and a plurality of contact protrusions provided on the body unit configured as a cross-sectional area of the p...
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WO/2023/103199A1 |
An electrical contact probe apparatus, comprising a fixing plate (4), wherein a plurality of mounting holes (5) are formed in the fixing plate (4); each of probes (1) comprises a needle rod (14), and a protrusion (12) and an axial annula...
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WO/2023/106762A1 |
The present invention provides an electrically conductive contact pin for a Kelvin test and a test device comprising same, which can cope with the narrower pitch between electrodes of a semiconductor device.
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WO/2023/105553A1 |
[Problem] One objective of the present invention is to provide a probe card with which contact failures do not readily occur. Another objective of the present invention is to provide a probe card having good high-frequency characteristic...
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WO/2023/098830A1 |
A line fault detection apparatus, comprising a housing (1000), a fault detection device (2000), a heat dissipation device (3000) and an air flow exhaust device (4000), wherein the housing (1000) has an inner cavity, a support plate (1100...
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WO/2023/101224A1 |
The present invention provides a rubber socket for testing a semiconductor element and a manufacturing method thereof, the rubber socket comprising: a body having a plurality of through-holes formed to extend therethrough in the height d...
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WO/2023/098119A1 |
Aspects of the invention include a wafer test device with a conformal laminate and rigid probes extending from the laminate to form an electrical connection with a microcircuit under test. The wafer test device also includes a spring pla...
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WO/2023/100708A1 |
This probe substrate 17 is used in a probe card 11. The probe card 11 is provided with a main substrate part 12 having a circuit substrate 12a, and a support member 14 connected to the main substrate part 12. The probe substrate 17 compr...
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WO/2023/096237A1 |
A probe card according to various embodiments of the present invention comprises: a probe pin; and a guide part in which the probe pin is disposed. The probe pin may comprise: a body part; a first extension part extending toward one side...
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WO/2023/096242A1 |
A probe card according to various embodiments of the present disclosure may comprise: a probe pin; and a guide part which is disposed at the outer edge of the circumference of the probe pin and comprises a guide opening into which one en...
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WO/2023/092921A1 |
An apparatus and method for measuring the performance of a finished product of an aircraft wiring harness (6) on the basis of de-embedding technology. The measurement apparatus comprises a left fixture (1) and a right fixture (2), wherei...
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WO/2023/094587A1 |
The present invention is related to a remotely-controlled flying device intended to approach and contact a high-voltage overhead power line for operation thereon, said flying device comprising : - a mechanical structure (1) bearing a plu...
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WO/2023/092897A1 |
The present invention relates to a membrane probe card and a probe head thereof. The membrane probe card comprises a membrane probe head (3), the membrane probe head (3) comprising a support body (31), a membrane (32), probes (33), and a...
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WO/2023/092898A1 |
A membrane probe card and a probe head thereof. The membrane probe card comprises a membrane probe head (3), the membrane probe head (3) comprising a support body (31), a membrane (32), a probe (33) and an interconnection wire (34), wher...
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WO/2023/092899A1 |
A membrane probe card and a probe head thereof. The membrane probe card comprises a membrane probe head (3), the membrane probe head (3) comprising a support body (31), a membrane (32), a probe (33) and an interconnection wire (34), wher...
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WO/2023/092674A1 |
A testing device (100), comprising a testing table (10), a testing mechanism (20), a moving mechanism (30), and a limiting member (40). The testing table (10) is used for fixing a circuit board to be tested; the testing mechanism (20) is...
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WO/2023/090062A1 |
This probe storage jig stores a probe that includes an arm portion having a cantilever structure and a supporting portion connected to a fixed end of the arm portion. The probe storage jig has a configuration in which a first guide plate...
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WO/2023/090746A1 |
The present invention provides an electrically conductive contact pin and an inspection device having improved inspection reliability for an inspection object. The electrically conductive contact pin is characterized in that a first conn...
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WO/2023/090517A1 |
Disclosed are a system and a method therefor, the system enabling high-speed measurement of the performance of a plurality of measurement items for verification and post management of equipment under test including an antenna under test....
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WO/2023/089628A1 |
The present invention relates generally to Load Banks for testing generators and electric power sources and more particularly the present invention discloses a load bank system circuit topology and method thereof, to generate large numbe...
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WO/2023/090622A1 |
An electroluminescence inspection apparatus is disclosed. The electroluminescence inspection apparatus may comprise: a first substrate; a plurality of electrode members arranged on a first surface of the first substrate and having elasti...
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WO/2023/085661A1 |
The present invention provides a rubber socket for testing a semiconductor device, the rubber socket comprising: a main body having a plurality of conductive holes penetratively formed in a height direction and formed of an insulating fi...
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WO/2023/085502A1 |
An expansion member for a battery charging/discharging probe is disclosed. The expansion member comprises: a first fluid holding part forming a space in which fluid can be introduced and stored; and a fluid supply tube connected to the f...
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WO/2023/082712A1 |
A capacitor detection apparatus and method, and a motor control device. The detection apparatus comprises: a switch unit which is in a closed state when a motor control device needs to control a motor system to be powered on and started,...
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WO/2023/084888A1 |
Provided is a measurement probe with which, if a component is damaged or fails, that component alone can easily be replaced. The measurement probe comprises a cylindrical housing 8, at least one pin 1, an outer plunger 3 for holding th...
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WO/2023/083831A1 |
An electrical circuitry for detecting a fault current in an electric vehicle charging station. The electrical circuitry comprises a printed circuit board, comprising at least two conductive tracks for conducting electrical charging curre...
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WO/2023/084957A1 |
The present invention provides a silicon nitride composite material that stably has a thermal expansion coefficient and high strength equivalent to a silicon wafer, and a probe-guiding part. The silicon nitride composite material of the ...
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WO/2023/078923A1 |
The front-end circuit (1) for an impedance measurement comprises an excitation-terminal (12), intended to receive an excitation signal relative to a common ground (11), a first and a second input-terminal (13a,b), intended to be connecte...
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WO/2023/081635A1 |
A contactor assembly for a testing system for testing integrated circuit devices includes a contact, and a housing having a contact slot. The contact is receivable in the contact slot. The contact includes a tip, a body, and a tail; and ...
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WO/2023/077887A1 |
A power distribution network single-phase grounding fault arc self-extinguishing characteristic simulation apparatus and a test method. The simulation apparatus comprises a fuse (1), a circuit breaker (2), an arc striking apparatus (3), ...
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WO/2023/080534A1 |
A socket board for testing an ASIC chip of the present invention comprises: a chip connection unit having a predetermined conductive pattern and being electrically connected to an ASIC chip by means of contact between pins of the unspeci...
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WO/2023/080422A1 |
An electroluminescence inspection apparatus is disclosed. The disclosed electroluminescence inspection apparatus comprises: a first substrate; and a plurality of electrode members which are arranged on one surface of the first substrate ...
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WO/2023/080206A1 |
Provided is a pitch conversion unit for converting the pitch of a plurality of contact-terminal-side electrodes to the pitch of a plurality of device-side electrodes, the pitch conversion unit being configured such that the joining stren...
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WO/2023/080533A1 |
The present invention is to provide a test socket that has a minimum length suitable for the electrical testing of a semiconductor device and has stable stroke and excellent electrical characteristics. The test socket according to an emb...
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WO/2023/071738A1 |
An antenna test system, comprising: a dark chamber (1); a first bearing mechanism (2), wherein the first bearing mechanism (2) is arranged in the dark chamber (1); a conveying mechanism (3), wherein the conveying mechanism (3) is arrange...
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WO/2023/070652A1 |
A relay contact voltage drop test fixture, comprising a test base (15), a support (1), a mounting plate (3), an air cylinder (2), a buffering assembly and a test board (6), wherein a plurality of test columns (5) are mounted on the test ...
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WO/2023/074760A1 |
This anisotropic conductive sheet comprises: an insulation layer having an elastomer layer and a plurality of first heat-resistant resin layers disposed in a mutually separated manner on one side of the insulation layer; a plurality of t...
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WO/2023/074947A1 |
A cartridge locking apparatus for a multi-prober is provided. The present invention relates to an apparatus for locking a card assembly and a chuck assembly in a cartridge, which comprises the card assembly including a probe card with a ...
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WO/2023/075273A1 |
A disconnection testing apparatus for an electrode tab of a battery cell, according to the present invention, comprises: a measurement unit which measures impedance values and impedance angles according to the frequency of a battery cell...
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WO/2023/074942A1 |
A cartridge transport device for a multi-prober is provided. The present invention comprises: a first transport unit for moving a body frame in a Y axis direction parallel to the width direction of an inspection chamber by a first drivin...
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WO/2023/074198A1 |
Provided is a flexible substrate that does not easily break even if force is imparted to a portion thereof, and the like. The flexible substrate comprises one end, another end, and a pattern part 31a3 formed at least between the one en...
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