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WO/2024/081107A1 |
Aspects of the present disclosure describe a voice coil actuated leaf spring prober that advantageously may be operated to probe every individual device (device under test – DUT) comprising a contemporary wafer. The prober according to...
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WO/2024/079220A1 |
The invention relates to a testing device (2) designed to test a wiring system plug connector (4) for proper assembly of a number of plug contacts (6) of the plug connector (4) and comprising an electromechanical measuring device (10) wi...
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WO/2024/077692A1 |
Disclosed in the present invention are an oscilloscope probe, a probe detection method and apparatus, an oscilloscope, a system, and a storage medium. The oscilloscope probe comprises a signal testing path and a detection circuit, wherei...
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WO/2024/081750A1 |
A customizable safety enclosure for a device under test (DUT) includes a plurality of non-conductive panels to enclose the DUT, and a plurality of non-conductive removeable corner joints each configured to secure a corner of the enclosur...
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WO/2024/080812A1 |
The present invention relates to a battery cell formation device and, specifically, to a series battery cell formation device for reducing the length and number of power cables in a device that performs charging and discharging by connec...
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WO/2024/080684A1 |
The present invention provides an electroconductive contact pin that has a size that is clearly distinguishable from a surrounding structure and forms a diffused-reflection surface during vision inspection, allowing the location of a tip...
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WO/2024/068613A1 |
The invention relates to an apparatus (2) for aligning the axis (9) of a test specimen (3) relative to the axis (6) of a test stand (1), said apparatus comprising: a first plate (11) which is designed for fastening to a mounting plate (7...
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WO/2024/067957A1 |
The invention describes an antenna device, comprising: a printed circuit board, PCB, comprising an opening, wherein at least two probes are arranged on or in the printed circuit board orthogonally to each other; a cavity between a portio...
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WO/2024/072385A1 |
Examples of retention structures (242) are described herein. In some examples, an apparatus (240) includes a three-dimensional (3D) printed substrate (232). In some examples, the apparatus includes a 3D printed contact (230) included in ...
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WO/2024/070257A1 |
The objective of the present invention is to cause both of two core members to adopt a state of being coupled together with a sufficient magnetic coupling force, while achieving a reduction in size. This clamp sensor comprises a first ...
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WO/2024/066209A1 |
Embodiments of the present application provide a test device for testing a battery, comprising a test body and a first door body. The test body comprises an accommodating cavity for accommodating a battery and an opening, wherein the ope...
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WO/2024/062561A1 |
This probe (20) for a probe card comprises: a plurality of deformed regions (8), which are provided in two rows in at least one side surface (20S) from among two side surfaces (20S) and which are recessed relative to the side surface (20...
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WO/2024/062562A1 |
A cantilever-type probe (20) for a probe card comprises: a base (21D) that stands upright from a terminal (21T) that connects to a wiring substrate (K); a needle tip section (22); and a beam (21B) that is located between the base (21D) a...
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WO/2024/062559A1 |
This cantilever-type probe (20) for a probe card comprises a seat part (21D), a needle point part (22), and a beam part (21B) between the seat part (21D) and the needle point part (22). The beam part (21B) comprises, in the longitudinal ...
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WO/2024/062558A1 |
This probe (1) for a probe card has, on a reference surface (1SB) perpendicular to a buckling direction (X), a plurality of deformed regions (8) which are arranged with intervals therebetween, the outer edge of which is circular, oval, o...
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WO/2024/064789A1 |
Aspects are provided for a connected monitoring device for monitoring and reporting measurements. The monitoring device includes a plurality of sockets, each socket configured to receive a smart probe including a memory storing calibrati...
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WO/2024/061851A1 |
A method for making electrical contact with at least one electronic component comprises: providing a pliable element which has a first main surface on which at least one first conductor track and at least one second conductor track, elec...
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WO/2024/062560A1 |
A probe (20) for probe cards, which is to be placed in contact with electrode pads of a semiconductor device and used for supply of power, input/output of signals, and grounding when performing an operation test of individual semiconduct...
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WO/2024/061098A1 |
The present application relates to the technical field of relay manufacturing, and particularly designs a withstand voltage test device. The withstand voltage test device comprises a workbench, a sampling assembly, a supporting member an...
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WO/2024/062468A1 |
A fine electrical probe can provide fine-pitch applications in devices such as smart watches and smart phones. Fingers are positioned on a substrate. The substrate has a recess that allows the fingers to flex. The substrate and fingers a...
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WO/2024/055366A1 |
A passive tester pen capable of indicating the polarity of a measured potential, comprising: a tester pen shank (10), wherein an insulating sleeve is sleeved outside the tester pen shank (10), a detachable connecting top seat (11) is mou...
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WO/2024/057613A1 |
This electrical connection device comprises probes and a probe head that has a configuration in which a first guide plate and a second guide plate each having guide holes formed therein are arranged spaced apart from each other along a d...
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WO/2024/058500A1 |
A method for producing conductive particles of the present invention is a method for producing conductive particles which are provided inside a conductive part of a sheet-type connector that electrically connects a terminal of a device t...
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WO/2024/057188A1 |
A foldable test bench comprises a perforated plate or template (2) having a plurality of seats (3) for the positioning of respective probes (4), a supporting structure (5) for the stable positioning of said template (2) on a work surface...
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WO/2024/056173A1 |
An embodiment according to the invention comprises a pusher (140, 240, 340, 520, 720) for use in an automated test equipment (ATE) to mechanically push a device under test, DUT (110) comprising an antenna or an antenna array into a DUT s...
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WO/2024/056172A1 |
An embodiment according to the invention comprises a pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) for use in an automated test equipment (ATE) to mechanically push a device under test (DUT) (110, 1020, 1150, 1250) compris...
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WO/2024/053549A1 |
A probe comprising 40-95 mass% of Pt, 0.5-50 mass% of Cu, and 3-50 mass% of Ni.
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WO/2024/053552A1 |
The purpose of the present invention is to provide an alloy material for probe pins by which the diffusion of components of a probe material and solder at a circuit connection part to be tested during a probe test can be suppressed. Th...
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WO/2024/053638A1 |
This socket comprises an extendable probe and a conductor through which the probe passes, wherein the conductor has a receiving part that receives the probe.
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WO/2024/052463A1 |
The present invention relates to a microstructure inspection device (100) for inspecting an electrical characteristic of at least one micro electromechanical system, MEMS, structure (150) formed in or on a substrate (160). The microstruc...
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WO/2024/048439A1 |
This framed anisotropic conductive sheet comprises: an insulating layer including a plurality of through-holes penetrating in the thickness direction; an anisotropic conductive sheet including a plurality of conductive portions disposed ...
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WO/2024/045649A1 |
A near-field air interface rapid measurement system and method for a pattern of an active array antenna, which is used for increasing the measurement speed of the pattern of the active array antenna, can shorten the measurement distance,...
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WO/2024/025700A9 |
Probe structures wherein the probes include at least one spring segment and, in some embodiments, include narrowed channel passage segments (e.g. by increasing width of plunger elements or by decreasing channel widths) along portions of ...
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WO/2024/040230A1 |
A fluid electrical probe includes a body portion housing a cleaner, a head portion forming a gap, an electrode disposed in the gap, and a temperature sensor disposed in the gap. The cleaner is extendable into the gap to clean the electro...
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WO/2024/040069A1 |
A system comprising a device including a battery pack interface, an outlet connector with a ground line, a first output line, and a second output line, a plurality of switches, and a controller with a wireless communication module. The s...
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WO/2024/039428A1 |
Techniques for efficient compression of sensor data are described herein. In an example, metrology data is received from a metrology device, the metrology data comprising one or more of: voltage (V) data; current (A) data; resistive powe...
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WO/2024/039640A1 |
Probe structures having multiple beams are joined at their ends with at least one functioning as a current carrying beam (i.e., an electrical beam) and at least one functioning as a structural beam (i.e., non-current carrying beam) that ...
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WO/2024/037522A1 |
A control method and system for using a high-capacity medium-voltage chain-type energy storage system as an off-grid test power source. The control method comprises: acquiring PCS off-grid stable operation parameters and battery cluster ...
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WO/2024/038989A1 |
The present invention provides a method in which, when a plurality of electrical outlets are connected to a ground-isolated power supply, respective isolation states between ground and power supply of loads connected to the respective el...
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WO/2024/031819A1 |
A test method for an integrated Micro LED. By immersing a Micro LED in a conductive liquid (2) for testing, a P electrode (5) is grounded by means of the conductive liquid (2), and a common N electrode (4) which is not immersed in the co...
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WO/2024/034908A1 |
The present invention provides an electro-conductive contact pin and a testing device having same, the contact pin improving testing reliability for a test object, and generating a supportive force for eccentric pressure, thereby prevent...
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WO/2024/031770A1 |
A fixing device and a chip testing machine having same, which are suitable for the field of chip testing. The fixing device comprises: a fixing plate (11), the fixing plate (11) being provided with a fixing end, and the fixing end being ...
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WO/2024/032967A1 |
The invention relates to a test pin (10) for electrically contacting a contact partner (20), in particular a planar surface (21) of a contact partner, comprising: a substantially sleeve-shaped main body (1); a contact head (3), which is ...
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WO/2024/034212A1 |
[Problem] To provide an electric contact in which a configuration comprising elastic bodies in a spiral structure is integrally formed from a single material, with which no-loss connection is possible as an electric circuit, and with whi...
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WO/2024/031797A1 |
An addressable test array, for use in solving the problems of low test structure area utilization rate and low test process time utilization rate. The addressable test array comprises a plurality of addressable on-off controllable low-le...
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WO/2024/029790A1 |
The present invention provides an electrically conductive contact pin and a method for manufacturing same, the electrically conductive contact pin comprising: a body portion composed of a plurality of metal layers stacked in a thickness ...
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WO/2024/027373A1 |
A flexible printed circuit test system (100), comprising a voltage simulation module (10), an environment platform (20), a test sampling module (30), and an upper computer (40). The environment platform (20) comprises a temperature adjus...
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WO/2024/024327A1 |
This probe device comprises: a case having a first surface and a second surface; an electrically conductive probe having a first contact section exposed at a first surface and a second contact section exposed at a second surface; and an ...
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WO/2024/022625A1 |
The invention relates to a test arrangement for over-the-air testing an angled device under test, wherein the test arrangement comprises a carrier structure, wherein the test arrangement comprises a device-under-test socket which is coup...
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WO/2024/022626A1 |
The invention relates to a test arrangement for over-the-air testing an angled device under test, wherein the test arrangement comprises a carrier structure and a device-under-test socket which is coupled to the carrier structure. The de...
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