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WO/2020/068468A1 |
Systems and methods are described herein for manufacturing and using roofing membranes that are faster and easier to install than conventional adhesive-only membrane materials. In some embodiments, membrane materials are surface treated ...
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WO/2020/066128A1 |
The present invention suppresses an influence of noise caused by a device or an environment, and evaluates line edge roughness or a line width roughness. To this end, an averaged signal profile 405 is obtained from a moving average of S ...
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WO/2020/060226A1 |
Suggested are process quality verification method and apparatus using quantitative statistical values through grain boundary scanning electron microscope image treatment of a low-temperature poly-silicon thin film transistor active layer...
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WO/2020/061294A1 |
A SAR microwave reflectometer for detecting cracks in metal surfaces may comprise a microwave signal source, an antenna coupled to the signal source and configured to radiate a plurality of electric field vector directions, a receiver co...
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WO/2020/053016A1 |
The invention relates to an apparatus for detecting an object conveyed by means of a conveying device through a measuring area of the apparatus, comprising a transmitting device for transmitting measuring radiation with a frequency in th...
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WO/2020/048346A1 |
A correction device (100) for an X-ray inspection device, comprising: at least one surface mount element (110) having several welding ends; several correction sheets (120) made of metal material, each of the correction sheets (120) havin...
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WO/2020/045852A1 |
A method for measuring the thickness of a specimen, according to an embodiment, can measure the thickness of a specimen having multiple layers in a contactless and non-destructive manner. In addition, when the refractive indexes of mater...
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WO/2020/017907A1 |
A system for detecting misalignment, according to one embodiment of the present invention, comprises: a reference jig on which an electrode assembly is placed; a beam generation unit for irradiating X-rays at a first angle and a second a...
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WO/2020/011730A1 |
The invention relates to a device for the additive manufacture of a workpiece (10; 30), comprising a cell-like construction chamber (24) for a workpiece which is to be constructed preferably in layers and additives manufacturing means (1...
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WO/2020/012730A1 |
Provided is an X-ray analysis system that makes it possible to simply set appropriate vapor phase decomposition conditions. This X-ray analysis system comprises an X-ray analysis device and a vapor phase decomposition device. The X-ray a...
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WO/2020/003675A1 |
The present invention enables realizing, at low costs and in a simplified manner: a method for measuring the density and the thickness of a measurement sample; and a total reflection X-ray fluorescence analysis device for measuring the d...
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WO/2019/238384A1 |
The invention concerns a Method for detecting a fault condition in the measurement of the level of a medium (1) in a tank (2) with a floating roof (3), whereby the floating roof (3) is floating on the medium (1) and is vertically guided ...
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WO/2019/239546A1 |
In the present invention, an electro-optical condition generation unit includes: a condition setting unit that sets, as a plurality of electro-optical conditions, a plurality of electro-optical conditions in which the combinations of the...
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WO/2019/230040A1 |
This X-ray thickness measurement device (12) is connected to a prediction data server (14), and is equipped with an X-ray control power supply, an X-ray generator, and a detection unit. The prediction data server (14) is equipped with an...
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WO/2019/230010A1 |
In this invention, an X-ray generator (30) has a filament (38) which is supplied with power from a power supply (22), and emits X-rays. An output detection unit (34) outputs a detection value for calculating the thickness of a subject be...
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WO/2019/198039A2 |
The present invention relates to a system and a method for accurately estimating the thickness of extruded plastic films. In particular, the invention relates to automatic allocation of a recipe-dependent calibration factor and a scannin...
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WO/2019/198916A1 |
The present invention relates to a system for inspecting the surface of a hole in a rock, wherein the system can be inserted into a hole in a rock to measure the surface roughness precisely and swiftly, and ensures that measurement of th...
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WO/2019/200015A1 |
A metrology system may include an optical metrology tool configured to produce an optical metrology output for one or more features on a processed substrate, and a metrology machine learning model that has been trained using a training s...
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WO/2019/197317A1 |
The invention relates to a method for automatically detecting a loading surface of a vehicle, comprising the steps of determining (S101) a lateral contour of a vehicle; determining (S102) a height profile of the vehicle; calculating (S10...
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WO/2019/194305A1 |
A scanning electron microscope system comprising: a primary electron beam radiation means that radiates a primary electron beam at a first pattern on a substrate that has a second pattern formed at a peripheral region of the first patter...
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WO/2019/194304A1 |
An electron microscope device having: a detection part that detects reflected electrons which have reflected from a sample that has been irradiated with primary electrons emitted from a primary electron generation part (an electron gun);...
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WO/2019/191335A1 |
Multilayer targets enabling fast and accurate, absolute calibration and alignment of X-ray based measurement systems are described herein. The multilayer calibration targets have very high diffraction efficiency and are manufactured usin...
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WO/2019/188258A1 |
This method is for generating a correction line indicating the relationship between the amount of separation between a wafer pattern edge and reference pattern edge and the width of a space adjacent to the reference pattern edge. The met...
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WO/2019/180760A1 |
The present invention proposes a pattern measurement tool characterized by being provided with: a charged-particle beam sub-system having a tilt deflector; and a computer sub-system which is connected to the charged-particle beam sub-sys...
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WO/2019/173944A1 |
Disclosed is a clinometer, comprising a displacement sensor, a flexible string or an elastic rod (32), and a weight (31). The weight (31) is fixed at the bottom of the flexible string or the elastic rod (32) and is located in a body of t...
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WO/2019/175143A1 |
The invention relates to a method for correcting measurement errors in the imaging of an analysis object by means of computed tomography (CT) in the form of a reconstructed volume of the analysis object, comprising the steps: a) measurin...
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WO/2019/173170A1 |
A semiconductor metrology tool inspects an area of a semiconductor wafer. The inspected area includes a plurality of instances of a 3D semiconductor structure arranged periodically in at least one dimension. A computer system generates a...
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WO/2019/166085A1 |
The general field of the invention is that of computer-implemented methods for identifying mechanical parameters of an object subject to mechanical stress. The method according to the invention comprises a step of acquiring, by an imagin...
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WO/2019/168139A1 |
Provided is a device for measuring a surface profile of a charged material in a blast furnace, the device including an outer member inserted into an insertion hole formed in a sidewall of the blast furnace such that a transmission openin...
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WO/2019/136189A1 |
Methods and systems for measuring structural and material characteristics of semiconductor structures based on combined x-ray reflectometry (XRR) and x-ray photoelectron spectroscopy (XPS) are presented herein. A combined XRR and XPS sys...
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WO/2019/113997A1 |
Disclosed is a Micro-CT-based method for measuring the flow velocity of assimilation products of a Rosaceae crop, comprising the following steps: step 1) establishing a Micro-CT-based calculation formula for fibrovascular bundle cross-se...
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WO/2019/108763A1 |
A system and method is disclosed for measuring the dimensions of physical objects. The systems and methods include a measuring instrument of significant length comprising an array of patch antennas arranged along the length of an elongat...
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WO/2019/100119A1 |
A device for testing the structural integrity of a helmet including: an x-ray generator; a space shaped to receive the helmet; and an x-ray detector; wherein the x-ray generator is arranged to eject x-rays through the space; and wherein ...
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WO/2019/103348A1 |
Disclosed are a method for visualizing and measuring the thickness distribution of a paint film layer, and a device therefor. A heating unit applies light beams to heat a measurement target region of a measurement target structure while ...
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WO/2019/094225A1 |
A method and system for estimating a thickness of at least one casing string in a cased hole may comprise obtaining a plurality of induction measurements from a plurality of channels using a casing inspection tool, computing a quality ve...
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WO/2019/094754A1 |
Material loss may be estimated from 2D digital radiographs using double wall single imaging (DWSI) technique using a system for estimation of material loss from 2D digital radiographs comprising one or more calibration samples (10), each...
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WO/2019/094209A1 |
A method and system for determining properties of a pipe string using multi-channel induction measurements. The method may comprise disposing a multi-channel induction tool in a cased hole, obtaining a multi-channel measurement, forming ...
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WO/2019/089686A1 |
An apparatus having a layer of fats, oils and grease (F.O.G) on water includes a tank having an inlet and an outlet. The inlet connects to a source of F.O.G.-laden effluent and the outlet connects to a sewer pipe so that the outlet defin...
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WO/2019/081876A1 |
The invention concerns a method for measuring dimensions of empty glass containers (2) consisting of: - choosing at least one region to be inspected of the container, - transporting the containers, - positioning, to either side of the re...
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WO/2019/081875A1 |
The invention concerns a measurement method consisting in; - acquiring, by means of image sensors (Cji), for each object during the movement of same, at least three radiographic images of the region to be inspected, obtained from at leas...
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WO/2019/079630A1 |
Methods and systems for realizing a high brightness, liquid based x-ray source suitable for high throughput x-ray metrology are presented herein. A high brightness x-ray source is produced by bombarding a rotating liquid metal anode mate...
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WO/2019/073592A1 |
The present invention comprises a computation device for measuring the dimensions of patterns formed on a sample on the basis of a signal obtained from a charged particle beam device. The computation device comprises a positional deviati...
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WO/2019/064293A1 |
A control system for use in measuring one or more parameters of a patterned structure. The control system is configured as a computer system and comprises: an input utility configured to receive input data comprising raw measured TEM ima...
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WO/2019/063185A1 |
The present invention relates to a measuring device for determining the thickness of a dielectric coat on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields, which has a rotationally symmetrical wa...
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WO/2019/051616A1 |
A system for producing a peening process model comprises a peening load modeling module for obtaining models of peening induced loads as a function of a plurality of peening treatments. A peening optimization module obtains models of a c...
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WO/2019/049234A1 |
When calculating a distortion amount in a detection surface 31 of a plane surface detector 3 of X-ray equipment 1, a user first disposes a calibration phantom 10 between a light source 2 and the plane surface detector 3. Then, the attitu...
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WO/2019/038917A1 |
In order to achieve a correction sample and an electron beam adjustment method and an electron beam device using the correction sample, with which a high-precision measurement of an incident angle can be performed, this correction sample...
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WO/2019/038841A1 |
The present invention quantitatively evaluates a crystal growth amount by nondestructive inspection in a wide area from an undergrowth state to an overgrowth state. According the present invention, a plurality of image feature amounts ar...
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WO/2019/035425A1 |
A coated plate material (10) comprising: a base material (11) having as a surface (11a) thereof an uneven area (11P) having uniformly spaced undulations that reflect terahertz waves (L); and a coating layer (12) formed on the surface (11...
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WO/2019/014283A1 |
Methods and systems for performing measurements of semiconductor structures based on high-brightness, polychromatic, reflective small angle x-ray scatterometry (RSAXS) metrology are presented herein. RSAXS measurements are performed over...
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