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WO/2024/087978A1 |
The present application relates to a battery tray, a battery testing module, a battery testing system and a battery production system. During a testing process, a battery is placed on a tray body, and the battery is electrically connecte...
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WO/2024/087507A1 |
Disclosed in the present application is a battery charging and discharging test device, comprising a temperature-control box, a frame, at least one partition plate and a plurality of charging and discharging modules, wherein a plurality ...
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WO/2024/089148A1 |
The invention relates to a power-electronic circuit arrangement (10), having a flat circuit carrier (12), which has an electrically insulating substrate (14) and, on a flat side (15) of the substrate (14), a conductor track arrangement (...
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WO/2024/090788A1 |
The present invention relates to: a method for producing an electrically insulating composite material for a silicon rubber socket, the method comprising a step for producing a molded body from a mixture including a liquid silicone and a...
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WO/2024/090714A1 |
The present invention relates to a pogo pin probe and a pogo pin including same. More specifically, the present invention relates to: a pogo pin probe that can be securely fixed to a barrel of a pogo pin without rattling or rotating; and...
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WO/2024/090359A1 |
The contact pin (10) according to the present invention comprises: a tip portion (11) which has a first contact region (111) pointing in a first direction (D1), a base region (113) which is opposite the first contact region (111), and a ...
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WO/2024/085538A1 |
The present invention provides a method for producing probe cards, the method facilitating assembly of plates and a plurality of probes, and allowing efficient replacement of damaged probes with functional probes.
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WO/2024/085486A1 |
The present invention relates to a circuit board test terminal. Provided is a circuit board test terminal which comprises a board part and an extension part extending from the board part and connected to a test point of the circuit board...
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WO/2024/086546A1 |
Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward ...
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WO/2024/085933A1 |
Probes for contacting electronic components include a plurality of compliant modules stacked in a serial configuration, and including planar springs (when unbiased), an engagement structure being provided to engage different compliant mo...
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WO/2024/085537A1 |
According to the present invention, the flexibility of a probe pin is adjusted by providing a vertical slit and/or a horizontal slit, thereby facilitating elastic deformation. In addition, according to the present invention, the sectiona...
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WO/2024/086505A1 |
Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward ...
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WO/2024/085536A1 |
The present invention relates to a probe card for inspecting defects of an inspection target, a probe pin for a probe card configured to contact the inspection target, a guide plate for a probe card configured to guide a probe pin insert...
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WO/2024/086506A1 |
Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward ...
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WO/2024/086507A1 |
Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward ...
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WO/2024/085934A1 |
Probes for contacting electronic components include single compliant modules or pairs of back-to-back modules that may share a common base. Module bases may include configurations that allow for one or both lateral alignment and longitud...
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WO/2024/081123A1 |
Nickel-ruthenium-based ternary or greater alloys, products, and methods of making and using the same include nickel at about 48 to about 71 weight % ("wt%") of the alloy, ruthenium at about 17 to about 45 wt% of the alloy, and at least o...
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WO/2024/080685A1 |
The present invention provides a micro metal molded article in which the magnetic areas and conductive areas are separated such that when the magnetic parts of adjacent micro metal molded articles are oriented by magnetic lines of force,...
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WO/2024/081107A1 |
Aspects of the present disclosure describe a voice coil actuated leaf spring prober that advantageously may be operated to probe every individual device (device under test – DUT) comprising a contemporary wafer. The prober according to...
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WO/2024/079220A1 |
The invention relates to a testing device (2) designed to test a wiring system plug connector (4) for proper assembly of a number of plug contacts (6) of the plug connector (4) and comprising an electromechanical measuring device (10) wi...
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WO/2024/077692A1 |
Disclosed in the present invention are an oscilloscope probe, a probe detection method and apparatus, an oscilloscope, a system, and a storage medium. The oscilloscope probe comprises a signal testing path and a detection circuit, wherei...
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WO/2024/081750A1 |
A customizable safety enclosure for a device under test (DUT) includes a plurality of non-conductive panels to enclose the DUT, and a plurality of non-conductive removeable corner joints each configured to secure a corner of the enclosur...
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WO/2024/080812A1 |
The present invention relates to a battery cell formation device and, specifically, to a series battery cell formation device for reducing the length and number of power cables in a device that performs charging and discharging by connec...
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WO/2024/080684A1 |
The present invention provides an electroconductive contact pin that has a size that is clearly distinguishable from a surrounding structure and forms a diffused-reflection surface during vision inspection, allowing the location of a tip...
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WO/2024/068613A1 |
The invention relates to an apparatus (2) for aligning the axis (9) of a test specimen (3) relative to the axis (6) of a test stand (1), said apparatus comprising: a first plate (11) which is designed for fastening to a mounting plate (7...
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WO/2024/067957A1 |
The invention describes an antenna device, comprising: a printed circuit board, PCB, comprising an opening, wherein at least two probes are arranged on or in the printed circuit board orthogonally to each other; a cavity between a portio...
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WO/2024/072385A1 |
Examples of retention structures (242) are described herein. In some examples, an apparatus (240) includes a three-dimensional (3D) printed substrate (232). In some examples, the apparatus includes a 3D printed contact (230) included in ...
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WO/2024/070257A1 |
The objective of the present invention is to cause both of two core members to adopt a state of being coupled together with a sufficient magnetic coupling force, while achieving a reduction in size. This clamp sensor comprises a first ...
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WO/2024/066209A1 |
Embodiments of the present application provide a test device for testing a battery, comprising a test body and a first door body. The test body comprises an accommodating cavity for accommodating a battery and an opening, wherein the ope...
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WO/2024/062561A1 |
This probe (20) for a probe card comprises: a plurality of deformed regions (8), which are provided in two rows in at least one side surface (20S) from among two side surfaces (20S) and which are recessed relative to the side surface (20...
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WO/2024/062562A1 |
A cantilever-type probe (20) for a probe card comprises: a base (21D) that stands upright from a terminal (21T) that connects to a wiring substrate (K); a needle tip section (22); and a beam (21B) that is located between the base (21D) a...
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WO/2024/062559A1 |
This cantilever-type probe (20) for a probe card comprises a seat part (21D), a needle point part (22), and a beam part (21B) between the seat part (21D) and the needle point part (22). The beam part (21B) comprises, in the longitudinal ...
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WO/2024/062558A1 |
This probe (1) for a probe card has, on a reference surface (1SB) perpendicular to a buckling direction (X), a plurality of deformed regions (8) which are arranged with intervals therebetween, the outer edge of which is circular, oval, o...
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WO/2024/064789A1 |
Aspects are provided for a connected monitoring device for monitoring and reporting measurements. The monitoring device includes a plurality of sockets, each socket configured to receive a smart probe including a memory storing calibrati...
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WO/2024/061851A1 |
A method for making electrical contact with at least one electronic component comprises: providing a pliable element which has a first main surface on which at least one first conductor track and at least one second conductor track, elec...
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WO/2024/062560A1 |
A probe (20) for probe cards, which is to be placed in contact with electrode pads of a semiconductor device and used for supply of power, input/output of signals, and grounding when performing an operation test of individual semiconduct...
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WO/2024/061098A1 |
The present application relates to the technical field of relay manufacturing, and particularly designs a withstand voltage test device. The withstand voltage test device comprises a workbench, a sampling assembly, a supporting member an...
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WO/2024/062468A1 |
A fine electrical probe can provide fine-pitch applications in devices such as smart watches and smart phones. Fingers are positioned on a substrate. The substrate has a recess that allows the fingers to flex. The substrate and fingers a...
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WO/2024/055366A1 |
A passive tester pen capable of indicating the polarity of a measured potential, comprising: a tester pen shank (10), wherein an insulating sleeve is sleeved outside the tester pen shank (10), a detachable connecting top seat (11) is mou...
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WO/2024/057613A1 |
This electrical connection device comprises probes and a probe head that has a configuration in which a first guide plate and a second guide plate each having guide holes formed therein are arranged spaced apart from each other along a d...
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WO/2024/058500A1 |
A method for producing conductive particles of the present invention is a method for producing conductive particles which are provided inside a conductive part of a sheet-type connector that electrically connects a terminal of a device t...
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WO/2024/057188A1 |
A foldable test bench comprises a perforated plate or template (2) having a plurality of seats (3) for the positioning of respective probes (4), a supporting structure (5) for the stable positioning of said template (2) on a work surface...
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WO/2024/056173A1 |
An embodiment according to the invention comprises a pusher (140, 240, 340, 520, 720) for use in an automated test equipment (ATE) to mechanically push a device under test, DUT (110) comprising an antenna or an antenna array into a DUT s...
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WO/2024/056172A1 |
An embodiment according to the invention comprises a pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) for use in an automated test equipment (ATE) to mechanically push a device under test (DUT) (110, 1020, 1150, 1250) compris...
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WO/2024/053549A1 |
A probe comprising 40-95 mass% of Pt, 0.5-50 mass% of Cu, and 3-50 mass% of Ni.
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WO/2024/053552A1 |
The purpose of the present invention is to provide an alloy material for probe pins by which the diffusion of components of a probe material and solder at a circuit connection part to be tested during a probe test can be suppressed. Th...
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WO/2024/053638A1 |
This socket comprises an extendable probe and a conductor through which the probe passes, wherein the conductor has a receiving part that receives the probe.
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WO/2024/052463A1 |
The present invention relates to a microstructure inspection device (100) for inspecting an electrical characteristic of at least one micro electromechanical system, MEMS, structure (150) formed in or on a substrate (160). The microstruc...
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WO/2024/048439A1 |
This framed anisotropic conductive sheet comprises: an insulating layer including a plurality of through-holes penetrating in the thickness direction; an anisotropic conductive sheet including a plurality of conductive portions disposed ...
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WO/2024/045649A1 |
A near-field air interface rapid measurement system and method for a pattern of an active array antenna, which is used for increasing the measurement speed of the pattern of the active array antenna, can shorten the measurement distance,...
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