| Document |
Document Title |
|
WO/2023/029560A1 |
The present application provides a cylindrical battery test tool. The cylindrical battery test tool comprises a support table, a fixed base, a mobile base, several supports, and several test connection units. The fixed base is fixed to t...
|
|
WO/2023/027396A1 |
The present invention relates to a signal transmission connector which is connected to a to-be-inspected device and a test board of a tester and used to transmit electrical signals, wherein the device and the tester have different pitche...
|
|
WO/2023/027395A1 |
The objective of the present invention is to provide a semiconductor package test device for testing a semiconductor package by means of connecting a semiconductor package and a test board. The test device according to the present invent...
|
|
WO/2023/027789A1 |
A testing apparatus for Data Storage Devices (DSDs) includes a chassis and at least one interface module configured to be removably inserted into the chassis and house a plurality of interface boards. Each interface board includes a DSD ...
|
|
WO/2023/020101A1 |
A chip test fixture (1000) and a chip test fixture combination, the chip test fixture (1000) comprising: an EVB board (100), the center of which is provided with a groove (110); a group of test interfaces (200), which are arranged on the...
|
|
WO/2023/020100A1 |
A chip test system (3000), comprising: a signal source (3100); a first bias tee (3200), one end of which is connected to the signal source (3100); a source tuner (3300), an input end of which is connected to the other end of the first bi...
|
|
WO/2023/015721A1 |
Disclosed are an anti-electromagnetic interference wave recorder and an anti-interference housing manufacturing method, pertaining to the field of wave recorders. A wave recorder comprises: an anti-interference housing, a wave recording ...
|
|
WO/2023/015334A1 |
Provided is a drone geophone installation arrangement (10) comprising a drone (8) configured to transport a geophone (12), and an anchor arrangement (14) configured to selectively and releasably anchor said drone (8) to a surface (16). A...
|
|
WO/2023/013820A1 |
The present invention relates to a near-field measurement system for measuring the output of an antenna through a scanner, the system comprising: a signal analysis unit for generating a low-frequency signal for measurement of the output ...
|
|
WO/2023/011916A1 |
Electric current transducer (1) comprising a housing (2), a magnetic core and a magnetic field detection system, the magnetic core surrounding a primary conductor passage (4) for receiving a primary conductor (30) therethrough, the magne...
|
|
WO/2023/013413A1 |
Provided is a probe card that makes it possible to plan the measurement precision of electrical characteristics. The probe card 100 comprises: a probe pin 10 that comprises a metal conductor, is elastically deformable, and has a tip sect...
|
|
WO/2023/004958A1 |
A protective box for a wave recorder and a usage method thereof, the protective box being composed of two parts, a housing and a support assembly, and having a predetermined containability, such that a wave recorder can be placed in an a...
|
|
WO/2023/008227A1 |
A probe card comprising an insulation layer, a first conductor that at least partially extends along the surface of the insulation layer, and a second conductor that at least partially passes through at least part of the insulation layer.
|
|
WO/2023/005006A1 |
The present invention relates to an automatic warning recorder and a warning method thereof, the automatic warning recorder being composed of two parts: a warning adjustment component and a data display component. The warning adjustment ...
|
|
WO/2023/009077A1 |
The present invention relates to a twin-probe electrical tester (1) that measures and displays the voltage value, current value, and/or resistance value, especially on high voltage transmission lines.
|
|
WO/2023/005034A1 |
A probe card, an operation method for the probe card, and a test system. The probe card comprises: a long probe layer (1), the long probe layer (1) comprising multiple partitions (13), and each partition (13) being internally provided wi...
|
|
WO/2023/003255A1 |
The present invention relates to a contact probe and, more specifically, to a vertical-type contact probe including a plurality of layers. The present invention provides the contact probe which is used to test an electronic apparatus and...
|
|
WO/2023/000545A1 |
A shockproof waveform recorder, comprising two parts: a waveform recording component and a shockproof component. The shockproof component comprises: a cushioning plate (1) fixedly connected to the waveform recording component, a cushioni...
|
|
WO/2023/003729A1 |
An apparatus (100) including a contactor (102) having a hole (106) and including a radio frequency absorptive material (108) and a probe (104) inserted in the hole (106) to couple a test signal to a device under test, such as an integrat...
|
|
WO/2023/003251A1 |
The present invention relates to a contact probe assembly and, more specifically, to a vertical contact probe assembly. The present invention provides a contact probe assembly which is used to test an electronic device, and comprises: a ...
|
|
WO/2023/287046A1 |
A connection jig for testing a small connector for testing the electrical characteristics of a small connector transmitting an ultra-high frequency signal by using a measuring instrument, according to the present invention, comprises: a ...
|
|
WO/2023/284175A1 |
The present invention relates to the waveform recorder-related technical field. Disclosed are a waveform recorder having a dustproof function and a use method therefor. The waveform recorder comprises a recorder housing; keys are provide...
|
|
WO/2023/287798A1 |
A test socket is provided. The test socket includes a conductive body having a first surface configured to face a printed circuit board (PCB) and a second surface configured to face an integrated circuit (IC) chip. The conductive body de...
|
|
WO/2023/279622A1 |
A small rapid cold and hot impact testing device, comprising a main unit (1), a testing head (2) for controlling and outputting the temperature of compressed air to perform cold and hot impact on an element under test, and an adjusting d...
|
|
WO/2023/281740A1 |
For a wiring board (100) for a probe card, a structure having a good workability has been demanded as an arrangement of electrically connecting the front surface side of a board (1) to the back surface side thereof. In order to achieve t...
|
|
WO/2023/273249A1 |
A TSVM-model-based abnormality detection method for an automatic verification system of a smart electricity meter, the method comprising the following steps: S1, performing feature extraction on error experimental data of a verification ...
|
|
WO/2023/272909A1 |
A mobile oscillograph and a movement method therefor. The oscillograph comprises: an oscillograph shell, which is internally provided with an information acquisition device, wherein a mounting member is arranged at the top of the oscillo...
|
|
WO/2023/277442A1 |
A connector for electrical connection disposed between an inspection device and an inspected device is provided. The connector comprises a signal conductive part, a ground conductive part, and a frame part. The signal conductive part inc...
|
|
WO/2023/272867A1 |
A fixing apparatus and fixing method for chip testing, and a test device. The apparatus comprises: a carrier (1) formed therein having a fixing cavity (2) for fixing a chip, wherein a plurality of adjustment members (3) are provided on s...
|
|
WO/2023/277452A1 |
The present invention provides an electrically conductive contact pin which is formed by stacking a plurality of metal layers together and a method for manufacturing the electrically conductive contact pin, wherein metal layers made of t...
|
|
WO/2023/277524A1 |
A probe member for inspection, according to one embodiment of the present invention, comprises: a contact part having one side formed to be sharp and of a first metal, so as to be in contact with an object to be inspected; and a body par...
|
|
WO/2023/272977A1 |
The present application relates to a chip bearing apparatus, and a chip test apparatus and method. The chip bearing apparatus is used for fixing chips of different sizes, and comprises a supporting box and several first elastic clasp rin...
|
|
WO/2023/273370A1 |
A radio-frequency test probe structure, and a radio-frequency test device and system; and same relate to the field of radio-frequency testing, and can solve the problem of a waste of space in a terminal caused by the fact that the volume...
|
|
WO/2023/277407A1 |
The present application provides an electrically conductive contact pin having improved physical or electrical properties. The electrically conductive contact pin is formed by stacking a plurality of metal layers comprising first metal l...
|
|
WO/2023/273072A1 |
A chip bearing assembly, and a chip test apparatus and method. The chip bearing assembly is used for fixing chips of different sizes, and comprises a rotatable vertical rod (10), a cross beam (20), a first side wall (31), and a second si...
|
|
WO/2023/277882A1 |
Embodiments described herein involve a sensor test structure, comprising a substrate. A moat structure is configured to at least partially surround a resonating structure comprising at least one piezoelectric layer. An electrode comprise...
|
|
WO/2023/277242A1 |
A current measuring device, according to the present invention, is for measuring the total current flowing through a metal bar (10) by using the metal bar (10) and a current sensor module (20) coupled thereto. The metal bar (10) has a re...
|
|
WO/2023/277434A1 |
The present invention relates to a high-current probe pin for a semiconductor device test socket. The probe pin comprises: a hollow cylindrical conductor sleeve; a rod-shaped top plunger having one end in contact with and connected to a ...
|
|
WO/2022/271518A1 |
System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector...
|
|
WO/2022/269783A1 |
The present invention comprises: a measurement probe (1) connected to a terminal pad (40b) of a measurement object (40); a measurement probe (2) connected to a terminal pad (40c) of the measurement object (40), the terminal pad (40c) bei...
|
|
WO/2022/269069A1 |
A busbar (11, 14) for measuring a direct and/or alternating current, in particular with current intensities of greater than 100 amperes, has connection regions (11a) and at least one resistance region (11b) which is arranged between the ...
|
|
WO/2022/271532A1 |
An example test socket for a test system includes a receptacle to make electrical and mechanical connections to a device under test (OUT) and a lid to cover the OUT in the receptacle. The lid is controllable to open automatically to enab...
|
|
WO/2022/270311A1 |
A socket (10) comprises: a probe (100) that includes a first tapered section (102); and an insulative support body (200) to which is provided a through hole (230) having a second tapered section (202) that receives the first tapered sect...
|
|
WO/2022/262093A1 |
A mounting device and mounting method for a recording fault indicator, which belong to the technical field of recording fault indicators. The mounting device comprises: a first fixing member (1), which is fixed onto a housing; and a seco...
|
|
WO/2022/265325A1 |
Proposed are a supporting plate for an electrical test socket, a socket pin for an electrical test socket, and an electrical test socket that are advantageous for testing high-frequency characteristics of a semiconductor package and are ...
|
|
WO/2022/266579A1 |
A probe head comprising of pogo pins and a slot for accepting a probe board is provided. The pogo pin has a spring-loaded rotating ball at its apex which allows for smooth sliding of a probe board into the slot. The probe board houses a ...
|
|
WO/2022/260371A1 |
The present invention provides an electrically conductive contact pin formed by laminating a plurality of metal layers, wherein the electrically conductive contact pin has improved physical or electrical properties.
|
|
WO/2022/259454A1 |
[Problem] The purpose of the present invention is to enable easy recognition of an alignment mark formed on a probe by suppressing reflection light from a circuit board in which a light-transmissive insulating film is formed on interlaye...
|
|
WO/2022/254005A1 |
The invention relates to a test body (4) for a finger tester (1) for testing printed circuit boards, to a finger tester, and to a method for testing printed circuit boards. The test body comprises: • a slide (14) which can be movably a...
|
|
WO/2022/255599A1 |
Disclosed is a lighting inspection device for micro-light-emitting diodes. A light-emission inspection device for micro-light-emitting diodes, according to the present invention, comprises: a surface contact probe which surface-contacts,...
|
