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Patent Searching and Data


Matches 301 - 350 out of 26,928

Document Document Title
WO/2017/141327A1
Provided is a ground fault point locating system for locating a ground fault point in a distribution system, said system being characterized by being provided with measurement devices that are respectively disposed at a plurality of loca...  
WO/2017/140589A1
The invention relates to a method for determining a calibration current pulse when it is superimposed by a useful current pulse, wherein the calibration current pulse is computationally determined after measurement over a plurality of me...  
WO/2017/141561A1
This probe pin comprises an elastic cylindrical body that expands and contracts along the central axis thereof, a conductive first plunger that extends into the interior of the elastic cylindrical body along the central axis from one end...  
WO/2017/141564A1
This probe pin comprises an insulating elastic member (11), a first plunger (20) and a second plunger (40). The first plunger (20) and the second plunger (40) respectively comprise fist conductors (30, 50) and second conductors (35, 55) ...  
WO/2017/138305A1
[Problem] To provide a contact terminal, an inspection jig, and an inspection device, whereby generation of a magnetic field due to inspection can be reduced. [Solution] A contact terminal Pr is provided with a conductive outer cylindric...  
WO/2017/138380A1
[Problem] To provide an inspection jig, an inspection jig set, and a substrate inspection device capable of shortening inspection time while temperature stress is applied to a substrate to be inspected. [Solution] An inspection jig (3D) ...  
WO/2017/134057A1
The invention relates to a method and a device for reconstructing a useful signal from an acquired signal made up of a plurality of samples representing physical quantities measured, the acquired signal including said useful signal made ...  
WO/2017/129999A1
A transmission line arrangement having a first end and a second end, the transmission line arrangement being configured to transmit a signal between the first end and the second end, the transmission line arrangement comprising a signal ...  
WO/2017/131394A1
The present invention relates to a test socket for a semiconductor device using an air gap, the test socket comprising: a shield unit which has a plurality of clearance openings which are vertically perforated apart from each other, and ...  
WO/2017/127578A1
A multichannel clip device and methods of use that facilitate connection of multiple electrical components of a first device and a second device for testing and/or verification are provided herein. Such multichannel clip devices can incl...  
WO/2017/126877A1
The present invention relates to an electric characteristic inspection pin and, more particularly, to an electric characteristic inspection pin capable of performing stable electric characteristic inspection and an inspection unit having...  
WO/2017/125661A1
Disclosed is a current-measuring device (1, 10) protected against surge voltages if the device (1, 10) is opened. The device (1, 10) comprises a first current transformer (2), a first connecting terminal (4) to which a first terminal (21...  
WO/2017/126782A1
The present invention relates to a bidirectional conductive pattern module for testing a semiconductor, a semiconductor test socket using the same, and a manufacturing method for the bidirectional conductive pattern module for testing a ...  
WO/2017/121489A1
The invention relates to an arrangement and a method for measuring integral field variables of current-carrying assemblies, in which a dielectric waveguide is arranged along the path that contributes to the integration, said waveguide be...  
WO/2017/123397A1
Shielded probe systems are disclosed herein. The probe systems are configured to test a device under test (DUT) and include a measurement chamber that at least partially bounds an enclosed volume, an aperture defined by the measurement c...  
WO/2017/122680A1
Provided is a contact pin which has excellent high-frequency characteristics and with which the risk of damage to an electrode of an inspection substrate is low. The contact pin includes an electrode contacting portion at one end, and a ...  
WO/2017/121542A1
The invention relates to a method for placing and making contact with a contact element which is in the form of a test contact of a test contact arrangement, in particular, in which a contact head provided with a contact element holding ...  
WO/2017/120514A1
A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop a...  
WO/2017/119676A1
The present invention relates to a semiconductor test contactor for inspecting a semiconductor having a fine pitch. According to an embodiment of the present invention, the semiconductor test contactor includes a first probe part, a seco...  
WO/2017/117257A1
The systems, apparatuses, and methods herein can provide a multi-site positioning mechanism suitable for long-term testing of a device(s) under test (DUT) (e.g. semiconductor wafers) across a range of temperatures with or without a contr...  
WO/2017/113056A1
A multi-channel interface test device, and the test device comprising: a circuit board (100) comprising a test interface (10) used for electrically connecting with an output interface of a peripheral device, and a breadboard (20) having ...  
WO/2017/111198A1
The present invention relates to a bidirectional contact module for a semiconductor test and a semiconductor test socket using the same. The bidirectional contact module for a semiconductor test according to the present invention compris...  
WO/2017/109837A1
Provided are a probe exchange tool and a probe exchange assistance system, by which a particular probe to be exchanged can be correctly removed from an inspection device by a user. A probe exchange tool 20a is used for probe exchange in ...  
WO/2017/112037A1
Coated probe tips are described for plunger pins of an integrated circuit package tests system. One example has a plunger having a tip to contact a solder ball of an integrated circuit package, a sleeve to hold the plunger and allow the ...  
WO/2017/112075A1
Techniques and mechanisms for providing socket connection to a substrate. In an embodiment, a socket device includes a first socket body portion that is to provide for signal exchanges as part of a socket connector including the first so...  
WO/2017/103789A1
The present invention relates to a device for uses in scanning probe microscopy and to a method for manufacturing same. The metallic device comprises a single body (1) with two parts (2) and (3), wherein the second part (3) has a submicr...  
WO/2017/100945A1
There is disclosed herein systems and methods for monitoring connection quality. The system includes at least one first connector member; at least one second connector member adapted to be coupled to the first connector member to form at...  
WO/2017/098358A1
A method for determining the presence of an electrical charge on a surface of an ophthalmic lens mold (1, 10), the method comprising the steps of - exposing a sensor crystal (22) of a sensor element (2) to a surface of an ophthalmic lens...  
WO/2017/092165A1
A backlit meter comprises: a housing (10); a knob (21); a position dial (40); a main board (50); an optically transmissive ring (41) fixed to the housing (10); a light source assembly (44); a light-guiding board (45) disposed between the...  
WO/2017/090385A1
[Problem] To provide an inspection jig, substrate inspection device, and substrate inspection method that make it easy to correctly inspect a substrate even if the substrate expands and contracts. [Solution] The present invention is prov...  
WO/2017/091309A2
A transgenic plant having enhanced photosynthesis and increased assimilate partitioning directed into fruits, seeds, and/or other plant part is disclosed. The transgenic plant comprises a heterologous bicarbonate transporter and is engin...  
WO/2017/091591A1
A test socket for facilitating testing of a device under test (DUT) includes a holder comprising a mounting structure for attaching the holder to other components of the socket and a floating nest structure in which the DUT can be dispos...  
WO/2017/089228A1
The invention relates to a current sensor comprising an electric conductor (10), through which a first current (I) can flow parallel to a first direction (R1) and which comprises three regions (21, 22, 23) immediately following on from e...  
WO/2017/086948A1
An apparatus comprises a signal generator circuit, a test probe, a signal sensor circuit, and a defect detection circuit. The signal generator circuit is configured to generate an impulse test signal having an impulse waveform and adjust...  
WO/2017/084769A1
A connection assembly (100) for connecting at least two subsea cables (301, 302) to a dual output subsea sensor (220) is provided. The connection assembly (100) comprises an adapter piece (110) configured to be mounted to a rear part of ...  
WO/2017/084768A1
A connection assembly (100) for connecting at least two subsea cables (301, 302) to a dual output subsea sensor (220) is provided. The connection assembly (100) comprises an adapter piece (110) configured to be mounted to a rear part of ...  
WO/2017/083385A1
A medium or high voltage electrical device includes a housing, a central conductor provided within the housing, and a sacrificial cap configured for mounting on the housing. The sacrificial cap includes an outer housing, an insulated bod...  
WO/2017/081096A1
The invention relates to a contact pin (2), in particular a spring contact pin, comprising a jacket sleeve (4), in which a contact plunger (5) is guided in a longitudinally displaceable manner. At least one light source (15) is provided,...  
WO/2017/082510A1
A test socket of the present invention comprises: a first PCB film having a plurality of first pads; a first conductive wire bonded to first surfaces of the first pads; insulation silicone rubber provided on the first PCB film, having a ...  
WO/2017/081348A1
The invention relates to a device for measuring physical magnitudes on electrical conductors, comprising a casing that can be mounted on the outside of the conductor by gripping and fixing means, a metal punch that can be inserted in the...  
WO/2017/081096A9
The invention relates to a contact pin (2), in particular a spring contact pin, comprising a jacket sleeve (4), in which a contact plunger (5) is guided in a longitudinally displaceable manner. At least one light source (15) is provided,...  
WO/2017/078525A1
System for monitoring electric current in a network comprising at least one electrical fuse including a protective body, and at least one interrogating device arranged to interrogate at least one current sensing unit. The invention also ...  
WO/2017/075599A1
In described examples, a probe card (100) includes a mechanical support fixture (105) having an inner aperture (102) with multiple probes secured to the fixture (105) that includes probe tips (103a) that extend into the inner aperture (1...  
WO/2017/075317A1
Methods and apparatus for electrical measurement are disclosed. An example electrical measurement device includes a conductive cable comprising a plurality of conductive filaments on a first end and an electrical connector on a second en...  
WO/2017/075557A1
A high power laser diode test system is disclosed which includes a housing body defining at least one device test module compartment therein, a power supply, the system controller, and thermal control system positioned within the device ...  
WO/2017/067457A1
A test device for a printed circuit board component comprises: a test platform (300) configured to fasten a printed circuit board component under test; and a positioning platform (100) located over the test platform (300) and configured ...  
WO/2017/069136A1
In the present invention, using a mold having a shape in which the center portion of a prescribed region is recessed, the surface shape of a leading end of a three-dimensional structure is pressed into a resin plate to mold the same, and...  
WO/2017/069846A1
An example manipulator for transporting a test head includes: a tower having a base and a track, with the track being vertical relative to the base; an arm to enable support for the test head, with the arm being connected to the track to...  
WO/2017/069028A1
In order to reduce the risk of a drop in the spring property of a probe and improve inspection accuracy in energization inspection by inhibiting an excessive temperature rise of the probe when a high current is impressed during the perfo...  
WO/2017/065539A1
The present invention relates to an LED element inspecting device and, more particularly, to an LED element inspecting device which inspects whether an LED chip mounted on a ceramic plate is a non-defective product. The LED element inspe...  

Matches 301 - 350 out of 26,928